摘要:
A system and method that facilitates the configuration and control of components of a radio frequency identification (RFID) system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. The RFID system can be controlled by obtaining a representation of the physical space. Next, at least one region of interest is specified in the representation of the physical space. An interrogation zone is then specified in the representation of the physical space, in which the interrogation zone corresponds to the data reader. Next, at least one overlap region of the interrogation zone and the region of interest is specified. Information is then stored, including the representation, and the interest region, the interrogation zone, and/or the overlap region. Operation of the data reader is controlled as a function of the stored information.
摘要:
A system and method that facilitates the configuration and control of components of an RFID system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. A user provides information specifying associations between the system components and the physical locations within the environment to obtain visual representations of configuration data generated therefrom with reference to a facility view, an RF coverage view, and a location view of the data. The facility view serves as a reference plane for placement and orientation of antennas associated with RFID readers, location benchmark tags, and the physical locations of interest. After each antenna is placed and oriented on the facility view, an estimate of the size and shape of the RF interrogation zone of each antenna is computed, and representations of the RF interrogation zones are provided on the facility view to obtain the RF coverage view of the data. Next, the user provides information specifying the physical locations of interest to obtain the location view of the data. A composite of the facility view, the coverage view, and the location view is then generated to obtain an enhanced visual understanding of how the system components and the physical locations exist within the system environment, and how the components and locations are associated with one another.
摘要:
A system and method that facilitates the configuration and control of components of an RFID system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. A user provides information specifying associations between the system components and the physical locations within the environment to obtain visual representations of configuration data generated therefrom with reference to a facility view, an RF coverage view, and a location view of the data. The facility view serves as a reference plane for placement and orientation of antennas associated with RFID readers, location benchmark tags, and the physical locations of interest. After each antenna is placed and oriented on the facility view, an estimate of the size and shape of the RF interrogation zone of each antenna is computed, and representations of the RF interrogation zones are provided on the facility view to obtain the RF coverage view of the data. Next, the user provides information specifying the physical locations of interest to obtain the location view of the data. A composite of the facility view, the coverage view, and the location view is then generated to obtain an enhanced visual understanding of how the system components and the physical locations exist within the system environment, and how the components and locations are associated with one another.
摘要:
Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan.
摘要:
An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.
摘要:
A method of detecting a contact between a transducing head and a storage medium is provided. The method applies an input signal, having a select power level and known frequency, to an actuator for actuating the head. An output signal is obtained in response to the input signal. At least one signal component is extracted from the output signal at the same or a harmonic of the same known frequency as the input signal applied to the actuator. Whether the at least one extracted signal component indicates a contact between the head and the medium is determined. The power level of the applied wave pattern is increased incrementally until the extracted signal component indicates a contact between the head and the storage medium.
摘要:
In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position.
摘要:
A means and method for treating malaria, schistosomiasis, and cancer using a spiro or dispiro 1,2,4-trioxolane is described. The preferred 1,2,4-trioxolanes include a spiroadamantane group on one side of the trioxolane group, and a spirocyclohexyl on the other side of the trioxolane group. In comparison to artemisinin semisynthetic derivatives, the compounds of this invention are structurally simple, easy to synthesize, non-toxic, and potent against malarial parasites. The compounds of the invention unexpectedly provide a single-dose cure for malaria, as well as prophylactic activity against the same. The compounds are also active against schistosomiasis and cancer.
摘要:
A structure, a system and a method are directed towards determination of a dimension of a patterned dimensionally unstable layer when the dimension is measured using an apparatus that induces a variation of the dimension. The structure, system and method use a patterned dimensionally unstable layer pattern design that correlates with an algorithm used to determine the dimension when the dimension is measured using the apparatus that induces the variation of the dimension.
摘要:
A method, system and computer program product for determining a geometric parameter of an optical spot of a light beam are disclosed. A method comprises: providing a calibration target, the calibration target including a systematic variation in a parameter; measuring the calibration target with respect to the systematic variation using the light beam to obtain a plurality of measurements; and analyzing the measurements and the systematic variation to determine the geometric parameter of the optical spot.