摘要:
A fault interrupting and reclosing device includes a circuit interrupter coupled to an actuator. The actuator includes at least one force generating element for generating an opening force for opening the circuit interrupter and for generating a restoring force to close the circuit interrupter. The device further includes a latch to engage the actuator to hold the contacts open once opened. In a preferred arrangement, the device is provided with an automatic mode of operation including a reclose process and a non-reclosing mode of operation. The device also preferably includes a method of determining the end-of-life of a vacuum interrupter monitors characteristics and/or parameters of a fault current or vacuum interrupter operation to predict a percent of life consumed with each fault current interruption operation. A cumulative percent of life consumed may also be determined, and an end-of-life may be predicted based upon the cumulative percent of life consumed.
摘要:
A fault interrupting and reclosing device includes a circuit interrupter coupled to an actuator. The actuator includes at least one force generating element for generating an opening force for opening the circuit interrupter and for generating a restoring force to close the circuit interrupter. The device further includes a latch to engage the actuator to hold the contacts open once opened. In a preferred arrangement, the device is provided with an automatic mode of operation including a reclose process and a non-reclosing mode of operation. The device also preferably includes a method of determining the end-of-life of a vacuum interrupter monitors characteristics and/or parameters of a fault current or vacuum interrupter operation to predict a percent of life consumed with each fault current interruption operation. A cumulative percent of life consumed may also be determined, and an end-of-life may be predicted based upon the cumulative percent of life consumed.
摘要:
A fault interrupting and reclosing device includes a circuit interrupter coupled to an actuator. The actuator includes at least one force generating element for generating an opening force for opening the circuit interrupter and for generating a restoring force to close the circuit interrupter. The device further includes a latch to engage the actuator to hold the contacts open once opened. In a preferred arrangement, the device is provided with an automatic mode of operation including a reclose process and a non-reclosing mode of operation. The device also preferably includes a method of determining the end-of-life of a vacuum interrupter monitors characteristics and/or parameters of a fault current or vacuum interrupter operation to predict a percent of life consumed with each fault current interruption operation. A cumulative percent of life consumed may also be determined, and an end-of-life may be predicted based upon the cumulative percent of life consumed.
摘要:
A fault interrupting and reclosing device includes a circuit interrupter coupled to an actuator. The actuator includes at least one force generating element for generating an opening force for opening the circuit interrupter and for generating a restoring force to close the circuit interrupter. The device further includes a latch to engage the actuator to hold the contacts open once opened. In a preferred arrangement, the device is provided with an automatic mode of operation including a reclose process and a non-reclosing mode of operation. The device also preferably includes a method of determining the end-of-life of a vacuum interrupter monitors characteristics and/or parameters of a fault current or vacuum interrupter operation to predict a percent of life consumed with each fault current interruption operation. A cumulative percent of life consumed may also be determined, and an end-of-life may be predicted based upon the cumulative percent of life consumed.
摘要:
A fault interrupter and a method of operating a fault interrupter to reduce arcing time during fault interruption. Fault interrupter operation is delayed following detecting a peak current such that its operation occurs at a point of the current wave resulting in reduced arcing during fault isolation.
摘要:
A fault interrupter and a method of operating a fault interrupter to reduce arcing time during fault interruption. Fault interrupter operation is delayed following detecting a peak current such that its operation occurs at a point of the current wave resulting in reduced arcing during fault isolation.
摘要:
An electromagnetic operator includes first and second coils wound coaxially. An armature partially surrounds the coils for channeling flux during energization of the coils. The armature may be formed of a bent plate and secured to a ferromagnetic support. A control circuit applies energizing signals to the coils during operation. Both coils are energized during an initial phase of operation. One of the coils is subsequently released or de-energized automatically. A timing circuit removes current from the second coil after a variable time period. The time period may be a function of the configuration of the timing circuit, such as an RC time constant, and of the energizing signal.
摘要:
A method of providing sub-half-micron copper interconnections with improved electromigration and corrosion resistance. The method includes double damascene using electroplated copper, where the seed layer is converted to an intermetallic layer. A layer of copper intermetallics with halfnium, lanthanum, zirconium or tin, is provided to improve the electromigration resistance and to reduce defect sensitivity. A method is also provided to form a cap atop copper lines, to improve corrosion resistance, which fully covers the surface. Structure and methods are also described to improve the electromigration and corrosion resistance by incorporating carbon atoms in copper intersititial positions.
摘要:
A method of providing sub-half-micron copper interconnections with improved electromigration and corrosion resistance. The method includes double damascene using electroplated copper, where the seed layer is deposited by chemical vapor deposition, or by physical vapor deposition in a layer less than about 800 angstroms.
摘要:
A test layout increases the sample size of electromigration experiments. Through pad sharing, the number of structures tested can be increased, allowing hundreds of identical structures to be tested in a single high temperature oven door.