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公开(公告)号:US20190080943A1
公开(公告)日:2019-03-14
申请号:US15894217
申请日:2018-02-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SANG-SOO KIM , Sung-Kyu Park , Seung-Hwan Kim , Yun-Young Kim , Jun-Woo Park
IPC: H01L21/67 , G01N21/3581 , G01N21/95
Abstract: A measurement device includes an emitter configured to emit an electromagnetic signal to an object to be measured. A first detector is disposed to measure a first portion of the electromagnetic signal that is reflected by the object to be measured. A second detector is disposed to measure a second portion of the electromagnetic signal that is transmitted through the object to be measured. The emitter is configured to emit the electromagnetic signal in a direction substantially perpendicular to a surface of the object to be measured.
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公开(公告)号:US10361177B2
公开(公告)日:2019-07-23
申请号:US15960698
申请日:2018-04-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yun-Young Kim , Pyoungwan Kim , Hyunki Kim , Junwoo Park , Sangsoo Kim , Seung Hwan Kim , Sung-Kyu Park , Insup Shin
Abstract: Disclosed are a semiconductor package and a method of fabricating the same. The semiconductor package comprises a lower semiconductor chip on a lower substrate, a lower molding layer covering the lower semiconductor chip on the lower substrate and including a molding cavity that extends toward the lower semiconductor chip from a top surface of the lower molding layer, an interposer substrate on the top surface of the lower molding layer and including a substrate opening that penetrates the interposer substrate and overlaps the molding cavity, and an upper package on the interposer substrate. The molding cavity has a floor surface spaced apart from the upper package across a substantially hollow space.
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