摘要:
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.
摘要:
A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.
摘要:
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
摘要:
A method and integrated system for electron beam testing a substrate is provided. In one aspect, the integrated system includes an electron beam testing chamber having a substrate table disposed therein. The substrate table is capable of moving a substrate within the testing chamber in both horizontal and vertical directions. The system also includes a load lock chamber disposed adjacent a first side of the testing chamber, and a prober storage assembly disposed beneath the testing chamber. A prober transfer assembly is disposed adjacent a second side of the testing chamber and arranged to transfer one or more probers between the prober storage assembly and the testing chamber. Further, one or more electron beam testing devices are disposed on an upper surface of the testing chamber.
摘要:
A method and apparatus for testing a plurality of electronic devices on a large area substrate is described. The apparatus includes a prober positioning assembly coupled to a substrate support within a testing chamber. The substrate support is a testing table capable of movement in X, Y and Z axes and the prober positioning assembly is capable of movement relative to the testing table. A prober exchanger is positioned adjacent the testing chamber and facilitates prober transfer through cooperative and relative movement with the prober positioning assembly. A load lock chamber having a single transfer door actuator, an atmospheric substrate lift, and a plurality of substrate alignment members is also described.
摘要:
A substrate table and method for supporting and transferring a substrate are provided. The substrate table includes a segmented stage having an upper surface for supporting a substrate, and an end effector. The end effector includes two or more spaced apart fingers and an upper surface for supporting a substrate. The end effector is at least partially disposed and moveable within the segmented stage such that the fingers of the end effector and the segmented stage interdigitate to occupy the same horizontal plane. The segmented stage is adapted to raise and lower about the end effector.
摘要:
A system and method for supporting and transferring a substrate relative to a plurality of testing columns are provided. The system includes a testing table adapted to support and move the substrate relative to the plurality of testing columns. The testing table may include an end effector disposed therein to transfer the substrate relative to an upper surface of the testing table. The method includes transferring the substrate to the testing table and moving the substrate relative to the plurality of testing columns. Signals indicative of electronic device performance are sensed to determine operability of the devices on the substrate.
摘要:
A method of monitoring virtualized network includes receiving information regarding the virtualized network, wherein the information is received at a port of a network switch appliance, receiving a packet at a network port of the network switch appliance, and using the received information to determine whether to process the packet according to a first packet processing scheme or a second packet processing scheme, wherein the first packet processing scheme involves performing header stripping, and performing packet transmission to one of a plurality of instrument ports at the network switch appliance after the header stripping, each of the instrument ports configured for communicatively coupling to a network monitoring instrument, and wherein the second packet processing scheme involves performing packet transmission to one of the plurality of instrument ports at the network switch appliance without performing any header stripping.
摘要:
A heart valve prosthesis is provided having a self-expanding multi-level frame that supports a valve body comprising a skirt and plurality of coapting leaflets. The frame transitions between a contracted delivery configuration that enables percutaneous transluminal delivery, and an expanded deployed configuration having an asymmetric hourglass shape. The valve body skirt and leaflets are constructed so that the center of coaptation may be selected to reduce horizontal forces applied to the commissures of the valve, and to efficiently distribute and transmit forces along the leaflets and to the frame. Alternatively, the valve body may be used as a surgically implantable replacement valve prosthesis.
摘要:
One embodiment of the present invention provides a system that accommodates different clock frequencies in an Ethernet passive optical network (EPON). The system receives a signal from an optical line terminal (OLT) at an optical network unit (ONU) and derives an OLT clock. The system also maintains a local clock. The system further receives from the OLT an assignment for an upstream transmission window, during which the ONU can transmit an upstream data burst to the OLT based on the local clock. The system adjusts the number of bits of the data burst without affecting the payload data carried in the data burst, thereby allowing the data burst to fit properly within the upstream transmission window and compensating for frequency differences between the local clock and the OLT clock. The system transmits the data burst based on the local clock in the upstream transmission window.