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公开(公告)号:US20180236927A1
公开(公告)日:2018-08-23
申请号:US15789026
申请日:2017-10-20
Inventor: Bruce Rae
CPC classification number: B60Q1/143 , B60Q1/0023 , B60Q2300/40 , G01S7/4813 , G01S7/4816 , G01S17/10 , G01S17/89 , G01S17/936 , H05B33/0857 , H05B37/0227 , H05B37/0272
Abstract: A light system includes at least one time-of-flight image sensor configured to generate at least one zone distance measurement. At least one control unit is configured to receive the at least one zone distance measurement and to generate at least one control signal based on the at least one zone distance measurement. At least one light unit is configured to adapt an output of the light unit based on the at least one control signal.
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公开(公告)号:US20140231630A1
公开(公告)日:2014-08-21
申请号:US14180819
申请日:2014-02-14
Inventor: Bruce Rae , John Kevin Moore
IPC: H01L31/09
CPC classification number: H01L31/09 , G01J1/08 , G01S7/4863 , G01S7/4865 , G01S7/497 , G01S17/10 , H01L31/02019 , H03K17/941
Abstract: A photon sensitive device is provided with a voltage. A controller is configured to control a voltage source so as to cause at least one calibration voltage to be applied to the photon sensitive device in a calibration mode in order to determine the voltage to be provided by the voltage source in a normal mode of operation.
Abstract translation: 光敏装置具有电压。 控制器被配置为控制电压源,以便在校准模式下使至少一个校准电压施加到光敏器件,以便确定在正常工作模式下由电压源提供的电压。
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公开(公告)号:US12074242B2
公开(公告)日:2024-08-27
申请号:US17734738
申请日:2022-05-02
Inventor: Mohammed Al-Rawhani , Neale Dutton , John Kevin Moore , Bruce Rae , Elisa Lacombe
IPC: H01L31/107 , H01L27/146 , H04N25/705 , H04N25/75
CPC classification number: H01L31/107 , H01L27/14612 , H01L27/14643 , H04N25/705 , H04N25/75
Abstract: Disclosed herein is an array of pixels. Each pixel includes a single photon avalanche diode (SPAD) and a transistor circuit. The transistor circuit includes a clamp transistor configured to clamp an anode voltage of the SPAD to be no more than a threshold clamped anode voltage, and a quenching element in series with the clamp transistor and configured to quench the anode voltage of the SPAD when the SPAD is struck by an incoming photon. Readout circuitry is coupled to receive the clamped anode voltage from the transistor circuit and to generate a pixel output therefrom, the threshold clamped anode voltage being below a maximum voltage rating of transistors forming the readout circuitry.
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公开(公告)号:US11336853B2
公开(公告)日:2022-05-17
申请号:US17063192
申请日:2020-10-05
Inventor: Raul Andres Bianchi , Matteo Maria Vignetti , Bruce Rae
IPC: H04N5/3745 , H04N5/378
Abstract: The present disclosure relates to a device that includes a photodiode having a first terminal that is coupled by a resistor to a first rail configured to receive a high supply potential and a second terminal that is coupled by a switch to a second rail configured to receive a reference potential. A read circuit is configured to provide a pulse when the photodiode enters into avalanche, and a control circuit is configured to control an opening of the switch in response to a beginning of the pulse and to control a closing of the switch in response to an end of the pulse.
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公开(公告)号:US10388816B2
公开(公告)日:2019-08-20
申请号:US15712673
申请日:2017-09-22
Inventor: Bruce Rae
IPC: H01L31/10 , H01L31/107 , H01L31/02 , H01L27/144
Abstract: A semiconductor on insulator substrate includes a semiconductor support layer, a buried insulating layer over the semiconductor support layer and an epitaxial semiconductor layer over the buried insulating layer. A deep trench isolation penetrates completely through the epitaxial semiconductor layer to the buried insulating layer to electrically insulate a first region of the epitaxial semiconductor layer from a second region of the epitaxial semiconductor layer. A single photon avalanche diode (SPAD) includes an anode formed by the first region of the epitaxial semiconductor layer and a cathode formed by a well located within the first region of the epitaxial semiconductor layer. An ancillary circuit for the SPAD is located in the second region of the epitaxial semiconductor layer and electrically coupled to the SPAD.
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公开(公告)号:US10304877B2
公开(公告)日:2019-05-28
申请号:US15709791
申请日:2017-09-20
Applicant: STMicroelectronics (Grenoble 2) SAS , STMicroelectronics (Research & Development) Limited
Inventor: Pascal Mellot , Stuart McLeod , Bruce Rae , Marc Drader
IPC: H01L31/107 , H01L27/144 , G01S7/486 , G01S7/497 , H01L31/0216 , H01L27/146 , H01L27/148
Abstract: A circuit may include an array of single photon avalanche diode (SPAD) cells, each SPAD cell configured to be selectively enabled by an activation signal. The circuit may include a control circuit configured to selectively enable a subset of the array of SPAD cells based on a measured count rate of the array of SPAD cells.
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公开(公告)号:US20140231631A1
公开(公告)日:2014-08-21
申请号:US14181857
申请日:2014-02-17
Inventor: John Kevin Moore , Bruce Rae
CPC classification number: G01S17/10 , G01S7/4865 , G01S7/497 , G01S17/026 , G01S17/36
Abstract: An array of photon sensitive devices is configured to provide outputs. Pulse shaping circuits operate to shape a respective output of the array in a normal mode of operation and shape a calibration signal in a calibration mode of operation.
Abstract translation: 一组光子敏感设备被配置成提供输出。 脉冲整形电路用于在正常操作模式下对阵列的相应输出进行整形,并在校准操作模式下形成校准信号。
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公开(公告)号:US11349042B2
公开(公告)日:2022-05-31
申请号:US16718762
申请日:2019-12-18
Inventor: Mohammed Al-Rawhani , Neale Dutton , John Kevin Moore , Bruce Rae , Elsa Lacombe
IPC: H04N5/378 , H01L31/107 , H01L27/146 , H01L31/02 , H04N5/3745
Abstract: A pixel includes a single photon avalanche diode (SPAD) having a cathode coupled to a high voltage supply through a quenching element, with the SPAD having a capacitance at its anode formed from a deep trench isolation, with the quenching element having a sufficiently high resistance such that the capacitance is not fully charged when the SPAD is struck by an incoming photon. The pixel includes a clamp transistor configured to be controlled by a voltage clamp control signal to clamp voltage at an anode of the SPAD when the SPAD is struck by an incoming photon to be no more than a threshold clamped anode voltage, and readout circuitry coupled to receive the clamped anode voltage from the clamp transistor and to generate a pixel output therefrom. The threshold clamped anode voltage is below a maximum operating voltage rating of transistors forming the readout circuitry.
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公开(公告)号:US20210181016A1
公开(公告)日:2021-06-17
申请号:US16711832
申请日:2019-12-12
Inventor: Mohammed AL-RAWHANI , Bruce Rae
IPC: G01J1/44
Abstract: A photodetection circuit includes a single photon avalanche diode (SPAD), and an active quenching circuit coupling the SPAD to an intermediate node and having a variable RC constant. The variable RC constant provides a first RC constant during an idle state so that when the SPAD detects a photon, the SPAD avalanches to begin quenching to set a magnitude of a voltage at a terminal of the SPAD to a quench voltage, the quench voltage being greater than a threshold voltage; a second RC constant greater than the first RC constant during a hold off period during which the quenching occurs so as to maintain the voltage at the terminal of the SPAD at a magnitude that is above the threshold voltage during the hold off period; and a third RC constant less than the second RC constant but greater than the first RC constant during a recharge period during which the SPAD is recharged.
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公开(公告)号:US10950559B2
公开(公告)日:2021-03-16
申请号:US16436747
申请日:2019-06-10
Inventor: Mathieu Lisart , Bruce Rae
Abstract: An electronic integrated circuit chip includes a semiconductor substrate with a front side and a back side. A first reflective shield is positioned adjacent the front side of the semiconductor substrate and a second reflective shield is positioned adjacent the back side of the semiconductor substrate. Photons are emitted by a photon source to pass through the semiconductor substrate and bounce off the first and second reflective shields to reach a photon detector at the front side of the semiconductor substrate. The detected photons are processed in order to determine whether to issue an alert indicating the existence of an attack on the electronic integrated circuit chip.
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