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1.
公开(公告)号:US20250164652A1
公开(公告)日:2025-05-22
申请号:US18943129
申请日:2024-11-11
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Eric KYFIUK , Michael AYUKAWA , Bernard HARRIS , Krzysztof INIEWSKI
Abstract: A detector structure includes a supporting substrate having an opening therethrough that is laterally surrounded on all sides by the supporting substrate, a carrier board located over a front side of the supporting substrate, the carrier board including interconnect structures electrically extending between the front side and a back side of the carrier board; at least one SIC located over the carrier board, the at least one ASIC including signal processing channel circuitry, at least one radiation sensor located over a front side of the at least one ASIC, and a connector located within the opening in the supporting substrate, the connector is electrically coupled to the interconnect structures on the back side of the carrier board. Further embodiments include detector modules including a plurality of above-described detector structures, a module circuit board coupled to the connectors by cables, and a heat sink.
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公开(公告)号:US20240085577A1
公开(公告)日:2024-03-14
申请号:US18462859
申请日:2023-09-07
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Michael AYUKAWA , James FUJIMOTO , Krzysztof INIEWSKI
CPC classification number: G01T1/243 , G01T1/247 , G06F15/7807
Abstract: An X-ray detector module of a multi-module X-ray detector array having a local processing unit configured to provide real-time control and computational capabilities at the x-ray detector module. In various embodiments, by providing these capabilities in the detector module itself, as opposed to a component located downstream of the detector module, there may be an immediate cost reduction, opportunities to include additional features, and performance improvement opportunities not otherwise practical to implement in conventional X-ray imaging systems.
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3.
公开(公告)号:US20240219589A1
公开(公告)日:2024-07-04
申请号:US18602887
申请日:2024-03-12
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Michael AYUKAWA , Bernard HARRIS , Krzysztof INIEWSKI
IPC: G01T1/24 , A61B6/42 , H01L27/146 , H05B3/22
CPC classification number: G01T1/244 , A61B6/4233 , A61B6/4266 , H01L27/14634 , H01L27/1469 , H05B3/22
Abstract: Direct attach radiation detector structures include an application specific integrated circuit (ASIC), at least one radiation sensor located over a front surface of the ASIC, and a carrier board located over a back surface of the ASIC. In various embodiments, the carrier board may include one or more thermal management features that may reduce temperature non-uniformities in the detector structure. In additional embodiments, the carrier board may include one or more features to improve the manufacturability of the radiation detector unit.
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公开(公告)号:US20200326290A1
公开(公告)日:2020-10-15
申请号:US16844484
申请日:2020-04-09
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Krzysztof INIEWSKI , Michael AYUKAWA , Conny HANSSON
IPC: G01N23/20008 , G01N23/207
Abstract: Various aspects include methods and devices for reducing the scanning time for an X-ray diffraction scanner system by increasing the count rate or efficiency of the energy discriminating X-ray detector. In a first embodiment, the count rate of the energy discriminating X-ray detector is increased by increasing the number of detectors counting X-ray scatter photon in particular energy bins by configuring individual pixel detectors within a 2-D X-ray detector array to count photons within specific energy bins. In a second embodiment, the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector. In a third embodiment, the individual pixel detectors within a 2-D X-ray detector array are configured to count photons within specific energy bins and the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector.
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公开(公告)号:US20190339402A1
公开(公告)日:2019-11-07
申请号:US15972717
申请日:2018-05-07
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Robert CRESTANI , Christopher READ , Michael AYUKAWA , Glenn BINDLEY , Kris INIEWSKI
Abstract: A radiation detector unit includes an interposer, at least one radiation sensor bonded to a front side of an interposer, an application-specific integrated chip (ASIC) bonded to a backside of the interposer, a carrier board bonded to the backside of the interposer and located on a backside of the ASIC, and at least one flex cable assembly attached to a respective side of the carrier board.
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公开(公告)号:US20180329079A1
公开(公告)日:2018-11-15
申请号:US15592368
申请日:2017-05-11
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Pinghe LU , Michael AYUKAWA , Christopher READ , Robert CRESTANI , Jeffrey WALTON
CPC classification number: B29C65/4855 , B29L2031/34 , C09J7/30 , C09J9/02 , C09J2201/134 , C09J2201/36 , C09J2201/602 , H01L27/00
Abstract: A cathode conductive strip can be attached to a semiconductor radiation sensor by using a double sided dual adhesive electrically conductive tape in a sensor assembly or a detector module to provide reliable electrical connection between the semiconductor radiation sensor and the cathode conductive strip. The double sided dual adhesive electrically conductive tape includes an electrically conductive backing with two different adhesion strength adhesives on both sides. The high adhesion strength side is bonded to the cathode electrode of the semiconductor radiation sensor. The lower adhesion strength side is bonded to the conductive face of the cathode conductive strip.
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7.
公开(公告)号:US20240230932A9
公开(公告)日:2024-07-11
申请号:US18468891
申请日:2023-09-18
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Michael AYUKAWA , Krzysztof INIEWSKI
Abstract: A radiation detector unit includes at least one radiation sensor having pixel detectors that generate event detection signals in response to photon interaction events, an application specific integrated circuit (ASIC) including circuit components on a substrate, the at least one radiation sensor mounted over the application specific integrated circuit via a plurality of bonding material portions such that event detection signals generated in each of the pixel detectors of the at least one radiation sensor are received at a respective pixel region of the ASIC, and the circuit components of the ASIC convert the event detection signals received at each of the pixel regions of the ASIC to digital detection signals, and a carrier board underlying the ASIC, where the ASIC includes a plurality of through-substrate vias (TSVs) electrically coupling the ASIC to the carrier board, each of the TSVs underlying an active pixel detector of the at least one radiation sensor.
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8.
公开(公告)号:US20240134071A1
公开(公告)日:2024-04-25
申请号:US18468891
申请日:2023-09-17
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Michael AYUKAWA , Krzysztof INIEWSKI
Abstract: A radiation detector unit includes at least one radiation sensor having pixel detectors that generate event detection signals in response to photon interaction events, an application specific integrated circuit (ASIC) including circuit components on a substrate, the at least one radiation sensor mounted over the application specific integrated circuit via a plurality of bonding material portions such that event detection signals generated in each of the pixel detectors of the at least one radiation sensor are received at a respective pixel region of the ASIC, and the circuit components of the ASIC convert the event detection signals received at each of the pixel regions of the ASIC to digital detection signals, and a carrier board underlying the ASIC, where the ASIC includes a plurality of through-substrate vias (TSVs) electrically coupling the ASIC to the carrier board, each of the TSVs underlying an active pixel detector of the at least one radiation sensor.
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公开(公告)号:US20210333420A1
公开(公告)日:2021-10-28
申请号:US17225416
申请日:2021-04-08
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Krzysztof INIEWSKI , Michael K. JACKSON , Michael AYUKAWA
IPC: G01T1/29 , H01L27/146
Abstract: A radiation detector includes a semiconductor layer having opposing first and second surfaces, anodes disposed over the first surface of the semiconductor layer in a pixel pattern, a cathode disposed over the second surface of the semiconductor layer, and an electrically conductive pattern disposed over the first surface of the semiconductor layer in interpixel gaps between the anodes. At least a portion of the electrically conductive pattern is not electrically connected to an external bias source.
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公开(公告)号:US20240377544A1
公开(公告)日:2024-11-14
申请号:US18612288
申请日:2024-03-21
Applicant: REDLEN TECHNOLOGIES, INC.
Inventor: Glenn BINDLEY , Krzysztof INIEWSKI , Michael AYUKAWA
Abstract: Direct attach radiation detector structures include an application specific integrated circuit (ASIC) including an array of unit cells including signal processing channel circuitry and at least one radiation sensor including an array of pixel detectors located over a front surface of the ASIC. In various embodiments, an ASIC having a fixed layout of unit cells may accommodate different radiation sensors having varying layouts of pixel detectors. In some embodiments, a redistribution layer on the front surface of the ASIC may route detection signals from pixel detectors to the corresponding unit cells. Alternatively, or in addition, a subset of the unit cells of the ASIC may be active unit cells that are electrically coupled to a pixel detector. The remaining unit cells may be inactive unit cells that may be powered down.
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