公开(公告)号：US12072372B2

公开(公告)日：2024-08-27

申请号：US17903344

申请日：2022-09-06

Applicant: STMicroelectronics S.r.l.

Inventor： Matteo Brivio ,  Nicola De Campo ,  Matteo Venturelli

IPC: G01R31/28

CPC classification number: G01R31/2834

Abstract: A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.

公开(公告)号：US20220137131A1

公开(公告)日：2022-05-05

申请号：US17514568

申请日：2021-10-29

Applicant: STMicroelectronics S.r.l.

Inventor： Matteo Brivio ,  Matteo Venturelli ,  Nicola De Campo

IPC: G01R31/3183

Abstract: In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage.

公开(公告)号：US12163997B2

公开(公告)日：2024-12-10

申请号：US18151330

申请日：2023-01-06

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Nicola De Campo ,  Matteo Venturelli ,  Matteo Brivio ,  Mauro Foppiani

IPC: G01R31/28 ,  G01R19/00

Abstract: A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.

公开(公告)号：US20230079831A1

公开(公告)日：2023-03-16

申请号：US17903344

申请日：2022-09-06

Applicant: STMicroelectronics S.r.l.

Inventor： Matteo Brivio ,  Nicola De Campo ,  Matteo Venturelli

IPC: G01R31/28

Abstract: A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.

公开(公告)号：US12105143B2

公开(公告)日：2024-10-01

申请号：US17967089

申请日：2022-10-17

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Leonardo Pedone ,  Simone Scaduto ,  Rossella Gaudiano ,  Matteo Brivio ,  Matteo Venturelli

IPC: H03M1/78 ,  G01R31/317 ,  H03M1/74

CPC classification number: G01R31/31724 ,  G01R31/31706 ,  H03M1/742 ,  H03M1/785

Abstract: A digital-to-analog converter (DAC) includes a switching network and built-in-self-test (BIST) circuitry. The DAC, in operation, generates analog output signals in response to input codes of a set of input codes of the DAC. The BIST circuitry sequentially applies codes of a determined subset of codes of the set of input codes to test the plurality of switches. The determined subset of codes has fewer codes than the set of input codes. The BIST circuitry detects failures of switches of the plurality of switches based on responses of the DAC to the applied codes. In response to detecting a failure of a switch, the BIST generates a signal indicating a failure of the switching network.

公开(公告)号：US11531064B2

公开(公告)日：2022-12-20

申请号：US17514568

申请日：2021-10-29

Applicant: STMicroelectronics S.r.l.

Inventor： Matteo Brivio ,  Matteo Venturelli ,  Nicola De Campo

IPC: G01R31/3183 ,  G01R31/28 ,  G01R31/317 ,  G11C29/56 ,  G01R31/30 ,  G11C29/02

Abstract: In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage.

公开(公告)号：US09176191B2

公开(公告)日：2015-11-03

申请号：US13913883

申请日：2013-06-10

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Giorgio Rossi ,  Carlo Caimi ,  Matteo Brivio

IPC: G01R31/3187 ,  G01R31/28 ,  H01L21/66

CPC classification number: G01R31/3187 ,  G01R31/2853 ,  G01R31/2884 ,  H01L22/34 ,  H01L2224/05554 ,  H01L2224/48247 ,  H01L2224/49113 ,  H01L2224/49171 ,  H01L2224/49175 ,  H01L2924/13091 ,  H01L2924/00

Abstract: An electronic device includes an electronic component having terminals including a set of first terminals and a set of second terminals, a protective package embedding the electronic component, leads exposed from the protective package including a set of first leads and a set of second leads, for each first lead a first electrical connection inside the protection package between the first lead and a corresponding one of the first terminals, and for each second lead electrical connections inside the protective package each one between the second lead and a corresponding one of the second terminals. For each second lead the electronic component includes test structures, each being coupled between a corresponding one of the second terminals connected to the second lead and a corresponding test one of the first terminals connected to a test one of the first leads.

Abstract translation: 电子设备包括具有终端的电子部件，该端子包括一组第一端子和一组第二端子，嵌入电子部件的保护封装件，从包括一组第一引线和一组第二引线的保护封装暴露的引线，用于 每个首先在第一引线和相应的一个第一端子之间的保护封装内部引导第一电连接，并且对于保护封装内部的每个第二引线电连接，每个在第二引线和相应的一个第二端子之间引导。 对于每个第二引线，电子部件包括测试结构，每个测试结构耦合在连接到第二引线的相应的一个第二端子和与第一引线中的一个测试引线连接的第一端子中的相应测试的一个引线之间。