摘要:
An integrated semiconductor memory includes word lines connected to a first voltage potential via a respective first controllable switch and a respective third controllable switch and to a second voltage potential via a respective second controllable switch. In order to test whether one of the word lines is connected to the first voltage potential via its respective first and third controllable switches, the one of the word lines is connected to a comparator circuit via the respective second controllable switch and a driver line. After the respective first and third controllable switches have been controlled into the on state, in a test operating state of the integrated semiconductor memory, the respective second controllable switch is controlled into the on state and a potential state on the word line is evaluated by the comparator circuit. The result of the evaluation is fed to an external data terminal by an evaluation signal.
摘要:
An integrated semiconductor memory device includes memory cells each with a selection transistor and a storage capacitor. Memory cells of this type are usually read by the potential of the bit line to which the memory cell is connected being compared in a sense amplifier with the potential of a complementary, second bit line and a voltage difference identified being amplified. The semiconductor memory according to the invention provides for that capacitor electrode which is not connected to the selection transistor to be connected to the complementary, second bit line. As a result, for an operating voltage with the same magnitude, larger quantities of charge can be stored in the storage capacitor since now the two mutually spread potentials output by the sense amplifier are used for biasing the storage capacitor. The resultant increase in the signal strength makes the semiconductor memory insensitive toward signal corruptions which arise for example in the case of operating voltages at different levels for selection transistors and for transistors in the signal amplifier.
摘要:
Semiconductor memories (1) have segmented word lines (5a, 5b), which in each case have a main word line (10a, 10b) made of a conductive metal and a plurality of interconnect segments (15a, 15b) coupled to the main word line (10a, 10b), which are coupled to the respective main word line (10a, 10b) in each case via at least one contact hole filling (11). If one of the contact hole fillings (11) is defective or at high resistance then functional errors of the semiconductor memory occur. The interconnect segments (15a, 15b) of two respective word lines (5a, 5b) can be short-circuited in pairs with the aid of switching units (20), whereby a static current (I) that flows via the contact hole fillings (11) can be used for electrically stressing the contact hole fillings (11). Electrical stressing of contact hole fillings of segmented word lines is thus made possible.
摘要:
An integrated semiconductor memory device includes a memory cell array (B1) with a first bit line and a second bit line (BL, /BL), a controllable resistor (SW) and a control unit (100) configured to control the controllable resistor. In a first operating state of the integrated semiconductor memory device, the first and second bit lines are connected to one another via a first controllable switch (ET1) and also via the controllable resistor (SW) which has been set to a low resistance, to a connection (A10) that applies a mid-voltage (VBLEQ), where the voltage level of the mid-voltage is in the form of an arithmetic mean between a first and second voltage potential (VBLH, VBLL). By virtue of the control unit briefly setting the controllable resistor to a very low resistance in the first operating state of the integrated semiconductor memory device, the period of time required for the first and second bit lines require to assume the mid-voltage (VBLEQ) is shortened. The influence of capacitive coupling influences, which slow down the charging of the first and second bit lines to the mid-voltage, is significantly reduced as a result.
摘要:
An integrated circuit includes an input terminal (IN) for application of a supply voltage (Vext) and an output terminal (A) for generation of an output voltage (Vout). A first branch including a first controllable resistance (T1) and a second branch including a charge pump (10) and a second controllable resistance (T2) are connected between the input terminal (IN) and the output terminal (A). A control circuit (20) alters the resistance values of the first and second controllable resistances (T1, T2) in a manner dependent on a ratio of an actual value (Vout) of the output voltage to a desired value (VSout) of the output voltage and a ratio of an actual value (Vext) of the supply voltage to a desired value (VSext) of the supply voltage. As a result, the output voltage (Vout) can be stabilized to the desired value (VSout) virtually independently of fluctuations of the supply voltage.
摘要:
An integrated circuit includes a programming circuit (10) for generating programming signals (PS1, . . . , PS4) with a first input terminal (E1) for applying a control voltage (ES), a second input terminal (E2) for applying a reference voltage (Vref), a storage circuit (30) with programmable switches (35, . . . , 38) and output terminals (A1, . . . , A4). The programming circuit in each case generates a programming signal (PS1, . . . , PS4) when the control voltage (ES) exceeds a predefined threshold voltage formed from the reference voltage. The number of programming signals (PS1, . . . , PS4) is dependent on the magnitude of the threshold voltage exceeded by the control voltage (ES). The programming signals are used for programming the programmable switches (35, . . . , 38). The programming state of the programmable switches can be read out via the output terminals (A1, . . . , A4) of the integrated circuit. The integrated circuit enables the storage of external operating parameters of the integrated circuit.
摘要:
An integrated semiconductor memory with refreshing of memory cells includes a temperature sensor to detect a chip temperature of the integrated semiconductor memory, a connection to apply a command signal, a frequency generation unit to generate a frequency signal, and a memory cell to store a data item, the stored data item being refreshed at the frequency of the frequency signal. The frequency generation unit generates the frequency signal at a first frequency on the basis of a chip temperature detected by the temperature sensor when a first state of the command signal is applied and the frequency generation unit generates the frequency signal at a second frequency, which is changed in comparison with the first frequency, at the same chip temperature when a second state of the command signal is applied.
摘要:
A circuit for controlling an access to an integrated memory includes a command decoder for receiving at least one external command for an access to the memory. An access controller is connected to the command decoder for receiving internal command signals, which are output by the command decoder. In the course of a memory access, the command decoder outputs a precharge command signal for precharging a row of the memory cell array of the integrated memory. A control circuit, which can determine a temperature of the memory, is designed to temporally variably influence the transmission of the precharge command signal of the command decoder to the access controller in a manner dependent on the temperature of the memory. The write recovery time tWR can be retained even for higher operating frequencies of the memory.
摘要:
In an arrangement for determining a temperature loading during a soldering process, a semiconductor chip (1) comprises at least one contact (2) to be soldered or is electrically conductively connected to at least one contact (14d) to be soldered that is situated outside the semiconductor chip. The semiconductor chip (1) furthermore comprises a temperature sensor device (3), which determines a measurement quantity corresponding to the temperature. A processing device (4, 5) has an analog-to-digital converter (5), which is electrically conductively connected to the temperature sensor device (3) and converts the measurement quantity into at least one storable signal that represents the temperature loading. A voltage supply device (10), which is electrically conductively connected to the temperature sensor device (3) and the processing device (4, 5), supplies these components with an operating voltage. A data memory (6) serves for storing the at least one storable signal. An electrical line (7, 11) connected to the data memory (6) serves for outputting the stored signal. As a result, it is possible to monitor temperature loadings of the semiconductor chip also outside the sphere of influence of the semiconductor manufacturer.
摘要:
An integrated semiconductor memory including memory cells which can be driven via first and second word lines and can be replaced by redundant memory cells. In the first memory cell type, data can be stored corresponding to the data present at a data input terminal. In the memory cells of a second memory cell type, data can be stored inverted with respect to data present at the data input terminal. The integrated semiconductor memory includes a circuit for data inversion, wherein the data are written to a redundant memory cell, inverted with respect to the data present at the data input terminal if the defective memory cell and the redundant memory cell replacing it are situated in different word line strips of a bit line twist, and if the defective memory cell and the redundant memory cell replacing it are associated with different memory cell types.