FLUID SUPPLY DEVICE AND WAFER CLEANING APPARATUS USING THE SAME

    公开(公告)号:US20240058845A1

    公开(公告)日:2024-02-22

    申请号:US18231720

    申请日:2023-08-08

    CPC classification number: B08B3/02 B08B13/00 B08B3/08 H01L21/67023

    Abstract: A fluid supply device and a wafer cleaning apparatus using the same are proposed. The fluid supply device is improved to minimize occurrence of particles generated in an operational process in order to reduce contamination of a wafer. The fluid supply device includes a supply tube connected to a supply tank storing a liquid chemical and a supply valve, a drain tube connected to the supply tube by a branch tube and a drain valve, a fluid tank, a provision tube connected to the supply tube via the branch tube to provide the liquid chemical into the fluid tank, a supply valve, a tank drain tube connected to the fluid tank to drain a liquid chemical in the fluid tank, and a tank drain valve, and a controller configured to control opening and closing of each of the valves and supply of the liquid chemical supplying through the supply tube.

    APPARATUS AND METHOD FOR TREATING SUBSTRATE
    4.
    发明申请

    公开(公告)号:US20200185236A1

    公开(公告)日:2020-06-11

    申请号:US16705065

    申请日:2019-12-05

    Abstract: The inventive concept provides an apparatus and method for removing a film formed on a substrate. A method for treating the substrate includes a primary solvent dispensing step of dispensing an organic solvent onto the substrate to remove a photoresist film on the substrate and an ozone dispensing step of dispensing a liquid containing ozone onto the substrate to remove organic residue on the substrate, after the primary solvent dispensing step.

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