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公开(公告)号:US20230215028A1
公开(公告)日:2023-07-06
申请号:US17949439
申请日:2022-09-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sang Woo KIM , Bum Jun KIM
IPC: G06T7/55 , H04N13/243
CPC classification number: G06T7/55 , H04N13/243 , G06T2207/20081 , G06T2207/20224 , H04N2013/0081
Abstract: Disclosed is an operating method of an electronic device which includes a processor performing machine learning of a monocular depth estimation module. The operating method includes obtaining, by the processor, a first image and a second image respectively photographed by a first camera and a second camera of different locations, inferring, by the processor, a plurality of multi-cyclic disparities by applying weights of the monocular depth estimation module to the first image plural times and calculating a plurality of multi-cyclic loss functions based on the first image, the second image, and the plurality of multi-cyclic disparities, and updating, by the processor, the weights of the monocular depth estimation module through machine learning, based on the plurality of multi-cyclic loss functions.
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公开(公告)号:US20200279522A1
公开(公告)日:2020-09-03
申请号:US16876168
申请日:2020-05-18
Inventor: Jong Kon BAE , Dong Hwy KIM , Sang Woo KIM , Jung Hee YUN , Yo Han LEE , Dong Kyoon HAN , Yun Pyo HONG , Hong Kook LEE
Abstract: An electronic device is provided. The electronic device may include a display, a processor operatively connected with the display and configured to generate external reference time information, a display driver integrated circuit configured to periodically or randomly receive the external reference time information from the processor, wherein the display driver integrated circuit is configured to generate internal time information based on an internal clock, to output a clock image corresponding to the internal time information on the display, and if a time error between the external reference time information and the internal time information occurs during the outputting of the clock image, to output the internal time information, the time error of which is corrected, on the display.
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公开(公告)号:US20210293876A1
公开(公告)日:2021-09-23
申请号:US17338868
申请日:2021-06-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joon Woo CHO , Yun Ju KWON , Sang Woo KIM
IPC: G01R31/28 , G06F1/3206 , G06F1/3209 , G06F1/3296 , G06F1/26
Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.
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公开(公告)号:US20190214989A1
公开(公告)日:2019-07-11
申请号:US16107424
申请日:2018-08-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yoo Seok SHON , Sang Woo KIM , Byung Tak LEE , Yun Ju KWON , Joon-Woo CHO
Abstract: Provided are a semiconductor device and a semiconductor system. A semiconductor device includes a hardware auto clock gating (HWACG) logic configured to provide clock gating of an intellectual property (IP) block; and a memory power controller configured to perform power gating of a memory electrically connected with the IP block, based on the HWACG logic providing the clock gating for the IP block. The HWACG logic includes a first clock source configured to provide a first clock signal; a second clock source configured to receive the first clock signal provided by the first clock source, and provide a second clock signal to the IP block; a first clock control circuit configured to control the first clock source; and a second clock control circuit configured to transmit a clock request to the first clock control circuit, and control the second clock source, based on an operation state of the IP block.
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公开(公告)号:US20180217202A1
公开(公告)日:2018-08-02
申请号:US15791738
申请日:2017-10-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joon Woo CHO , Yun Ju KWON , Sang Woo KIM
CPC classification number: G01R31/2853 , G01R31/2884 , G06F1/26 , G06F1/3206 , G06F1/3209 , G06F1/3296
Abstract: A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.
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公开(公告)号:US20180061309A1
公开(公告)日:2018-03-01
申请号:US15690831
申请日:2017-08-30
Inventor: Jong Kon BAE , Dong Hwy KIM , Sang Woo KIM , Jung Hee YUN , Yo Han LEE , Dong Kyoon HAN , Yun Pyo HONG , Hong Kook LEE
CPC classification number: G09G3/2096 , G04G3/04 , G04G7/00 , G04G7/026 , G04R40/06 , G09G5/003 , G09G5/006 , G09G5/12 , G09G2310/08 , G09G2340/0435 , G09G2360/12
Abstract: An electronic device is provided. The electronic device may include a display, a processor operatively connected with the display and configured to generate external reference time information, a display driver integrated circuit configured to periodically or randomly receive the external reference time information from the processor, wherein the display driver integrated circuit is configured to generate internal time information based on an internal clock, to output a clock image corresponding to the internal time information on the display, and if a time error between the external reference time information and the internal time information occurs during the outputting of the clock image, to output the internal time information, the time error of which is corrected, on the display.
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