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公开(公告)号：USRE44042E1
公开(公告)日：2013-03-05
申请号：US12277178
申请日：2008-11-24
IPC分类号： G01B11/02
CPC分类号： G01B9/02014 , G01B9/02004 , G01B9/02044 , G01B9/02069 , G01B9/02077 , G01B9/02091 , G01B2290/45 , G01B2290/70 , G01N21/4795
摘要： A system and method for imaging of a sample, e.g., biological sample, are provided. In particular, at least one source electro-magnetic radiation forwarded to the sample and a reference may be generated. A plurality of detectors may be used, at least one of the detectors capable of detecting a signal associated with a combination of at least one first electro-magnetic radiation received from the sample and at least one second electro-magnetic radiation received from the reference. At least one particular detector may have a particular electrical integration time, and can receive at least a portion of the signal for a time duration which has a first portion with a first power level greater than a predetermined threshold and a second portion immediately preceding or following the first portion. The second portion may have a second power level that is less than the predetermined threshold, and extends for a time period which may be, e.g., approximately more than 10% of the particular electrical integration time.
摘要翻译： 提供了用于成像样品例如生物样品的系统和方法。 特别地，可以产生转发到样品的至少一个源电磁辐射和参考。 可以使用多个检测器，所述检测器中的至少一个检测器能够检测与从样本接收的至少一个第一电磁辐射的组合相关联的信号和从参考接收的至少一个第二电磁辐射。 至少一个特定检测器可以具有特定的电积分时间，并且可以接收信号的至少一部分持续一段持续时间，该持续时间具有第一部分具有大于预定阈值的第一功率电平，以及紧接在之前或之后的第二部分 第一部分。 第二部分可以具有小于预定阈值的第二功率电平，并且延伸可以是例如大约超过特定电积分时间的10％的时间段。
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2.发明授权Process, system and software arrangement for a chromatic dispersion compensation using reflective layers in optical coherence tomography (OCT) imaging 有权使用光学相干断层扫描（OCT）成像中的反射层进行色散补偿的过程，系统和软件布置公开(公告)号：US08018598B2
公开(公告)日：2011-09-13
申请号：US11569790
申请日：2004-07-23
CPC分类号： A61B3/102 , G01B9/02004 , G01B9/02044 , G01B9/02069 , G01B9/02083 , G01B9/02091 , G01N21/4795
摘要： A system, process and software arrangement are provided to compensate for a dispersion in at least one portion of an image. In particular, information associated with the portion of the image is obtained. The portion of the image can be associated with an interference signal that includes a first electromagnetic radiation received from a sample and a second electromagnetic radiation received from a reference. The dispersion in the at least one portion of the image can be compensated by controlling a phase of at least one spectral component of the interference signal.
摘要翻译： 提供了系统，过程和软件布置以补偿图像的至少一部分中的色散。 特别地，获得与图像部分相关联的信息。 图像的部分可以与包括从样本接收的第一电磁辐射和从参考接收的第二电磁辐射的干扰信号相关联。 可以通过控制干扰信号的至少一个光谱分量的相位来补偿图像的至少一部分中的色散。
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3.发明授权Apparatus, method and system for performing phase-resolved optical frequency domain imaging 有权用于执行相位分辨光学频域成像的装置，方法和系统公开(公告)号：US09060689B2
公开(公告)日：2015-06-23
申请号：US11445990
申请日：2006-06-01
申请人： Guillermo J. Tearney , Brett Eugene Bouma , Johannes F. De Boer , Benjamin J. Vakoc , Seok-Hyun Yun
发明人： Guillermo J. Tearney , Brett Eugene Bouma , Johannes F. De Boer , Benjamin J. Vakoc , Seok-Hyun Yun
CPC分类号： A61B5/0073 , A61B5/0066 , A61B2560/0223 , G01B9/02091 , G01N21/45 , G01N21/4795 , G01N21/49
摘要： Apparatus, system and method are provided which utilize signals received from a reference and a sample. In particular, a radiation is provided which includes at least one first electro-magnetic radiation directed to the sample and at least one second electro-magnetic radiation directed to the reference. A frequency of the radiation varies over time. An interference can be detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. It is possible to obtain a particular signal associated with at least one phase of at least one frequency component of the interference, and compare the particular signal to at least one particular information. Further, it is possible to receive at least one portion of the radiation and provide a further radiation, such that the particular signal can be calibrated based on the further signal.
摘要翻译： 提供了使用从参考和样本接收的信号的装置，系统和方法。 特别地，提供了一种辐射，其包括指向样品的至少一个第一电磁辐射和指向该参考的至少一个第二电磁辐射。 辐射的频率随时间而变化。 可以在与第一辐射相关联的至少一个第三辐射与与第二辐射相关联的至少一个第四辐射之间检测干扰。 可以获得与干扰的至少一个频率分量的至少一个相位相关联的特定信号，并将特定信号与至少一个特定信息进行比较。 此外，可以接收辐射的至少一部分并提供另外的辐射，使得可以基于另外的信号来校准特定信号。
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4.发明授权公开(公告)号：US07742173B2
公开(公告)日：2010-06-22
申请号：US11697012
申请日：2007-04-05
IPC分类号： G01B9/02
CPC分类号： G01N21/4795 , G01B9/02002 , G01B9/02004 , G01B9/02011 , G01B9/02091 , G01B2290/70
摘要： Arrangements and methods are provided for obtaining data associated with a sample. For example, at least one first electro-magnetic radiation can be provided to a sample and at least one second electro-magnetic radiation can be provided to a reference (e.g., a non-reflective reference). A frequency of such radiation(s) can repetitively vary over time with a first characteristic period. In addition, a polarization state of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation (associated with the first radiation) or a fourth electro-magnetic radiation (associated with the second radiation) can repetitively vary over time with a second characteristic period which is shorter than the first period. The data for imaging at least one portion of the sample can be provided as a function of the polarization state. In addition or alternatively, the third and fourth electro-magnetic radiations can be combined so as to determine an axial reflectance profile of at least one portion of the sample.
摘要翻译： 提供了用于获取与样本相关的数据的安排和方法。 例如，可以向样品提供至少一个第一电磁辐射，并且可以向参考（例如，非反射参考）提供至少一个第二电磁辐射。 这种辐射的频率可以在第一特征周期内随时间重复地变化。 此外，第一电磁辐射，第二电磁辐射，第三电磁辐射（与第一辐射相关联）或第四电磁辐射（与第二辐射相关联）的极化状态可以重复地 随着时间而变化，其具有比第一周期短的第二特征周期。 用于成像至少一部分样品的数据可以作为偏振态的函数提供。 另外或替代地，可以组合第三和第四电磁辐射，以便确定样品的至少一部分的轴向反射率分布。
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5.发明申请Process, System And Software Arrangement For A Chromatic Dispersion Compensation Using Reflective Layers In Optical Coherence Tomography (OCT) Imaging 有权在光学相干断层扫描（OCT）成像中使用反射层进行色散补偿的过程，系统和软件布置公开(公告)号：US20090196477A1
公开(公告)日：2009-08-06
申请号：US11569790
申请日：2004-07-23
IPC分类号： G06K9/00
CPC分类号： A61B3/102 , G01B9/02004 , G01B9/02044 , G01B9/02069 , G01B9/02083 , G01B9/02091 , G01N21/4795
摘要： A system, process and software arrangement are provided to compensate for a dispersion in at least one portion of an image. In particular, information associated with the portion of the image is obtained. The portion of the image can be associated with an interference signal that includes a first electromagnetic radiation received from a sample and a second electromagnetic radiation received from a reference. The dispersion in the at least one portion of the image can be compensated by controlling a phase of at least one spectral component of the interference signal.
摘要翻译： 提供了系统，过程和软件布置以补偿图像的至少一部分中的色散。 特别地，获得与图像部分相关联的信息。 图像的部分可以与包括从样本接收的第一电磁辐射和从参考接收的第二电磁辐射的干扰信号相关联。 可以通过控制干扰信号的至少一个光谱分量的相位来补偿图像的至少一部分中的色散。
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6.发明申请公开(公告)号：US20070236700A1
公开(公告)日：2007-10-11
申请号：US11697012
申请日：2007-04-05
IPC分类号： G01B9/02
CPC分类号： G01N21/4795 , G01B9/02002 , G01B9/02004 , G01B9/02011 , G01B9/02091 , G01B2290/70
摘要： Arrangements and methods are provided for obtaining data associated with a sample. For example, at least one first electro-magnetic radiation can be provided to a sample and at least one second electro-magnetic radiation can be provided to a reference (e.g., a non-reflective reference). A frequency of such radiation(s) can repetitively vary over time with a first characteristic period. In addition, a polarization state of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation (associated with the first radiation) or a fourth electro-magnetic radiation (associated with the second radiation) can repetitively vary over time with a second characteristic period which is shorter than the first period. The data for imaging at least one portion of the sample can be provided as a function of the polarization state. In addition or alternatively, the third and fourth electro-magnetic radiations can be combined so as to determine an axial reflectance profile of at least one portion of the sample.
摘要翻译： 提供了用于获取与样本相关的数据的安排和方法。 例如，可以向样品提供至少一个第一电磁辐射，并且可以向参考（例如，非反射参考）提供至少一个第二电磁辐射。 这种辐射的频率可以在第一特征周期内随时间重复地变化。 此外，第一电磁辐射，第二电磁辐射，第三电磁辐射（与第一辐射相关联）或第四电磁辐射（与第二辐射相关联）的偏振状态可以重复地 随着时间而变化，其具有比第一周期短的第二特征周期。 用于成像至少一部分样品的数据可以作为偏振态的函数提供。 另外或替代地，可以组合第三和第四电磁辐射，以便确定样品的至少一部分的轴向反射率分布。
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7.发明申请PROCESS, ARRANGEMENTS AND SYSTEMS FOR PROVIDING FREQUENCY DOMAIN IMAGING OF A SAMPLE 有权用于提供样品的频域成像的过程，安排和系统公开(公告)号：US20070276269A1
公开(公告)日：2007-11-29
申请号：US11744287
申请日：2007-05-04
申请人： Seok-Hyun Yun , Johannes F. De Boer
发明人： Seok-Hyun Yun , Johannes F. De Boer
IPC分类号： A61B5/02
CPC分类号： A61B3/102 , A61B3/0025 , A61B3/1233 , A61B3/14 , A61B5/0059 , A61B5/0066 , A61B5/418 , G01N21/45 , G01N21/4795
摘要： Apparatus, arrangement and method are provided for obtaining information associated with an anatomical structure or a sample using optical microscopy. For example, a radiation can be provided which includes at least one first electromagnetic radiation directed to be provided to an anatomical sample and at least one second electro-magnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength is shorter than approximately 1150 nm. An interference can be detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. At least one image corresponding to at least one portion of the sample can be generated using data associated with the interference. In addition, at least one source arrangement can be provided which is configured to provide an electromagnetic radiation which has a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation can be shorter than 1 millisecond, and the wavelength is shorter than approximately 1150 nm.
摘要翻译： 提供了用于使用光学显微镜获得与解剖结构或样品相关联的信息的装置，布置和方法。 例如，可以提供辐射，其包括至少一个被引导到解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可随时间变化，波长比约1150nm短。 可以在与第一辐射相关联的至少一个第三辐射与与第二辐射相关联的至少一个第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的至少一部分的至少一个图像。 此外，可以提供至少一个源装置，其被配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒，并且波长比约1150nm短。
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8.发明授权Process, arrangements and systems for providing frequency domain imaging of a sample 有权用于提供样品频域成像的过程，布置和系统公开(公告)号：US09364143B2
公开(公告)日：2016-06-14
申请号：US13465580
申请日：2012-05-07
申请人： Seok-Hyun Yun , Johannes F. de Boer
发明人： Seok-Hyun Yun , Johannes F. de Boer
CPC分类号： A61B3/102 , A61B3/0025 , A61B3/1233 , A61B3/14 , A61B5/0059 , A61B5/0066 , A61B5/418 , G01N21/45 , G01N21/4795
摘要： Exemplary apparatus, arrangement and method can be provided for obtaining information associated with an anatomical structure or sample using optical microscopy. A radiation can include first electromagnetic radiation(s) directed to an anatomical sample and at least one second electromagnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength can be shorter than approximately 1150 nm. An interference can be detected between third and forth radiations associated with the first, second and fourth radiation, respectively. At least one image corresponding to portion(s) of the sample can be generated using data associated with the interference. Source arrangement(s) can be provided which is configured to provide an electromagnetic radiation having a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation(s) can be shorter than 1 millisecond, and the wavelength can be shorter than approximately 1150 nm.
摘要翻译： 可以提供示例性的装置，布置和方法，以使用光学显微镜获得与解剖结构或样品相关联的信息。 辐射可以包括指向解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可以随时间变化，并且波长可以短于约1150nm。 可以分别在与第一，第二和第四辐射相关联的第三和第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的一部分的至少一个图像。 可以提供源装置，其配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒，并且波长可以短于约1150nm。
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9.发明申请PROCESS, ARRANGEMENTS AND SYSTEMS FOR PROVIDING FREQUENCY DOMAIN IMAGING OF A SAMPLE 有权用于提供样品的频域成像的过程，安排和系统公开(公告)号：US20120316434A1
公开(公告)日：2012-12-13
申请号：US13465580
申请日：2012-05-07
申请人： Seok-Hyun Yun , Johannes F. de Boer
发明人： Seok-Hyun Yun , Johannes F. de Boer
IPC分类号： A61B6/02
CPC分类号： A61B3/102 , A61B3/0025 , A61B3/1233 , A61B3/14 , A61B5/0059 , A61B5/0066 , A61B5/418 , G01N21/45 , G01N21/4795
摘要： Exemplary apparatus, arrangement and method can be provided for obtaining information associated with an anatomical structure or sample using optical microscopy. A radiation can include first electromagnetic radiation(s) directed to an anatomical sample and at least one second electromagnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength can be shorter than approximately 1150 nm. An interference can be detected between third and forth radiations associated with the first, second and fourth radiation, respectively. At least one image corresponding to portion(s) of the sample can be generated using data associated with the interference. Source arrangement(s) can be provided which is configured to provide an electromagnetic radiation having a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation(s) can be shorter than 1 millisecond, and the wavelength can be shorter than approximately 1150 nm.
摘要翻译： 可以提供示例性的装置，布置和方法，以使用光学显微镜获得与解剖结构或样品相关联的信息。 辐射可以包括指向解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可以随时间变化，并且波长可以短于约1150nm。 可以分别在与第一，第二和第四辐射相关联的第三和第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的一部分的至少一个图像。 可以提供源装置，其配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒，并且波长可以短于约1150nm。
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10.发明授权Process, arrangements and systems for providing frequency domain imaging of a sample 有权用于提供样品频域成像的过程，布置和系统公开(公告)号：US08175685B2
公开(公告)日：2012-05-08
申请号：US11744287
申请日：2007-05-04
申请人： Seok-Hyun Yun , Johannes F. de Boer
发明人： Seok-Hyun Yun , Johannes F. de Boer
IPC分类号： A61B6/00
CPC分类号： A61B3/102 , A61B3/0025 , A61B3/1233 , A61B3/14 , A61B5/0059 , A61B5/0066 , A61B5/418 , G01N21/45 , G01N21/4795
摘要： Apparatus, arrangement and method are provided for obtaining information associated with an anatomical structure or a sample using optical microscopy. For example, a radiation can be provided which includes at least one first electromagnetic radiation directed to be provided to an anatomical sample and at least one second electro-magnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength is shorter than approximately 1150 nm. An interference can be detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. At least one image corresponding to at least one portion of the sample can be generated using data associated with the interference. In addition, at least one source arrangement can be provided which is configured to provide an electromagnetic radiation which has a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation can be shorter than 1 millisecond, and the wavelength is shorter than approximately 1150 nm.
摘要翻译： 提供了用于使用光学显微镜获得与解剖结构或样品相关联的信息的装置，布置和方法。 例如，可以提供辐射，其包括至少一个被引导到解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可随时间变化，波长比约1150nm短。 可以在与第一辐射相关联的至少一个第三辐射与与第二辐射相关联的至少一个第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的至少一部分的至少一个图像。 此外，可以提供至少一个源装置，其被配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒，并且波长比约1150nm短。
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