Semiconductor devices, transistors, and methods of manufacture thereof
    3.
    发明授权
    Semiconductor devices, transistors, and methods of manufacture thereof 有权
    半导体器件,晶体管及其制造方法

    公开(公告)号:US08883583B2

    公开(公告)日:2014-11-11

    申请号:US13533749

    申请日:2012-06-26

    Abstract: Semiconductor devices, transistors, and methods of manufacture thereof are disclosed. In one embodiment, a semiconductor device includes a gate dielectric disposed over a workpiece, a gate disposed over the gate dielectric, and a spacer disposed over sidewalls of the gate and the gate dielectric. A source region is disposed proximate the spacer on a first side of the gate, and a drain region is disposed proximate the spacer on a second side of the gate. A metal layer is disposed over the source region and the drain region. The metal layer extends beneath the spacers by about 25% or greater than a width of the spacers.

    Abstract translation: 公开了半导体器件,晶体管及其制造方法。 在一个实施例中,半导体器件包括设置在工件上方的栅极电介质,设置在栅极电介质上方的栅极和设置在栅极和栅极电介质的侧壁上的间隔物。 源极区域设置在栅极的第一侧附近的间隔物处,并且漏极区域设置在栅极的第二侧上靠近隔离物的位置。 金属层设置在源极区域和漏极区域上。 金属层在间隔物下方延伸约25%或更大于间隔物的宽度。

    CGROM testing device
    5.
    发明授权
    CGROM testing device 失效
    CGROM测试装置

    公开(公告)号:US06718495B2

    公开(公告)日:2004-04-06

    申请号:US09975942

    申请日:2001-10-15

    Applicant: Shih-Che Lin

    Inventor: Shih-Che Lin

    CPC classification number: G01R31/31813 G01R31/2891

    Abstract: A CGROM testing device including a main body, a probe module and a circuit module. In the main body are disposed an EPROM having inbuilt character pattern data of a number of predetermined characters, a first IC having functions of data comparison and data memorization and a second IC having functions of signal output and control. The probe module receives the output signals of the CGROM of a controlling IC of a PCB. An analog multiplex selection circuit of the circuit module selects data and an analog-to-digital converting circuit converts the signals into digital signals. The first IC compares the character pattern data of predetermined characters inbuilt in the EPROM with the character code driven by the CGROM and the second IC outputs the comparison result.

    Abstract translation: 一种CGROM测试装置,包括主体,探针模块和电路模块。 在主体中设置具有多个预定字符的内置字符图形数据的EPROM,具有数据比较和数据存储功能的第一IC和具有信号输出和控制功能的第二IC。 探头模块接收PCB的控制IC的CGROM的输出信号。 电路模块的模拟多路复用选择电路选择数据,模数转换电路将信号转换为数字信号。 第一IC将EPROM中构成的预定字符的字符图形数据与由CGROM驱动的字符代码进行比较,而第二IC输出比较结果。

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