利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

11 条记录 (耗时 0.056 秒)

    Method of magnetic field controlled shimming
    5.
    发明授权
    Method of magnetic field controlled shimming 失效
    磁场调节方法

    公开(公告)号：US06819108B2

    公开(公告)日：2004-11-16

    申请号：US10410416

    申请日：2003-04-09

    申请人： Jinhua Huang ,  Bu-Xin Xu ,  Bijan Dorri ,  Bruce Amm

    发明人： Jinhua Huang ,  Bu-Xin Xu ,  Bijan Dorri ,  Bruce Amm

    IPC分类号： G01V300

    CPC分类号： G01R33/3873 ,  G01R33/3875

    摘要： The present invention is directed to a method of shimming a magnet assembly of an MR imaging system such that a desired B0 field strength may be created with minimal inhomogeneities therethrough. With this method, sufficient shimming of the magnet assembly may be achieved without requiring mechanical variations to the magnet assembly after the magnet assembly has been assembled. The invention analyzes variations from the desired B0 field and inhomogeneities at a number of target points along the magnet assembly or B0 field. A comparison is then made at each point to determine a shimming or weighting factor such that the desired overall B0 field strength and targeted field homogeneity is achieved. Active and/or passive shim elements may then be incorporated into the magnet assembly at each target point to achieve the desired overall field strength and minimum overall field homogeneity.

    摘要翻译： 本发明涉及一种对MR成像系统的磁体组件进行匀场的方法，使得可以以最小的非均匀性通过其产生所需的B0场强。 利用这种方法，可以在磁体组件组装之后不需要对磁体组件的机械变化来实现磁体组件的足够的垫片。 本发明分析了沿着磁体组件或B0场的多个目标点处的期望的B0场和不均匀性的变化。 然后在每个点进行比较以确定匀场或加权因子，使得实现期望的总体B0场强和目标场均匀性。 然后可以在每个目标点处将主动和/或被动垫片元件并入到磁体组件中，以实现期望的总场强和最小的整体场均匀性。

    Processor system and method for integrating computerized quality design tools
    7.
    发明授权
    Processor system and method for integrating computerized quality design tools 失效
    用于集成计算机化质量设计工具的处理器系统和方法

    公开(公告)号：US06535775B1

    公开(公告)日：2003-03-18

    申请号：US09653856

    申请日：2000-09-01

    申请人： Bharat Sampathkumaran Bagepalli ,  Aniruddha Dattatraya Gadre ,  Mohamed Ahmed Ali ,  Michael Joseph Krok ,  Bijan Dorri

    发明人： Bharat Sampathkumaran Bagepalli ,  Aniruddha Dattatraya Gadre ,  Mohamed Ahmed Ali ,  Michael Joseph Krok ,  Bijan Dorri

    IPC分类号： G06F1900

    CPC分类号： G06Q10/06 ,  G06F17/50

    摘要： A processor system and method for integrating a quality function deployment tool with a critical to quality tool is provided. Each of the tools is a computer-enabled tool. The method allows for executing quality function deployment at each of a plurality of levels with the quality function deployment tool for a system designable from a respective family of subsystem alternatives. The method further allows for generating quality matrices indicating a relationship between an original set of critical to quality characteristics and key control parameters with the critical to quality tool for the respective family of subsystem alternatives. A linking action allows for linking the quality function deployment tool to the critical to quality tool for tracking at each level the extent to which the original set of critical to quality characteristics is met by each respective family of subsystem alternatives.

    摘要翻译： 提供了一种用于将质量功能部署工具与关键质量工具集成的处理器系统和方法。 每个工具都是启用计算机的工具。 该方法允许通过用于可从相应系列子系统替代方案设计的系统的质量功能部署工具在多个级别中的每一个执行质量功能部署。 该方法还允许生成质量矩阵，其指示关键到质量特征的原始集合与关键控制参数之间的关系与用于各个子系统子系统族的关键质量工具。 链接动作允许将质量功能部署工具链接到关键质量工具，以便在每个级别跟踪每个子系统替代品的每个相应族系满足原始质量特征的原始集合的程度。