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公开(公告)号:US10361100B2
公开(公告)日:2019-07-23
申请号:US15368988
申请日:2016-12-05
发明人: Hyosan Lee , Yongsun Ko , Kyoungseob Kim , Kwangsu Kim , SeokHoon Kim , Kuntack Lee , Yongmyung Jun , Yong-Jhin Cho
摘要: A substrate treatment apparatus is provided. The apparatus may include a process chamber configured to have an internal space, a substrate supporting member disposed in the process chamber to support a substrate, a first supplying port configured to supply a supercritical fluid to a region of the internal space located below the substrate, a second supplying port configured to supply a supercritical fluid to other region of the internal space located over the substrate, and an exhaust port configured to exhaust the supercritical fluid from the process chamber to an exterior region.
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2.
公开(公告)号:US11742222B2
公开(公告)日:2023-08-29
申请号:US18057397
申请日:2022-11-21
发明人: Jihun Cheon , Hyun Jung Lee , Pyojin Jeon , Yong-Jhin Cho , Wonjun Lee
CPC分类号: H01L21/67051 , B08B3/024 , B08B5/02 , B08B7/0057 , B08B7/04 , G03F7/30 , B08B2203/005
摘要: An apparatus for fabricating a semiconductor device may include a nozzle having a slit configured to eject solution and an ultraviolet emitter provided outside the nozzle. The ultraviolet emitter and the nozzle may be configured to move horizontally. The slit may be provided on a bottom surface of the nozzle.
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3.
公开(公告)号:US20200373174A1
公开(公告)日:2020-11-26
申请号:US16715123
申请日:2019-12-16
发明人: JIHUN Cheon , Hyun Jung Lee , Pyojin Jeon , Yong-Jhin Cho , Wonjun Lee
摘要: An apparatus for fabricating a semiconductor device may include a nozzle having a slit configured to eject solution and an ultraviolet emitter provided outside the nozzle. The ultraviolet emitter and the nozzle may be configured to move horizontally. The slit may be provided on a bottom surface of the nozzle.
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公开(公告)号:US10825698B2
公开(公告)日:2020-11-03
申请号:US15845236
申请日:2017-12-18
发明人: Yong-Jhin Cho , Young-Hoo Kim , Jihoon Jeong , Yungjun Kim , Kuntack Lee
摘要: Disclosed are a substrate drying apparatus, a facility of manufacturing a semiconductor device, and a method of drying a substrate. The substrate drying apparatus includes a chamber that is configured to dry a substrate at a first temperature, a first reservoir that is configured to store a first supercritical fluid at a second temperature that is less than the first temperature, a second reservoir that is configured to store a second supercritical fluid at a third temperature that is greater than the first temperature, and a supply unit connected between the chamber and the first reservoir and/or second reservoir. The supply unit is configured to supply the chamber with the first supercritical fluid and second supercritical fluid.
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5.
公开(公告)号:US20180366348A1
公开(公告)日:2018-12-20
申请号:US15845236
申请日:2017-12-18
发明人: Yong-Jhin Cho , Young-Hoo Kim , Jihoon Jeong , Yungjun Kim , Kuntack Lee
CPC分类号: H01L21/67034 , B08B3/08 , B08B2203/007 , F26B3/00 , F26B5/005 , H01L21/02057 , H01L21/02101 , H01L21/6704 , H01L21/67051 , H01L21/67109 , H01L21/67173 , H01L21/67219 , H01L21/67248
摘要: Disclosed are a substrate drying apparatus, a facility of manufacturing a semiconductor device, and a method of drying a substrate. The substrate drying apparatus includes a chamber that is configured to dry a substrate at a first temperature, a first reservoir that is configured to store a first supercritical fluid at a second temperature that is less than the first temperature, a second reservoir that is configured to store a second supercritical fluid at a third temperature that is greater than the first temperature, and a supply unit connected between the chamber and the first reservoir and/or second reservoir. The supply unit is configured to supply the chamber with the first supercritical fluid and second supercritical fluid.
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公开(公告)号:US20140291421A1
公开(公告)日:2014-10-02
申请号:US14187556
申请日:2014-02-24
发明人: SeokHoon Kim , Yongmyung Jun , Yongsun Ko , Kyoungseob Kim , Jung-Min Oh , Kuntack Lee , Jihoon Jeong , Yong-Jhin Cho
IPC分类号: B05B1/14
CPC分类号: H01L21/6708 , H01L21/67017 , H01L21/67051
摘要: Provided is a substrate treating apparatus including a housing; a plurality of opening-and-closing members configured to provide a driving force for opening and closing the housing; a fluid storing member supplying a fluid to the opening-and-closing members; and a fluid distribution unit connected to the fluid storing member via a supply conduit to distribute the fluid supplied from the fluid storing member to the opening-and-closing members. The fluid distribution unit includes a distribution conduit diverging from the supply conduit and connected to a corresponding one of the opening-and-closing members; and a fluid distribution member provided at a junction between the supply conduit and the distribution conduit.
摘要翻译: 提供一种基板处理装置,包括壳体; 多个打开和关闭构件,其构造成提供用于打开和关闭壳体的驱动力; 向开闭部件供给流体的流体存储部件; 以及流体分配单元,其经由供应管道连接到流体存储构件,以将从流体存储构件供应的流体分配到打开和关闭构件。 流体分配单元包括从供应导管分支并连接到相应的一个打开和关闭构件的分配管道; 以及设置在供应管道和分配管道之间的接合处的流体分配构件。
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公开(公告)号:US11610788B2
公开(公告)日:2023-03-21
申请号:US17217417
申请日:2021-03-30
发明人: Yong-Jhin Cho , Young-Hoo Kim , Jihoon Jeong , Yungjun Kim , Jung-Min Oh , Kuntack Lee , Hyosan Lee
摘要: A process chamber and a substrate processing apparatus including the same are disclosed. The process chamber includes a first housing and a second housing on the first housing. The first housing includes a first outer wall, a first partition wall facing the first outer wall, and a first side wall connecting the first outer wall and the first partition wall. The second housing includes a second outer wall, a second partition wall between the second outer wall and the first partition wall, and a second side wall connecting the second outer wall and the second partition wall. Each of the first and second outer walls has a thickness greater than a thickness of the first partition wall and a thickness of the second partition wall.
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8.
公开(公告)号:US11545373B2
公开(公告)日:2023-01-03
申请号:US16715123
申请日:2019-12-16
发明人: Jihun Cheon , Hyun Jung Lee , Pyojin Jeon , Yong-Jhin Cho , Wonjun Lee
摘要: An apparatus for fabricating a semiconductor device may include a nozzle having a slit configured to eject solution and an ultraviolet emitter provided outside the nozzle. The ultraviolet emitter and the nozzle may be configured to move horizontally. The slit may be provided on a bottom surface of the nozzle.
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公开(公告)号:US10991600B2
公开(公告)日:2021-04-27
申请号:US15848481
申请日:2017-12-20
发明人: Yong-Jhin Cho , Young-Hoo Kim , Jihoon Jeong , Yungjun Kim , Jung-Min Oh , Kuntack Lee , Hyosan Lee
摘要: A process chamber and a substrate processing apparatus including the same are disclosed. The process chamber includes a first housing and a second housing on the first housing. The first housing includes a first outer wall, a first partition wall facing the first outer wall, and a first side wall connecting the first outer wall and the first partition wall. The second housing includes a second outer wall, a second partition wall between the second outer wall and the first partition wall, and a second side wall connecting the second outer wall and the second partition wall. Each of the first and second outer walls has a thickness greater than a thickness of the first partition wall and a thickness of the second partition wall.
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10.
公开(公告)号:US20170062208A1
公开(公告)日:2017-03-02
申请号:US15350983
申请日:2016-11-14
发明人: Jung-Min Oh , HyoSan Lee , YongSun Ko , KyoungSeob Kim , SeokHoon Kim , KunTack Lee , YongMyung Jun , Yong-Jhin Cho
IPC分类号: H01L21/02 , H01L21/308 , H01L21/67
CPC分类号: H01L21/02101 , H01L21/3081 , H01L21/67017 , H01L21/67034 , H01L21/67109 , H01L21/67253
摘要: A method of manufacture and fluid supply system for treating a substrate is provided. The fluid supply system for treating a substrate may include a substrate dry part supplying a dry fluid to dry a rinse solution doped on a substrate; a dry fluid separation part retrieving a mixed fluid that the dry fluid and the rinse solution are mixed with each other during a dry process of the substrate from the substrate dry part and separating the dry fluid from the mixed fluid; and a dry fluid supply part resupplying the dry fluid separated from the dry fluid separation part to the substrate dry part.
摘要翻译: 提供了一种用于处理基板的制造方法和流体供应系统。 用于处理基底的流体供应系统可以包括:供给干燥流体以干燥掺杂在基底上的漂洗溶液的基底干燥部分; 干燥流体分离部件,其在从所述基材干燥部分干燥所述基材的干燥过程期间将所述干燥流体和所述冲洗溶液彼此混合的混合流体,并将所述干燥流体与所述混合流体分离; 以及将干燥流体分离部分分离的干燥流体再供给到基板干燥部分的干燥流体供给部件。
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