Abstract:
A solid state imaging device includes a pixel array comprising a plurality of photoelectric conversion devices and an analog to digital conversion (ADC) circuit configured to convert an image signal received from the pixel array to a digital signal responsive to a ramp signal and a gain setting. The solid state imaging device further includes a ramp signal generator circuit configured to generate the ramp signal with a slope that varies responsive to a control signal and a dark level offset compensation circuit configured to generate the control signal responsive to the gain setting and a dark level measurement.
Abstract:
A method of binning pixels in an image sensor including: dividing a pixel array into a plurality of binning areas, wherein each binning area includes (2n)*(2n) pixels, wherein n is an integer equal to or greater than two; and generating binning pixel data in each of the binning areas, wherein the locations of the binning pixel data of each binning area are evenly distributed within the binning area.
Abstract:
An image sensor in accordance with exemplary embodiments of the inventive concept may include a pixel sensor array which includes an active pixel sensor and an optical black pixel sensor; a first analog to digital converter configured to convert a first sensing signal, which is provided from the active pixel sensor, to a first digital signal; a second analog to digital converter configured to convert a second sensing signal, which is provided from the optical black pixel sensor, to a second digital signal; and an output buffer configured to temporarily store and output the first digital signal and the second digital signal, wherein a plurality of noise characteristics of the second analog to digital converter is different from a plurality of noise characteristics of the first analog to digital converter.
Abstract:
The signal compensating method includes receiving sensing signals from an image sensor pixel array; converting the sensing signals into digital signals using a plurality of analog-to-digital converters, respectively; and compensating the digital signals using offset values corresponding to the plurality of analog-to-digital converters, respectively.
Abstract:
The image sensor includes a plurality of column lines, a plurality of active road circuits and a selection circuit. The plurality of column lines are each connected to a corresponding one of a plurality of pixels. The plurality of active road circuits are each connected to a corresponding one of the plurality of column lines. The selection circuit is configured to enable a portion of the plurality of active road circuits based on a plurality of column selection signals.