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公开(公告)号:US20240203746A1
公开(公告)日:2024-06-20
申请号:US18391618
申请日:2023-12-20
发明人: Hang Lim LEE , Min Young KIM , Jung Woo OH , Kyung Hwan KIM , Sun Hae CHOI
IPC分类号: H01L21/306
CPC分类号: H01L21/30604
摘要: A chemical etching method using a metal catalyst is provided that prevents deterioration of device performance by preventing the formation of deep-level impurities inside silicon. The etching method comprises forming a metal catalyst containing nickel silicide on a silicon substrate, and selectively etching the silicon substrate in contact with the metal catalyst through chemical etching of the metal catalyst.
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公开(公告)号:US20230343740A1
公开(公告)日:2023-10-26
申请号:US17726487
申请日:2022-04-21
申请人: SEMES CO., LTD.
发明人: Min Young KIM , Hang Lim LEE , Ji Hoon PARK
CPC分类号: H01L24/74 , H05H1/24 , H01L24/05 , H01L2224/05647 , H01L2224/05541 , H01L24/80 , H01L2224/80013 , H01L2224/80395 , H05H2245/40
摘要: There are provided a die surface treatment apparatus capable of sequentially performing reduction and activation processes on dies in a dual zone and a die bonding system including the die surface treatment apparatus. The die surface treatment apparatus includes: a stage supporting dies, a first plasma generator installed on a moving path of the dies, the first plasma generator performing a reduction process on surfaces of the dies, in a first plasma area; and a second plasma generator installed on the moving path of the dies, the second plasma generator performing a hydrophilization process on the surfaces of the dies, in a second plasma area.
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