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公开(公告)号:US20200166606A1
公开(公告)日:2020-05-28
申请号:US16585924
申请日:2019-09-27
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Takashi OSHIMA , Tetsuo MATSUI , Mitsuya FUKAZAWA , Katsuki TATEYAMA , Masaki FUJIWARA
Abstract: A MASH type sigma delta AD converter includes a modulator, an analog filter filtering an extraction signal obtained by extracting a probe signal and an quantization error generated in a quantizer within a sigma delta modulator, a low speed AD converter performing an AD conversion of an output signal of the analog filter, a first adaptive filter searching for a transfer function of the sigma delta modulator, a second adaptive filter searching for a transfer function from an output of the modulator to the low speed AD converter via the analog filter, and a noise cancellation circuit cancelling the probe signal and the quantization error included in an output signal of the quantizer using the search results by the first and second adaptive filters.
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公开(公告)号:US20180302102A1
公开(公告)日:2018-10-18
申请号:US15900598
申请日:2018-02-20
Applicant: Renesas Electronics Corporation
Inventor: Takashi OSHIMA , Tetsuo MATSUI , Mitsuya FUKAZAWA , Tomohiko YANO
CPC classification number: H03M3/414 , G01S7/354 , G01S13/0209 , H03H21/0012 , H03M3/38 , H03M3/388 , H03M3/458
Abstract: A modulator includes an analog integrator including an analog circuit and a quantizer quantizing its output signal. An external input signal is input thereto. A modulator is coupled to the latter stage of the modulator, and includes a quantizer. A probe signal generation circuit injects a probe signal to the modulator. An adaptive filter searches for a transfer function of the modulator by observing an output signal of the quantizer in accordance with a probe signal. Another adaptive filter searches for a transfer function of the modulator by observing an output signal of the quantizer in accordance with the probe signal. A noise cancel circuit cancels a quantization error generated by the quantizer using search results of the adaptive filters.
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公开(公告)号:US20130187628A1
公开(公告)日:2013-07-25
申请号:US13738546
申请日:2013-01-10
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Kenji FURUSAWA , Mitsuya FUKAZAWA
IPC: G05F3/16
Abstract: A reference voltage generating circuit with extremely low temperature dependence is provided.The reference voltage generating circuit includes a BGR circuit which generates a bandgap reference voltage; a bandgap current generating circuit which generates a bandgap current according to the bandgap reference voltage; a PTAT current generating circuit which generates a current proportional to the absolute temperature; and a linear approximate correction current generating circuit which compares the current generated by the PTAT current generating circuit and the bandgap current to generate a correction current, and the BGR circuit adds, to the bandgap reference voltage, a correction voltage generated based on the correction current.
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公开(公告)号:US20180143229A1
公开(公告)日:2018-05-24
申请号:US15796995
申请日:2017-10-30
Applicant: Renesas Electronics Corporation
Inventor: Makoto SHUTO , Kazuyoshi KAWAI , Mitsuya FUKAZAWA , Robert NOLF , Robert DALBY
IPC: G01R21/133 , H03G3/20 , H03M3/00 , H03M1/38 , G01R19/252
CPC classification number: G01R21/133 , G01R19/252 , H03G3/20 , H03H17/0621 , H03M1/1205 , H03M1/38 , H03M3/458
Abstract: There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.
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公开(公告)号:US20150177770A1
公开(公告)日:2015-06-25
申请号:US14641272
申请日:2015-03-06
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Kenji FURUSAWA , Mitsuya FUKAZAWA
IPC: G05F3/16
Abstract: A reference voltage generating circuit with extremely low temperature dependence is provided. The reference voltage generating circuit includes a BGR circuit which generates a bandgap reference voltage; a bandgap current generating circuit which generates a bandgap current according to the bandgap reference voltage; a PTAT current generating circuit which generates a current proportional to the absolute temperature; and a linear approximate correction current generating circuit which compares the current generated by the PTAT current generating circuit and the bandgap current to generate a correction current, and the BGR circuit adds, to the bandgap reference voltage, a correction voltage generated based on the correction current.
Abstract translation: 提供了具有极低温度依赖性的参考电压发生电路。 参考电压产生电路包括产生带隙参考电压的BGR电路; 带隙电流产生电路,其根据带隙基准电压产生带隙电流; 产生与绝对温度成比例的电流的PTAT电流产生电路; 以及线性近似校正电流产生电路,其比较由PTAT电流产生电路产生的电流和带隙电流以产生校正电流,并且BGR电路将基于校正电流产生的校正电压加到带隙基准电压 。
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