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公开(公告)号:US20170108478A1
公开(公告)日:2017-04-20
申请号:US15317738
申请日:2014-06-12
Applicant: SHIMADZU CORPORATION
Inventor: Yoshiki TAINAKA
CPC classification number: G01N30/8658 , G01N30/7233 , H01J49/0036
Abstract: A check condition setting screen (6) to set conditions for confirming, using a qualifier ion, whether a target ion originates from a target compound, is provided with choices: “ABSOLUTE TOLERATION” and “RELATIVE TOLERATION”, as well as “ABSOLUTE TOLERATION OR RELATIVE TOLERATION” mode, as qualifier ion modes. When the “ABSOLUTE TOLERATION OR RELATIVE TOLERATION” mode is set, an identification range Pa is calculated from a qualifier ion ratio reference value and an absolute tolerance, and an identification range Pr is calculated from the qualifier ion ratio reference value and a relative tolerance, for each qualifier ion for one target ion, and whichever of the two identification ranges is the greater is selected. In addition, when a setting to limit the upper limit value of an identification range to 100% is enabled, the upper limit value of the identification range is limited to 100%, and when the lower limit value of the identification range exceeds 100%, a warning display indicating above upper limit is performed. This allows analyses consistent with various guidelines to be conducted efficiently with simple operations.
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公开(公告)号:US20230132727A1
公开(公告)日:2023-05-04
申请号:US17918648
申请日:2020-11-26
Applicant: SHIMADZU CORPORATION
Inventor: Akihito KORENAGA , Ritsuko YODA , Tatsuki OKUBO , Tomonori OSHIKAWA , Yuko KOBAYASHI , Yoshiki TAINAKA , Kohei SUZUKI
Abstract: One mode of the present invention provides a laser power adjustment method for ionization in a laser desorption/ionization mass spectrometer, the laser power adjustment method including: a measurement step (S1) in which intensity information on ions derived from a specific component in a specimen are acquired while changing laser power in n stages (n is 3 or more) for the identical specimen; and a processing step (S2, S6, and S7) in which a slope of a straight line connecting two adjacent plot points on a laser power axis is calculated in a two-axis graph in which a relationship between n ionic intensities obtained by the measurement step or a signal value, which is an SN ratio obtained from the ionic intensities, and laser power is plotted; an index value reflecting a ratio between a forward slope value, which is a slope of a straight line on a front side of the plot point, and a backward slope value, which is a slope of a straight line on a rear side, is obtained for each plot point; and appropriate laser power is selected using the index value.
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公开(公告)号:US20220065884A1
公开(公告)日:2022-03-03
申请号:US17376776
申请日:2021-07-15
Applicant: SHIMADZU CORPORATION
Inventor: Tomonori OSHIKAWA , Yuko KOBAYASHI , Yoshiki TAINAKA , Tatsuki OKUBO , Kohei SUZUKI
Abstract: In a device (4) for assisting in analytical operations for correctly arranging samples in a plurality of sample-placement portions and implementing multiple protocols in the correct order, a storage section (41) holds sample information and analysis parameters for each protocol as well as the order of implementation. A protocol-selection-input receiver (42) receives an input of the selection of a protocol. A sample-position displayer (43) displays, on a display unit (6), sample information in the selected protocol along with the positions of the sample-placement portions. A protocol-implementation-information collector (45) collects information concerning the state of implementation of the protocols. A determiner (46) determines whether a protocol which must be implemented earlier was already implemented, based on the state of implementation and order of implementation of the protocols. A batch-file creator (47) creates a batch file when it is confirmed that the protocol which must be implemented earlier was already implemented.
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公开(公告)号:US20240266158A1
公开(公告)日:2024-08-08
申请号:US18019626
申请日:2021-01-06
Applicant: Shimadzu Corporation
Inventor: Naoki KANEKO , Tatsuki OKUBO , Tomonori OSHIKAWA , Yuko KOBAYASHI , Yoshiki TAINAKA , Kohei SUZUKI , Takashi NISHIKAZE
IPC: H01J49/00
CPC classification number: H01J49/0009
Abstract: The present disclosure provides a method for calibrating a difference in signal intensity ratio between machines in mass spectrometry.
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公开(公告)号:US20230314456A1
公开(公告)日:2023-10-05
申请号:US18040928
申请日:2021-04-26
Applicant: SHIMADZU CORPORATION
Inventor: Tatsuki OKUBO , Tomeonori OSHIKAWA , Yuko KOBAYASHI , Yoshiki TAINAKA , Kohei SUZUKI
IPC: G01N35/00 , G06F3/04842
CPC classification number: G01N35/00722 , G06F3/04842 , G01N2035/0091
Abstract: A device that supports analysis work of executing a protocol for disposing a predetermined sample in all or some predetermined sample disposing portions among a plurality of sample disposing portions provided in a sample housing member and for performing measurement, includes: a storage unit in which protocols are stored; a display unit; a protocol selection input reception unit to receive an input for selecting a protocol; a sample position display unit to display information on a position of the sample disposing portion and information on the sample corresponding to the protocol input to the protocol selection input reception unit on the display unit; a display item selection checkbox to receive selection of the information on the position of the sample disposing portion and/or the information on the sample; and a display switching unit to switch display by the sample position display unit depending on the selection.
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公开(公告)号:US20190087158A1
公开(公告)日:2019-03-21
申请号:US16136338
申请日:2018-09-20
Applicant: SHIMADZU CORPORATION
Inventor: Akane YAMAMOTO , Yoshiki TAINAKA
IPC: G06F7/523
Abstract: An item setter sets a plurality of first analysis parameters included in first analysis condition data acquired by an analysis condition data acquirer in a first item that is dependent on characteristics of a first analysis device and a second analysis device, and a second item that is not dependent on the characteristics of the first and second analysis devices. A parameter value converter converts a value of a first analysis parameter of the first item that is set by the item setter into a value of a second analysis parameter corresponding to a second data processing device for the second analysis device, and takes a value of a first analysis parameter of the second item that is set by the item setter as a value of a second analysis parameter as it is.
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