Magnetoresistive read transducer
    1.
    发明授权
    Magnetoresistive read transducer 失效
    磁阻读取传感器

    公开(公告)号:US4879619A

    公开(公告)日:1989-11-07

    申请号:US173956

    申请日:1988-03-28

    IPC分类号: G11B5/39

    CPC分类号: G11B5/3903

    摘要: A magnetoresistive (MR) read transducer comprising a thin film MR layer formed of ferromagnetic material and a nonmagnetic thin film spacer layer in contact with the MR layer. The spacer layer comprises a material selected from the group consisting of nichrome and nichrome with chromium oxide. A thin film of soft magnetic material is deposited in contact with the spacer layer so that a transverse bias is produced in at least a part of the MR layer. A feature of the invention is that the resistivity of the spacer layer can be chosen by selected the ration of nichrome to chromium oxide in the spacer layer. In a specific embodiment the spacer layer extends over only the central region of the MR layer. In case the MR layer is a nickel based alloy, a wet chemical etching process using an etchant comprising an aqueous solution of ceric ammonium nitrate and acetic acid can be used pattern the spacer layer.

    Method for making a magnetoresistive read transducer
    2.
    发明授权
    Method for making a magnetoresistive read transducer 失效
    制造磁阻读取传感器的方法

    公开(公告)号:US4940511A

    公开(公告)日:1990-07-10

    申请号:US355239

    申请日:1989-05-22

    IPC分类号: G11B5/39

    摘要: A magnetoresistive (MR) read transducer comprising a thin film MR layer formed of ferromagnetic material and a nonmagnetic thin film spacer layer in contact with the MR layer. The spacer layer comprises a material selected from the group consisting of nichrome and nichrome with chromium oxide. A thin film of soft magnetic material is deposited in contact with the spacer layer so that a transverse bias is produced in at least a part of the MR layer. A feature of the invention is that the resistivity of the spacer layer can be chosen by selecting the ratio of nichrome to chromium oxide in the spacer layer. In a specific embodiment the spacer layer extends over only the central region of the MR layer. In case the MR layer is a nickel based alloy, a wet chemical etching process using an etchant comprising an aqueous solution of ceric ammonium nitrate and acetic acid can be used to pattern the spacer layer.

    摘要翻译: 磁阻(MR)读取换能器包括由铁磁材料形成的薄膜MR层和与MR层接触的非磁性薄膜间隔层。 间隔层包括选自镍铬合金和镍铬合金与铬氧化物的材料。 沉积与间隔层接触的软磁性材料的薄膜,使得在MR层的至少一部分中产生横向偏压。 本发明的一个特征是间隔层的电阻率可以通过选择间隔层中的镍铬合金与氧化铬的比例来选择。 在具体实施例中,间隔层仅在MR层的中心区域上延伸。 在MR层是镍基合金的情况下,可以使用使用包含硝酸铈铵和乙酸的水溶液的蚀刻剂的湿化学蚀刻工艺来对间隔层进行图案化。

    Determining seal feature integrity by testing for deformation upon air pressure excitation
    5.
    发明授权
    Determining seal feature integrity by testing for deformation upon air pressure excitation 有权
    通过测试气压激发时的变形来确定密封特征完整性

    公开(公告)号:US07765853B2

    公开(公告)日:2010-08-03

    申请号:US11757589

    申请日:2007-06-04

    IPC分类号: G01M3/04

    CPC分类号: G01M3/363 G01M3/38

    摘要: Optical metrology methods, apparatuses, and systems for detecting seal integrity. These comprise changing an air pressure inside a chamber to an excitation pressure level when the chamber is placed over a segment of a surface of a structure having one or more seal features and determining whether the integrity of any of the one or more seal features has been compromised by determining, using an optical system, whether any of the one or more seal features have been deformed by the changing of the air pressure.

    摘要翻译: 用于检测密封完整性的光学测量方法,设备和系统。 这些包括当腔室被放置在具有一个或多个密封特征的结构的表面的段上时,将室内的空气压力改变到激发压力水平,并且确定一个或多个密封特征中的任何一个的完整性是否已被 通过使用光学系统确定一个或多个密封特征中的任何一个是否已经由于空气压力的变化而变形而受损。

    ULTRASONIC PROBE FOR HOLLOW FUSE PIN INSPECTION
    7.
    发明申请
    ULTRASONIC PROBE FOR HOLLOW FUSE PIN INSPECTION 有权
    超声波保险丝检查用超声探头

    公开(公告)号:US20080148856A1

    公开(公告)日:2008-06-26

    申请号:US11615505

    申请日:2006-12-22

    IPC分类号: G01N29/04

    摘要: A self-aligning probe assembly has one or more ultrasonic transducers adapted to transmit an ultrasonic shear wave into the inside surface of the hollow structure such as an aircraft fuse pin and to receive the shear wave emerging from the inside surface of the hollow structure. The nature of the received shear wave indicates the presence of flaws or damage in the inspected part. The probe assembly can be used to inspect fuse pins on aircraft without having to remove the aircraft engines.

    摘要翻译: 自对准探针组件具有一个或多个超声波换能器,其适于将超声剪切波传递到中空结构的内表面,例如飞行器熔丝销,并接收从中空结构的内表面出射的剪切波。 接收剪切波的性质表明被检部件存在缺陷或损坏。 探头组件可用于检查飞机上的保险丝销,而无需卸下飞机发动机。

    Cogeneration system for a fuel cell

    公开(公告)号:US06365289B1

    公开(公告)日:2002-04-02

    申请号:US09469800

    申请日:1999-12-22

    IPC分类号: H01M800

    摘要: A fuel cell system and process using an organic Rankine cycle to produce shaft work to operate a fuel cell system component such as an air compressor. The air compressor delivers compressed air to a fuel cell stack. The steps of the Rankine cycle include pumping a liquid working fluid to an elevated pressure, heating the fluid to a gas, expanding the high temperature and high-pressure gas through an expander to produce shaft work used to drive a fuel cell system component such as an air compressor, and then removing energy from the cooling fluid to change the gas back to a liquid, and repeating the cycle. The liquid fluid can be heated by an external boiler, or one of the components of the fuel cell system such as the combustor and/or the fuel cell stack.

    Electrical defect monitor structure
    9.
    发明授权
    Electrical defect monitor structure 失效
    电气缺陷监测结构

    公开(公告)号:US3983479A

    公开(公告)日:1976-09-28

    申请号:US598480

    申请日:1975-07-23

    CPC分类号: G01R31/2853

    摘要: A semiconductor defect monitoring structure employs a series of electrically testable serpentine stripe patterns having different widths and spacing in order to determine the distribution of the density of defects by size. Metal stripe patterns are superposed and rotated 90.degree. with respect to diffusion stripe patterns in a semiconductor wafer. A set of four field effect transistor devices are connected to each stripe pattern in such a way that tests may be made for all defects without interference between adjacent patterns. The defect monitoring structure helps to determine defects such as opens in diffusion and metallization, shorts in metallization, shorts in diffusion, pinholes in a thin oxide, and pinholes in a thick oxide.

    摘要翻译: 半导体缺陷监测结构采用一系列具有不同宽度和间距的电可测蛇形条纹图案,以便按尺寸确定缺陷密度的分布。 金属条纹图案相对于半导体晶片中的扩散条纹重叠并旋转90度。 一组四个场效应晶体管器件以这样的方式连接到每个条纹图案,即可以对所有缺陷进行测试,而不会在相邻图案之间产生干涉。 缺陷监测结构有助于确定诸如扩散和金属化中的开放,金属化中的短路,扩散短路,薄氧化物中的针孔以及厚氧化物中的针孔等缺陷。