摘要:
Methods and systems for improving imaging quality and power efficiency of scanning beam display systems using fluorescent screens are disclosed. In various embodiments, beam shaping mechanisms for maximizing overlap between the beam cross-section and the florescent element corresponding to each color sub-pixel of the screen, as well as pulse width and timing adjustments, are introduced to reduce imaging noise and improve power efficiency of the display system.
摘要:
Methods and systems for improving imaging quality and power efficiency of scanning beam display systems using fluorescent screens are disclosed. In various embodiments, beam shaping mechanisms for maximizing overlap between the beam cross-section and the florescent element corresponding to each color sub-pixel of the screen, as well as pulse width and timing adjustments, are introduced to reduce imaging noise and improve power efficiency of the display system.
摘要:
Techniques and devices use panels or screens with pixels for display or illumination applications to achieve dithered pixel brightness beyond pixel brightness levels set by a digital to analog conversion (DAC) circuit module with a preset DAC resolution between two adjacent DAC levels. In one implementation, when a pixel is to be dictated by a digital pixel signal to operate within an unstable brightness region, a control mechanism is provided to control the DAC circuit module to operate the pixel in the block at a DAC level below the unstable brightness region or at a different DAC level above the respective unstable brightness region, to achieve a perceived brightness level within the respective unstable brightness region.
摘要:
Techniques and devices use panels or screens with pixels for display or illumination applications to achieve dithered pixel brightness beyond pixel brightness levels set by a digital to analog conversion (DAC) circuit module with a preset DAC resolution between two adjacent DAC levels. In one implementation, when a pixel is to be dictated by a digital pixel signal to operate within an unstable brightness region, a control mechanism is provided to control the DAC circuit module to operate the pixel in the block at a DAC level below the unstable brightness region or at a different DAC level above the respective unstable brightness region, to achieve a perceived brightness level within the respective unstable brightness region.
摘要:
The present invention provides a clocking circuit allowing individual macrocells in a particular macrocell block of a CPLD to use different polarities of the same clock. The input clock pin can now drive all the macrocells directly, which can eliminate additional buffering states and improve the clock to out timing, Tco, by (for example) 300 ps. The clocks are presented directly to the clock selection multiplexers for each macrocell. Additional functioning may be realized by implementing additional configuration bits inside the clocking architecture.
摘要:
The present invention provides an integrated parallel and serial programming interface that can be selected between either a parallel programming mode or a serial programming mode. The present invention provides a control logic circuit for selecting between the parallel and serial modes. The present invention also includes a parallel and serial detection circuit. The control logic sends a signal to an interface circuit that selects between a serial programming mode and a parallel programming mode based on the outputs of the parallel and serial detection circuits.
摘要:
The present invention provides a circuit for supplying a verifying reference and measurement voltage for use in verifying the programming of a programmable cell. The present invention provides the verifying reference and measurement voltage through internal circuitry on the cell and eliminate any requirement for an externally provided reference voltage. The verifying voltage is provided by modifying the programming voltage. The programming voltage is stepped down or stepped up through the use of internal circuitry to provide the reference and measurement voltage.