摘要:
A method for growing InxGa1−xAs epitaxial layer on a lattice mismatched InP substrate calls for depositing by organo-metallic vapor phase epitaxy, or other epitaxial layer growth technique, a plurality of discreet layers of InAsyP1−y over an InP substrate. These layers provide a buffer. Each succeeding buffer layer has a distinct composition which produces less than a critical amount of lattice mismatch relative to the preceding layer. An InxGa1−xAs epitaxial layer is grown over the buffer wherein 0.53≦x≦0.76. A resulting InGaAs structure comprises an InP substrate with at least one InAsP buffer layer sandwiched between the substrate and the InGaAs epitaxial layer. The buffer layer has a critical lattice mismatch of less than 1.3% relative to the substrate. Additional buffer layers will likewise have a lattice mismatch of no more than 1.3% relative to the preceding layer. The number of buffer layers is determined by the resulting bandgap desired in the InGaAs epitaxial layer, which, in turn, determines the composition of the InxGa1−xAs epitaxial layer, and thus, the lattice mismatch.
摘要翻译:在晶格失配的InP衬底上生长In x Ga 1-x As外延层的方法要求通过有机金属气相外延或其它外延层生长技术在InP衬底上沉积多个离散的InAsyP1-y层。 这些层提供了一个缓冲区。 每个后续缓冲层具有相对于前一层产生小于临界量的晶格失配的不同组成。 In x Ga 1-x As外延层生长在缓冲器上,其中0.53≤x≤0.76。所得的InGaAs结构包括InP衬底,其具有夹在衬底和InGaAs外延层之间的至少一个InAsP缓冲层。 缓冲层相对于衬底具有小于1.3%的临界晶格失配。 附加的缓冲层同样具有相对于前一层不超过1.3%的晶格失配。 缓冲层的数量由InGaAs外延层中所需的所得到的带隙确定,InGaAs外延层决定了In x Ga 1-x As外延层的组成,从而确定晶格失配。
摘要:
A method of fabricating an epitaxial compound semiconductor III-V wafer suitable for the subsequent fabrication of at least two different types of integrated active devices (such as an HBT and a FET) on such wafer by providing a substrate; growing a first epitaxial structure on the substrate; and growing a second epitaxial structure on the first epitaxial structure.
摘要:
A method of fabricating an integrated circuit on a compound semiconductor III-V wafer including at least two different types of active devices by providing a substrate; growing a first epitaxial structure on the substrate; growing a second epitaxial structure on the first epitaxial structure; and processing the epitaxial structures to form different types of active devices, such as HBTs and FETs.
摘要:
A spooning closure generally comprising a skirt a top, a spooning opening and a hinged spooning lid which is adapted to pivot from a closed position to an open spooning position. A locking means is provided, which is adapted to securely and releasably lock the spooning lid in the closed position. The locking means comprises a tongue and a friction engaging slot. It may further comprise an arcuate latch projection which extends at an acute angle to the spooning lid bottom surface and a cooperating keeper which partially defines the spooning opening and is formed by an arcuate cantilever. Also provided is a reinforcing web extending from the bottom of the spooning lid.
摘要:
A method of fabricating an integrated circuit on a compound semiconductor III-V wafer including at least two different types of active devices by providing a substrate; growing a first epitaxial structure on the substrate; growing a second epitaxial structure on the first epitaxial structure; and processing the epitaxial structures to form different types of active devices, such as HBTs and FETs.
摘要:
A method of fabricating an integrated circuit on a compound semiconductor III-V wafer including at least two different types of active devices by providing a substrate; growing a first epitaxial structure on the substrate; growing a second epitaxial structure on the first epitaxial structure; and processing the epitaxial structures to form different types of active devices, such as HBTs and FETs.
摘要:
A tamper-evident, tamper-resistant closure for an open neck container having a detachable closure cap that is adapted to open and close the dispenser end. A breakaway tether is integrally molded to the closure cap and a first closure ring which fits within the closure cap and around the container neck. A second tether is integrally formed with the closure cap and a second closure ring. The breakaway tether will rupture if this container is tampered with. Also the breakaway tether may be broken when the contents of the container is to be used. The second tether securely maintains the closure cap attached to the main closure.