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公开(公告)号:US20190129655A1
公开(公告)日:2019-05-02
申请号:US16023706
申请日:2018-06-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Raeyoung LEE , Hyunjung KIM , Sung-Bok LEE , Soyeong GWAK , Sang-wan NAM
Abstract: A method of operating a memory controller, the memory controller configured to control a nonvolatile memory device, the nonvolatile memory device including a plurality of memory blocks. The method including detecting an invalid block among the plurality of memory blocks; determining an invalid pattern based on a state of the invalid block; and performing an operation on the invalid block such that the invalid block has the invalid pattern.
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公开(公告)号:US20230307062A1
公开(公告)日:2023-09-28
申请号:US18326606
申请日:2023-05-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Soyeong GWAK , Raeyoung LEE , Jinkyu KANG , Sejun PARK , Changhwan SHIN , Jaeduk LEE , Woojae JANG
CPC classification number: G11C16/16 , G11C16/26 , G11C16/349 , G11C7/1087 , G11C16/24 , G11C7/106 , G11C16/08
Abstract: An operating method of a storage device includes reading a wear-out pattern of a memory block when a controller determines the memory block is a re-use memory block of a non-volatile memory device; selecting an operation mode corresponding to the read wear-out pattern using the controller; and transmitting the selected operation mode to the non-volatile memory device using the controller.
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