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    PROBER FOR ELECTRONIC DEVICE TESTING ON LARGE AREA SUBSTRATES
    1.
    发明申请
    PROBER FOR ELECTRONIC DEVICE TESTING ON LARGE AREA SUBSTRATES 有权
    电子设备测试大面积基板的探测器

    公开(公告)号：US20070296426A1

    公开(公告)日：2007-12-27

    申请号：US11746530

    申请日：2007-05-09

    申请人： SRIRAM KRISHNASWAMI ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin Johnston ,  Hung Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    发明人： SRIRAM KRISHNASWAMI ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin Johnston ,  Hung Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2887 ,  G09G3/006 ,  G09G3/3208 ,  G09G3/3611

    摘要： An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.

    摘要翻译： 描述了用于测试大面积基板的装置和方法。 大面积基板包括电耦合到大面积基板上的显示器的显示器图案和接触点。 该装置包括可相对于大面积基板和/或接触点移动的探测器组件，并且可以被配置为测试各种大面积基板上的各种显示图案和接触点。 探测器组件还被配置为测试位于测试台上的大面积衬底的小数部分，并且探针组件可以被配置为用于不同的显示和接触点图案，而不从测试台移除探测器组件。

    Prober for electronic device testing on large area substrates
    2.
    发明授权
    Prober for electronic device testing on large area substrates 有权
    用于在大面积基板上进行电子设备测试的探针

    公开(公告)号：US07786742B2

    公开(公告)日：2010-08-31

    申请号：US11746530

    申请日：2007-05-09

    申请人： Sriram Krishnaswami ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    发明人： Sriram Krishnaswami ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2887 ,  G09G3/006 ,  G09G3/3208 ,  G09G3/3611

    摘要： An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.

    摘要翻译： 描述了用于测试大面积基板的装置和方法。 大面积基板包括电耦合到大面积基板上的显示器的显示器图案和接触点。 该装置包括可相对于大面积基板和/或接触点移动的探测器组件，并且可以被配置为测试各种大面积基板上的各种显示图案和接触点。 探测器组件还被配置为测试位于测试台上的大面积衬底的小数部分，并且探针组件可以被配置为用于不同的显示和接触点图案而不从测试台移除探测器组件。

    Configurable prober for TFT LCD array testing
    9.
    发明授权
    Configurable prober for TFT LCD array testing 有权
    用于TFT LCD阵列测试的可配置探头

    公开(公告)号：US07319335B2

    公开(公告)日：2008-01-15

    申请号：US10889695

    申请日：2004-07-12

    申请人： Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez (Frank) E. Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

    发明人： Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez (Frank) E. Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

    IPC分类号： G01R31/305

    CPC分类号： G09G3/006 ,  G01R31/2893 ,  G01R31/305

    摘要： An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame.

    摘要翻译： 提供了一种用于电子设备测试系统的改进的探测器。 探测器是“可配置的”，这意味着它可以适用于不同的设备布局和基板尺寸。 探测器通常包括框架，至少一个具有第一端和第二端的探测杆，框架连接机构，其允许在沿着框架的选定点准备将探测杆重新定位到框架，以及多个电触点 沿着探测杆的引脚，用于在测试期间将选定的电子设备与系统控制器电连通。 在一个实施例中，探测器用于测试诸如玻璃基板上的薄膜晶体管的器件。 通常，玻璃基板是正方形的，框架也是正方形的。 以这种方式，“x”和“y”轴由框架定义。