MICROELECTROMECHANICAL Z-AXIS DETECTION STRUCTURE WITH LOW THERMAL DRIFTS
    1.
    发明申请
    MICROELECTROMECHANICAL Z-AXIS DETECTION STRUCTURE WITH LOW THERMAL DRIFTS 有权
    具有低热耗散的微电子Z轴检测结构

    公开(公告)号:US20130239686A1

    公开(公告)日:2013-09-19

    申请号:US13888170

    申请日:2013-05-06

    Abstract: A MEMS detection structure is provided with: a substrate having a top surface, on which a first fixed-electrode arrangement is set; a sensing mass, extending in a plane and suspended above the substrate and above the first fixed-electrode arrangement at a separation distance; and connection elastic elements that support the sensing mass so that it is free to rotate out of the plane about an axis of rotation, modifying the separation distance, as a function of a quantity to be detected along an axis orthogonal to the plane. The MEMS detection structure also includes: a coupling mass, suspended above the substrate and connected to the sensing mass via the connection elastic elements; and an anchoring arrangement, which anchors the coupling mass to the substrate with a first point of constraint, set at a distance from the axis of rotation and in a position corresponding to the first fixed-electrode arrangement.

    Abstract translation: MEMS检测结构设置有:具有顶表面的基板,其上设置有第一固定电极布置; 感测质量块,在平面内延伸并悬挂在衬底上方,并以分隔距离悬挂在第一固定电极装置上方; 以及连接弹性元件,其支撑感测质量,使得其可以围绕旋转轴线自由地旋转离开平面,根据沿着与该平面垂直的轴线被检测的量来修改分离距离。 MEMS检测结构还包括:耦合质量块,悬挂在衬底上并通过连接弹性元件连接到感测质量块; 以及锚定装置,其将耦合质量块固定到具有第一限制点的衬底上,该第一约束点设置在距旋转轴线一定距离处,并且位于对应于第一固定电极装置的位置。

    MEMS resonant accelerometer having improved electrical characteristics

    公开(公告)号:US09354246B2

    公开(公告)日:2016-05-31

    申请号:US13952503

    申请日:2013-07-26

    CPC classification number: G01P15/097 G01P15/10

    Abstract: A MEMS resonant accelerometer is disclosed, having: a proof mass coupled to a first anchoring region via a first elastic element so as to be free to move along a sensing axis in response to an external acceleration; and a first resonant element mechanically coupled to the proof mass through the first elastic element so as to be subject to a first axial stress when the proof mass moves along the sensing axis and thus to a first variation of a resonant frequency. The MEMS resonant accelerometer is further provided with a second resonant element mechanically coupled to the proof mass through a second elastic element so as to be subject to a second axial stress when the proof mass moves along the sensing axis, substantially opposite to the first axial stress, and thus to a second variation of a resonant frequency, opposite to the first variation.

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