MEMORY DEVICE INCLUDING REFERENCE VOLTAGE GENERATOR
    2.
    发明申请
    MEMORY DEVICE INCLUDING REFERENCE VOLTAGE GENERATOR 有权
    包括参考电压发生器的存储器件

    公开(公告)号:US20160042785A1

    公开(公告)日:2016-02-11

    申请号:US14793053

    申请日:2015-07-07

    CPC classification number: G11C11/419 G11C7/12 G11C11/412 G11C2207/002

    Abstract: A memory device includes a first memory cell array including memory cells of a single-ended bitline structure, a second memory cell array including memory cells of a single-ended bitline structure, a reference voltage generator configured to output a bitline voltage of a selected one of the first and second memory cell arrays as a sensing voltage according to an array select signal and output a bitline voltage of an unselected memory cell array as a reference voltage, and a differential sense amplifier configured to amplify and output a difference between the sensing voltage and the reference voltage. Logic states of the sensing voltage and the reference voltage are complementary to each other.

    Abstract translation: 存储器件包括包括单端位线结构的存储器单元的第一存储单元阵列,包括单端位线结构的存储单元的第二存储单元阵列,配置为输出所选择的位线的位线电压的参考电压发生器 的第一和第二存储单元阵列作为根据阵列选择信号的感测电压,并输出未选择的存储单元阵列的位线电压作为参考电压;以及差分读出放大器,被配置为放大和输出感测电压 和参考电压。 感测电压和参考电压的逻辑状态彼此互补。

    Memory device of a single-ended bitline structure including reference voltage generator
    6.
    发明授权
    Memory device of a single-ended bitline structure including reference voltage generator 有权
    包含参考电压发生器的单端位线结构的存储器件

    公开(公告)号:US09524772B2

    公开(公告)日:2016-12-20

    申请号:US14793053

    申请日:2015-07-07

    CPC classification number: G11C11/419 G11C7/12 G11C11/412 G11C2207/002

    Abstract: A memory device includes a first memory cell array including memory cells of a single-ended bitline structure, a second memory cell array including memory cells of a single-ended bitline structure, a reference voltage generator configured to output a bitline voltage of a selected one of the first and second memory cell arrays as a sensing voltage according to an array select signal and output a bitline voltage of an unselected memory cell array as a reference voltage, and a differential sense amplifier configured to amplify and output a difference between the sensing voltage and the reference voltage. Logic states of the sensing voltage and the reference voltage are complementary to each other.

    Abstract translation: 存储器件包括包括单端位线结构的存储器单元的第一存储单元阵列,包括单端位线结构的存储单元的第二存储单元阵列,配置为输出所选择的位线的位线电压的参考电压发生器 的第一和第二存储单元阵列作为根据阵列选择信号的感测电压,并输出未选择的存储单元阵列的位线电压作为参考电压;以及差分读出放大器,被配置为放大和输出感测电压 和参考电压。 感测电压和参考电压的逻辑状态彼此互补。

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