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公开(公告)号:US11670685B2
公开(公告)日:2023-06-06
申请号:US17226003
申请日:2021-04-08
Applicant: STMICROELECTRONICS S.R.L.
Inventor: Simone Rascuná , Paolo Badalá , Anna Bassi , Gabriele Bellocchi
IPC: H01L29/872 , H01L29/16 , H01L29/66
CPC classification number: H01L29/1608 , H01L29/1606 , H01L29/6603 , H01L29/66143 , H01L29/872
Abstract: A method for manufacturing a SiC-based electronic device, that includes implanting, at a front side of a solid body of SiC having a conductivity of N type, dopant species of P type, thus forming an implanted region that extends in depth in the solid body starting from the front side and has a top surface co-planar with said front side; and generating a laser beam directed towards the implanted region in order to generate heating of the implanted region at temperatures comprised between 1500° C. and 2600° C. so as to form an ohmic contact region including one or more carbon-rich layers, for example graphene and/or graphite layers, in the implanted region and, simultaneously, activation of the dopant species of P type.
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公开(公告)号:US11728404B2
公开(公告)日:2023-08-15
申请号:US17350916
申请日:2021-06-17
Applicant: STMICROELECTRONICS S.R.L.
Inventor: Ferdinando Iucolano , Paolo Badalá
IPC: H01L29/66 , H01L21/285 , H01L29/20 , H01L29/205 , H01L29/47 , H01L29/778 , H01L21/28 , C23C14/00 , C23C14/06 , C23C14/30 , H01L29/417
CPC classification number: H01L29/66462 , H01L21/28264 , H01L21/28581 , H01L29/2003 , H01L29/205 , H01L29/475 , H01L29/66431 , H01L29/7786 , C23C14/0021 , C23C14/0641 , C23C14/0676 , C23C14/30 , H01L29/41766
Abstract: An HEMT device of a normally-on type, comprising a heterostructure; a dielectric layer extending over the heterostructure; and a gate electrode extending right through the dielectric layer. The gate electrode is a stack, which includes: a protection layer, which is made of a metal nitride with stuffed grain boundaries and extends over the heterostructure, and a first metal layer, which extends over the protection layer and is completely separated from the heterostructure by said protection layer.
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公开(公告)号:US11605751B2
公开(公告)日:2023-03-14
申请号:US17344558
申请日:2021-06-10
Applicant: STMICROELECTRONICS S.R.L.
Inventor: Simone Rascuná , Gabriele Bellocchi , Paolo Badalá , Isodiana Crupi
IPC: H01L31/10 , H01L31/101 , H01L31/0224 , H01L31/103 , H01L31/18
Abstract: A device for detecting UV radiation, comprising: a SiC substrate having an N doping; a SiC drift layer having an N doping, which extends over the substrate; a cathode terminal; and an anode terminal. The anode terminal comprises: a doped anode region having a P doping, which extends in the drift layer; and an ohmic-contact region including one or more carbon-rich layers, in particular graphene and/or graphite layers, which extends in the doped anode region. The ohmic-contact region is transparent to the UV radiation to be detected.
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公开(公告)号:US12125933B2
公开(公告)日:2024-10-22
申请号:US18181409
申请日:2023-03-09
Applicant: STMICROELECTRONICS S.r.l.
Inventor: Simone Rascuná , Gabriele Bellocchi , Paolo Badalá , Isodiana Crupi
IPC: H01L31/101 , H01L31/0224 , H01L31/103 , H01L31/18
CPC classification number: H01L31/1016 , H01L31/022408 , H01L31/022466 , H01L31/103 , H01L31/1812 , H01L31/1864 , H01L31/1884
Abstract: A device for detecting UV radiation, comprising: a SiC substrate having an N doping; a SiC drift layer having an N doping, which extends over the substrate; a cathode terminal; and an anode terminal. The anode terminal comprises: a doped anode region having a P doping, which extends in the drift layer; and an ohmic-contact region including one or more carbon-rich layers, in particular graphene and/or graphite layers, which extends in the doped anode region. The ohmic-contact region is transparent to the UV radiation to be detected.
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