Methods and devices for evaluating the thermal exposure of a metal article
    8.
    发明授权
    Methods and devices for evaluating the thermal exposure of a metal article 失效
    用于评估金属制品的热暴露的方法和装置

    公开(公告)号:US07654734B2

    公开(公告)日:2010-02-02

    申请号:US11126793

    申请日:2005-05-10

    IPC分类号: G01N25/72 G01N17/00 G01K3/00

    CPC分类号: G01N17/00 G01K7/02

    摘要: A method for evaluating the thermal exposure of a selected metal component which has been exposed to changing temperature conditions is described. The voltage distribution on a surface of the metal component, or on a metallic layer which lies over the component, is first obtained. The voltage distribution usually results from a compositional change in the metal component. The voltage distribution is then compared to a thermal exposure-voltage model which expresses voltage distribution as a function of exposure time and exposure temperature for a reference standard corresponding to the metal component. In this manner, the thermal exposure of the selected component can be obtained. A related device for evaluating the thermal exposure of a selected metal component is also described.

    摘要翻译: 描述了已经暴露于变化的温度条件下的所选金属组分的热暴露评估方法。 首先获得金属部件的表面上或位于部件上的金属层上的电压分布。 电压分布通常由金属组分的组成变化引起。 然后将电压分布与表示与对应于金属组分的参考标准的曝光时间和曝光温度的函数的电压分布的热暴露电压模型进行比较。 以这种方式,可以获得所选择的部件的热曝光。 还描述了用于评估所选金属组分的热暴露的相关装置。

    Methods and devices for evaluating the thermal exposure of a metal article
    9.
    发明申请
    Methods and devices for evaluating the thermal exposure of a metal article 失效
    用于评估金属制品的热暴露的方法和装置

    公开(公告)号:US20060256833A1

    公开(公告)日:2006-11-16

    申请号:US11126793

    申请日:2005-05-10

    IPC分类号: G01N17/00 G01K3/00

    CPC分类号: G01N17/00 G01K7/02

    摘要: A method for evaluating the thermal exposure of a selected metal component which has been exposed to changing temperature conditions is described. The voltage distribution on a surface of the metal component, or on a metallic layer which lies over the component, is first obtained. The voltage distribution usually results from a compositional change in the metal component. The voltage distribution is then compared to a thermal exposure-voltage model which expresses voltage distribution as a function of exposure time and exposure temperature for a reference standard corresponding to the metal component. In this manner, the thermal exposure of the selected component can be obtained. A related device for evaluating the thermal exposure of a selected metal component is also described.

    摘要翻译: 描述了已经暴露于变化的温度条件下的所选金属组分的热暴露评估方法。 首先获得金属部件的表面上或位于部件上的金属层上的电压分布。 电压分布通常由金属组分的组成变化引起。 然后将电压分布与表示与对应于金属组分的参考标准的曝光时间和曝光温度的函数的电压分布的热暴露电压模型进行比较。 以这种方式,可以获得所选择的部件的热曝光。 还描述了用于评估所选金属组分的热暴露的相关装置。