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74 条记录 (耗时 0.012 秒)

    Battery carrier for in situ analysis
    2.
    发明授权
    Battery carrier for in situ analysis 有权

    公开(公告)号：US09793580B2

    公开(公告)日：2017-10-17

    申请号：US15318684

    申请日：2015-06-17

    申请人： Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden e.V. ,  Karlsruher Institut für Technologie

    发明人： Markus Herklotz ,  Jonas Weiss ,  Lars Giebeler ,  Michael Knapp

    IPC分类号： G01N23/00 ,  G01N23/20 ,  H01M10/48 ,  B01L9/00 ,  H01M10/42 ,  G01N23/02

    CPC分类号： H01M10/4285 ,  G01N23/02 ,  G01N23/20025 ,  G01N2223/307 ,  G01N2223/611 ,  H01M10/48 ,  H01M10/482

    摘要： The subject of the present invention is a device for the in situ analysis of batteries by means of X-ray, synchrotron or another radiation. The device has a sample support, which is realized as a sample wheel rotatably mounted about the center axis. A plurality of sample holders, the center points of which are placed on a common circular line about the center point of the sample support, are arranged on the sample support, wherein each sample holder can be repeatedly opened and closed individually by an arrestable cover. Each sample holder has in its interior a cavity which receives the battery, which is to be examined, in a manner ideal in shape with regard to circumference, wherein the cover and the cavity have an opening for the passage of the beam. A spring, engaging in the edge region of the battery, presses the battery against the cover, wherein the spring and the edge region of the cover are embodied so as to be electrically conducting but insulated with respect to one another. There are directed from each sample holder an electrically conductive connection from the edge region of the cover, and an electrically conductive connection from the spring onto the face of the sample support facing away from the cover and into the vicinity of its center point. There, the lines of all sample holders are combined to form a line bundle or a plug connector.

    SAMPLE HOLDING DEVICE FOR STUDYING LIGHT-DRIVEN REACTIONS AND SAMPLE ANALYSIS METHOD USING THE SAME
    5.
    发明申请
    SAMPLE HOLDING DEVICE FOR STUDYING LIGHT-DRIVEN REACTIONS AND SAMPLE ANALYSIS METHOD USING THE SAME 有权
    用于研究光驱反应的样品保持装置和使用其的样品分析方法

    公开(公告)号：US20160189918A1

    公开(公告)日：2016-06-30

    申请号：US14583442

    申请日：2014-12-26

    申请人： Industrial Technology Research Institute

    发明人： MING-WEI LAI ,  SHEN-CHUAN LO

    IPC分类号： H01J37/20 ,  H01J37/22 ,  H01J37/26

    CPC分类号： H01J37/20 ,  F21L4/04 ,  G01N23/20025 ,  G01N2223/307 ,  H01J37/226 ,  H01J37/228 ,  H01J37/26 ,  H01J2237/20207 ,  H01J2237/206 ,  H01R13/6205

    摘要： A sample holding device for studying light-driven reactions and a sample analysis method using the same are disclosed. The sample holding device comprises a main body, a supporting structure and a light source assembly. The main body has a channel which has a first end and a second end opposite to the first end, and a focusing lens which is located on the second end. The supporting structure is located on one end of the main body for sample supporting. The light source assembly is detachably disposed on the other end opposite to the end which is disposed with the supporting structure. The light source assembly emits a light beam into the first end of the channel. The light beam then irradiates the sample which locates on the supporting structure after passing through the focusing lens.

    摘要翻译： 公开了一种用于研究光驱反应的样品保持装置和使用其的样品分析方法。 样品保持装置包括主体，支撑结构和光源组件。 主体具有通道，该通道具有与第一端相对的第一端和第二端，以及位于第二端的聚焦透镜。 支撑结构位于主体的一端用于样品支撑。 光源组件可拆卸地设置在与设置有支撑结构的端部相对的另一端上。 光源组件将光束发射到通道的第一端。 然后，光束在通过聚焦透镜之后照射位于支撑结构上的样品。

    SAMPLE HOLDER FOR THE EXAMINATION OF SMALL SAMPLES CONTAINED IN A SUSPENSION
    7.
    发明申请
    SAMPLE HOLDER FOR THE EXAMINATION OF SMALL SAMPLES CONTAINED IN A SUSPENSION 审中-公开
    用于检查在暂停中包含的小样本的样本持有人

    公开(公告)号：US20160018343A1

    公开(公告)日：2016-01-21

    申请号：US14754741

    申请日：2015-06-30

    申请人： Deutsches Elektronen-Synchrotron DESY ,  Paul Scherrer Institut

    发明人： Alke Meents ,  Ismo Vartiainen ,  Christian David

    IPC分类号： G01N23/20 ,  H01J37/16

    CPC分类号： G01N23/20025 ,  G01N2223/307 ,  G01N2223/635 ,  H01J37/16 ,  H01J37/20 ,  H01J37/3178

    摘要： A sample holder for the examination of small particles contained in a suspension using X-rays or electron beams is depicted and described, wherein the sample holder includes a single-crystal substrate extending in a plane, the dimensions of which in the plane are several times larger than the dimensions perpendicular to the plane, wherein the substrate includes a first and a second surface, which run parallel to the plane, and wherein the substrate includes through-holes, which extend perpendicular to the plane and which run from the first to the second surface.

    摘要翻译： 描述和描述用于使用X射线或电子束检查悬浮液中包含的小颗粒的样品保持器，其中样品保持器包括在平面中延伸的单晶基板，其尺寸在平面中是数倍 大于垂直于所述平面的尺寸，其中所述基底包括平行于所述平面延伸的第一和第二表面，并且其中所述基底包括通孔，所述通孔垂直于所述平面延伸并且从所述第一表面延伸到 第二面。

    Method For Obtaining And Analyzing Solids, Preferably Crystals
    8.
    发明申请
    Method For Obtaining And Analyzing Solids, Preferably Crystals 审中-公开
    获得和分析固体的方法，优选晶体

    公开(公告)号：US20090205412A1

    公开(公告)日：2009-08-20

    申请号：US12304800

    申请日：2006-07-17

    申请人： Danny Dirk Pieter Willem Stam ,  Adrianus Hendricus Joseph Franciscus de Keijzer ,  Emilio Rene Bodenstaff ,  Mimoun Lamkadmi

    发明人： Danny Dirk Pieter Willem Stam ,  Adrianus Hendricus Joseph Franciscus de Keijzer ,  Emilio Rene Bodenstaff ,  Mimoun Lamkadmi

    IPC分类号： G01N1/28 ,  B01L3/06

    CPC分类号： G01N1/38 ,  B01J19/0046 ,  B01J2219/00317 ,  B01J2219/00333 ,  B01J2219/00423 ,  B01J2219/00585 ,  B01J2219/00599 ,  B01J2219/00756 ,  B01L3/06 ,  B01L3/50255 ,  B01L3/50853 ,  B01L2300/042 ,  B01L2300/0829 ,  G01N1/44 ,  G01N23/20 ,  G01N2223/056 ,  G01N2223/307 ,  G01N2223/602

    摘要： The present invention pertains to a method for obtaining and analyzing solids, preferably crystals, which method comprises the following steps: providing a well plate, the well plate comprising a plurality of wells, each of the wells having a depth and an open upper end and each of the wells being provided with a filter having pores, which filter is arranged at a distance below the open upper end, each of the wells having an upper inner wall part above the filter that has a fluid contact surface and each filter having a top filter surface, at least both the fluid contact surface of the well and the top filter surface being of a material that is at least substantially inert for organic and/or aqueous solvents and/or mixtures of organic and aqueous solvents, providing one or more substances and one or more solvents in at least one of the wells of the well plate, applying conditions to dissolve the one or more substances in the one or more solvents; applying conditions for crystallizing at least a part of the substance so that solids are formed in the at least one well, substantially removing the part of the substance that remains in solution, thereby leaving the solids, preferably crystals, that were formed from the substance in the well of the well plate in which they were formed, performing further investigation of the solids, preferably crystals in the well of the well plate where they were formed.

    摘要翻译： 本发明涉及一种获得和分析固体，优选晶体的方法，该方法包括以下步骤：提供井板，井板包括多个井，每个井具有深度和敞开的上端， 每个井都设置有具有孔的过滤器，该过滤器布置在开口上端下方的距离处，每个井具有在过滤器上方的上内壁部分，其具有流体接触表面，并且每个过滤器具有顶部 过滤器表面，井的至少两个流体接触表面和顶部过滤器表面是对于有机和/或水性溶剂至少基本上惰性的材料和/或有机和水性溶剂的混合物，提供一种或多种物质 以及孔板的至少一个孔中的一种或多种溶剂，施加条件以溶解所述一种或多种溶剂中的一种或多种物质; 施加用于使至少一部分物质结晶的条件，使得在至少一个孔中形成固体，基本上除去残留在溶液中的物质的一部分，从而将由物质形成的固体，优选晶体留下 它们形成的井板的孔，进一步研究固体，优选在其形成的井板的井中的晶体。