CONFIGURATION MANAGEMENT SYSTEM AND METHOD FOR USE IN AN RFID SYSTEM INCLUDING A MULTIPLICITY OF RFID READERS
    1.
    发明申请
    CONFIGURATION MANAGEMENT SYSTEM AND METHOD FOR USE IN AN RFID SYSTEM INCLUDING A MULTIPLICITY OF RFID READERS 审中-公开
    配置管理系统和使用RFID系统的方法,其中包括RFID读写器的多项

    公开(公告)号:US20090256683A1

    公开(公告)日:2009-10-15

    申请号:US12488863

    申请日:2009-06-22

    IPC分类号: H04Q5/22

    CPC分类号: H04W16/18 H04L67/18 H04W84/18

    摘要: A system and method that facilitates the configuration and control of components of a radio frequency identification (RFID) system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. The RFID system can be controlled by obtaining a representation of the physical space. Next, at least one region of interest is specified in the representation of the physical space. An interrogation zone is then specified in the representation of the physical space, in which the interrogation zone corresponds to the data reader. Next, at least one overlap region of the interrogation zone and the region of interest is specified. Information is then stored, including the representation, and the interest region, the interrogation zone, and/or the overlap region. Operation of the data reader is controlled as a function of the stored information.

    摘要翻译: 考虑到RFID系统组件如何与RFID系统部署的环境中的一个或多个物理位置相关联,便于对射频识别(RFID)系统的组件进行配置和控制的系统和方法。 可以通过获得物理空间的表示来控制RFID系统。 接下来,在物理空间的表示中指定至少一个感兴趣区域。 然后在物理空间的表示中指定询问区,其中询问区对应于数据读取器。 接下来,指定询问区域和感兴趣区域的至少一个重叠区域。 然后存储信息,包括表示,兴趣区域,询问区域和/或重叠区域。 作为存储信息的函数控制数据读取器的操作。

    Configuration management system and method for use in an RFID system including a multiplicity of RFID readers
    2.
    发明授权
    Configuration management system and method for use in an RFID system including a multiplicity of RFID readers 失效
    用于包括多个RFID读取器的RFID系统中的配置管理系统和方法

    公开(公告)号:US07567179B2

    公开(公告)日:2009-07-28

    申请号:US11581788

    申请日:2006-10-16

    IPC分类号: G08B13/141

    摘要: A system and method that facilitates the configuration and control of components of an RFID system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. A user provides information specifying associations between the system components and the physical locations within the environment to obtain visual representations of configuration data generated therefrom with reference to a facility view, an RF coverage view, and a location view of the data. The facility view serves as a reference plane for placement and orientation of antennas associated with RFID readers, location benchmark tags, and the physical locations of interest. After each antenna is placed and oriented on the facility view, an estimate of the size and shape of the RF interrogation zone of each antenna is computed, and representations of the RF interrogation zones are provided on the facility view to obtain the RF coverage view of the data. Next, the user provides information specifying the physical locations of interest to obtain the location view of the data. A composite of the facility view, the coverage view, and the location view is then generated to obtain an enhanced visual understanding of how the system components and the physical locations exist within the system environment, and how the components and locations are associated with one another.

    摘要翻译: 考虑到RFID系统组件如何与在其中部署RFID系统的环境中的一个或多个物理位置相关联,便于对RFID系统的组件进行配置和控制的系统和方法。 用户提供指定系统组件与环境内的物理位置之间的关联的信息,以参考参考设施视图,RF覆盖视图和数据的位置视图从其生成的配置数据的视觉表示。 设备视图用作与RFID读取器,位置基准标签和感兴趣的物理位置相关联的天线的放置和定向的参考平面。 在每个天线在设施视图上放置和定向之后,计算每个天线的RF询问区的大小和形状的估计,并且在设施视图上提供RF询问区的表示以获得RF覆盖视图 数据。 接下来,用户提供指定感兴趣的物理位置以获得数据的位置视图的信息。 然后生成设施视图,覆盖视图和位置视图的组合,以获得对系统组件和物理位置如何存在于系统环境中以及组件和位置如何彼此关联的增强的视觉理解 。

    Configuration management system and method for use in an RFID system including a multiplicity of RFID readers
    3.
    发明申请
    Configuration management system and method for use in an RFID system including a multiplicity of RFID readers 失效
    用于包括多个RFID读取器的RFID系统中的配置管理系统和方法

    公开(公告)号:US20070099623A1

    公开(公告)日:2007-05-03

    申请号:US11581788

    申请日:2006-10-16

    IPC分类号: H04Q7/20 G08B13/14

    摘要: A system and method that facilitates the configuration and control of components of an RFID system, taking into account how the RFID system components are associated with one or more physical locations within an environment in which the RFID system is deployed. A user provides information specifying associations between the system components and the physical locations within the environment to obtain visual representations of configuration data generated therefrom with reference to a facility view, an RF coverage view, and a location view of the data. The facility view serves as a reference plane for placement and orientation of antennas associated with RFID readers, location benchmark tags, and the physical locations of interest. After each antenna is placed and oriented on the facility view, an estimate of the size and shape of the RF interrogation zone of each antenna is computed, and representations of the RF interrogation zones are provided on the facility view to obtain the RF coverage view of the data. Next, the user provides information specifying the physical locations of interest to obtain the location view of the data. A composite of the facility view, the coverage view, and the location view is then generated to obtain an enhanced visual understanding of how the system components and the physical locations exist within the system environment, and how the components and locations are associated with one another.

    摘要翻译: 考虑到RFID系统组件如何与在其中部署RFID系统的环境中的一个或多个物理位置相关联,便于对RFID系统的组件进行配置和控制的系统和方法。 用户提供指定系统组件与环境内的物理位置之间的关联的信息,以参考参考设施视图,RF覆盖视图和数据的位置视图从其生成的配置数据的视觉表示。 设备视图用作与RFID读取器,位置基准标签和感兴趣的物理位置相关联的天线的放置和定向的参考平面。 在每个天线在设施视图上放置和定向之后,计算每个天线的RF询问区的大小和形状的估计,并且在设施视图上提供RF询问区的表示以获得RF覆盖视图 数据。 接下来,用户提供指定感兴趣的物理位置以获得数据的位置视图的信息。 然后生成设施视图,覆盖视图和位置视图的组合,以获得对系统组件和物理位置如何存在于系统环境中以及组件和位置如何彼此关联的增强的视觉理解 。

    ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE
    4.
    发明申请
    ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE 审中-公开
    用于获得真实形状的高级原子力显微镜扫描

    公开(公告)号:US20130081159A1

    公开(公告)日:2013-03-28

    申请号:US13559034

    申请日:2012-07-26

    IPC分类号: G01Q60/24

    CPC分类号: G01Q60/24 G01Q10/06 G01Q30/06

    摘要: Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan.

    摘要翻译: 提出了先进的原子力显微镜(AFM)方法和装置。 实施例可以包括以第一角度执行第一扫描,以第二角度执行第二扫描,以及基于第二扫描来校正第一扫描中的系统漂移误差。 另一个实施例可以包括执行第一区域的全局扫描,第一区域内的第二区域的局部扫描,基于全局扫描校正局部扫描中的调平误差,以及输出校正的采样图像。 另一个实施例可以包括以第一角度在第一位置执行第一扫描,使用相同的扫描角度和扫描尺寸在平坦区域执行第二次扫描,以基于第二次扫描来校正第一扫描中的扫描器跳动误差。

    Scanning probe microscopy employing correlation pattern recognition
    5.
    发明授权
    Scanning probe microscopy employing correlation pattern recognition 失效
    扫描探针显微镜采用相关模式识别

    公开(公告)号:US08371155B2

    公开(公告)日:2013-02-12

    申请号:US12854112

    申请日:2010-08-10

    IPC分类号: G01N19/02

    CPC分类号: G01Q40/00 B82Y35/00 G01Q30/06

    摘要: An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.

    摘要翻译: 一种用于地形学表征工件的装置和相关方法。 扫描探头从工件获取地形数据。 处理器控制扫描探针扫描工件的参考表面以导出第一数字文件并扫描包括参考表面的至少一部分的感兴趣的表面以导出第二数字文件。 相关模式识别逻辑将第一和第二数字文件集成在一起以将参考表面与感兴趣的表面对齐。

    CONTACT DETECTION
    6.
    发明申请
    CONTACT DETECTION 有权
    接触检测

    公开(公告)号:US20120218659A1

    公开(公告)日:2012-08-30

    申请号:US13036184

    申请日:2011-02-28

    IPC分类号: G11B27/36 G11B5/02

    摘要: A method of detecting a contact between a transducing head and a storage medium is provided. The method applies an input signal, having a select power level and known frequency, to an actuator for actuating the head. An output signal is obtained in response to the input signal. At least one signal component is extracted from the output signal at the same or a harmonic of the same known frequency as the input signal applied to the actuator. Whether the at least one extracted signal component indicates a contact between the head and the medium is determined. The power level of the applied wave pattern is increased incrementally until the extracted signal component indicates a contact between the head and the storage medium.

    摘要翻译: 提供了一种检测换能头与存储介质之间的接触的方法。 该方法将具有选择功率电平和已知频率的输入信号施加到用于致动头部的致动器。 响应于输入信号获得输出信号。 以与施加到致动器的输入信号相同的已知频率的相同或谐波从输出信号提取至少一个信号分量。 确定至少一个提取的信号分量是否指示头部和介质之间的接触。 所施加的波形图案的功率电平逐渐增加,直到提取的信号分量表示头部和存储介质之间的接触。

    METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY
    7.
    发明申请
    METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY 有权
    用于校正原子力显微镜中的误差的方法和装置

    公开(公告)号:US20120079635A1

    公开(公告)日:2012-03-29

    申请号:US13190643

    申请日:2011-07-26

    IPC分类号: G01Q60/24

    CPC分类号: B82Y35/00 G01Q10/06 G01Q30/06

    摘要: In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position.

    摘要翻译: 在某些实施例中,探针扫描表面以产生第一扫描。 第一次扫描用于估计用于扫描表面以产生第二次扫描的垂直偏移。 在某些实施例中,AFM装置使用压电电压将探针接合到表面。 探头扫描表面以产生第一次扫描。 第一扫描用于估计垂直偏移,使得探针使用压电电压在不同的垂直位置处接合表面进行第二次扫描。

    Structure, system and method for dimensionally unstable layer dimension measurement
    9.
    发明授权
    Structure, system and method for dimensionally unstable layer dimension measurement 失效
    尺寸不稳定层尺寸测量的结构,系统和方法

    公开(公告)号:US07479396B2

    公开(公告)日:2009-01-20

    申请号:US11290737

    申请日:2005-11-30

    IPC分类号: H01L21/00

    摘要: A structure, a system and a method are directed towards determination of a dimension of a patterned dimensionally unstable layer when the dimension is measured using an apparatus that induces a variation of the dimension. The structure, system and method use a patterned dimensionally unstable layer pattern design that correlates with an algorithm used to determine the dimension when the dimension is measured using the apparatus that induces the variation of the dimension.

    摘要翻译: 当使用引起尺寸变化的装置测量尺寸时,结构,系统和方法针对图案化尺寸不稳定层的尺寸的确定。 结构,系统和方法使用图案化的尺寸不稳定的层图案设计,其与用于在使用引起尺寸变化的装置测量尺寸时确定尺寸的算法相关联。