Back-biasing to populate strained layer quantum wells

    公开(公告)号:US06680496B1

    公开(公告)日:2004-01-20

    申请号:US10191006

    申请日:2002-07-08

    IPC分类号: H01L2978

    CPC分类号: H01L29/802

    摘要: Transistors including a buried channel layer intermediate to a source and a drain and a surface layer intermediate to the buried layer and a gate are operated so as to cause current between the source and the drain to flow predominately through the buried channel layer by applying a back-bias voltage to the transistor. The back-bias voltage modulates a free charge carrier density distribution in the buried layer and in the surface layer.