Writing system and method for phase change memory
    1.
    再颁专利
    Writing system and method for phase change memory 有权
    相变存储器的写入系统和方法

    公开(公告)号:USRE45189E1

    公开(公告)日:2014-10-14

    申请号:US13571798

    申请日:2012-08-10

    IPC分类号: G11C11/00

    摘要: An embodiment of a writing system for a phase change memory based on a present application is disclosed. The writing system comprises a first phase change memory (PCM) cell, a second PCM cell, a first writing circuit and a verifying circuit. The first writing circuit executes a writing procedure, receives and writes a first data to the first PCM cell. The verifying circuit executes a verifying procedure and the circuit further comprises a processing unit and a second writing circuit. The processing unit reads and compares the data stored in the second PCM cell with a second data. The second writing circuit writes the second data to the second PCM cell when the data stored in the second PCM cell and the second data are not matched.

    摘要翻译: 公开了一种基于本申请的相变存储器的写入系统的实施例。 该写入系统包括第一相变存储器(PCM)单元,第二PCM单元,第一写入电路和验证电路。 第一写入电路执行写入过程,将第一数据接收并写入第一PCM单元。 验证电路执行验证过程,并且电路还包括处理单元和第二写入电路。 处理单元读取并比较存储在第二PCM单元中的数据与第二数据。 当存储在第二PCM单元中的数据和第二数据不匹配时,第二写入电路将第二数据写入第二PCM单元。

    Data programming circuits and memory programming methods
    2.
    发明授权
    Data programming circuits and memory programming methods 有权
    数据编程电路和存储器编程方法

    公开(公告)号:US08031515B2

    公开(公告)日:2011-10-04

    申请号:US12275223

    申请日:2008-11-21

    IPC分类号: G11C11/00

    摘要: A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.

    摘要翻译: 提供了一种用于将写入数据存储到存储单元中的数据编程电路。 数据编程电路包括控制电路和电流产生电路。 控制电路根据写入数据生成控制信号。 电流产生电路向存储单元提供写入电流以改变存储单元的结晶状态。 写入电流具有对应于写入数据的脉冲宽度,并且结晶状态对应于写入数据。

    Data Programming Circuits And Memory Programming Methods
    3.
    发明申请
    Data Programming Circuits And Memory Programming Methods 有权
    数据编程电路和存储器编程方法

    公开(公告)号:US20090135645A1

    公开(公告)日:2009-05-28

    申请号:US12275223

    申请日:2008-11-21

    IPC分类号: G11C7/00 G11C11/56

    摘要: A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.

    摘要翻译: 提供了一种用于将写入数据存储到存储单元中的数据编程电路。 数据编程电路包括控制电路和电流产生电路。 控制电路根据写入数据生成控制信号。 电流产生电路向存储单元提供写入电流以改变存储单元的结晶状态。 写入电流具有对应于写入数据的脉冲宽度,并且结晶状态对应于写入数据。

    DEVICE CONTROLLING PHASE CHANGE STORAGE ELEMENT AND METHOD THEREOF
    4.
    发明申请
    DEVICE CONTROLLING PHASE CHANGE STORAGE ELEMENT AND METHOD THEREOF 有权
    装置控制相变存储元件及其方法

    公开(公告)号:US20090080243A1

    公开(公告)日:2009-03-26

    申请号:US12142724

    申请日:2008-06-19

    IPC分类号: G11C11/00

    摘要: Devices controlling a phase change storage element and methods for increasing reliability of a phase change storage element. The invention introduces a first operation mode and a second operation mode. A reference phase change storage element is forced a write current for an ideal conduction period in the first operation mode. In the second operation mode, the invention generates a proper conduction period based on the resistance of the reference phase change storage element, and forces the write current into the controlled phase change storage element for the proper conduction period.

    摘要翻译: 控制相变存储元件的装置和增加相变存储元件的可靠性的方法。 本发明引入了第一操作模式和第二操作模式。 参考相变存储元件在第一操作模式中强制写入电流以达到理想的导通时段。 在第二操作模式中,本发明基于参考相变存储元件的电阻产生适当的导通周期,并将写入电流强制到受控相变存储元件中以达到适当的导通周期。

    Data programming circuits and memory programming methods
    5.
    发明授权
    Data programming circuits and memory programming methods 有权
    数据编程电路和存储器编程方法

    公开(公告)号:US08218361B2

    公开(公告)日:2012-07-10

    申请号:US13215491

    申请日:2011-08-23

    IPC分类号: G11C11/00

    摘要: A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.

    摘要翻译: 提供了一种用于将写入数据存储到存储单元中的数据编程电路。 数据编程电路包括控制电路和电流产生电路。 控制电路根据写入数据生成控制信号。 电流产生电路向存储单元提供写入电流以改变存储单元的结晶状态。 写入电流具有对应于写入数据的脉冲宽度,并且结晶状态对应于写入数据。

    Voltage compensation circuit, multi-level memory device with the same, and voltage compensation method for reading the multi-level memory device
    6.
    发明授权
    Voltage compensation circuit, multi-level memory device with the same, and voltage compensation method for reading the multi-level memory device 有权
    电压补偿电路,多级存储器件,以及用于读取多级存储器件的电压补偿方法

    公开(公告)号:US08040723B2

    公开(公告)日:2011-10-18

    申请号:US12650544

    申请日:2009-12-31

    IPC分类号: G11C7/00

    摘要: A voltage compensation circuit, a multi-level memory device with the same, and a voltage compensation method for reading the multi-level memory device are provided. When a memory cell is read, a reference voltage applied to the memory device is adjusted according to variation of characteristics of a drift resistance of a reference cell. The increased value of the reference voltage (i.e. a voltage difference) corresponds to a resistance variation caused by a drift condition. The drift compensation mechanism is adaptive to a compensation circuit of a read driver of the memory device, which can compensate variation of the voltage level when data is read from the memory cell. When the resistance drift occurs, a drift amount is calculated and is added to the reference voltage, in order to avoid the error in judgement caused by the resistance drift when the stored data is read out.

    摘要翻译: 提供电压补偿电路,具有该电压补偿电路的多电平存储器件以及用于读取多电平存储器件的电压补偿方法。 当读取存储单元时,根据参考单元的漂移电阻的特性的变化来调整施加到存储器件的参考电压。 参考电压的增加值(即电压差)对应于由漂移条件引起的电阻变化。 漂移补偿机构适应于存储器件的读取驱动器的补偿电路,其可以补偿当从存储器单元读取数据时电压电平的变化。 当发生电阻漂移时,计算漂移量并将其加到参考电压上,以避免当读出存储的数据时由电阻漂移引起的判断误差。

    Device controlling phase change storage element and method thereof
    7.
    发明授权
    Device controlling phase change storage element and method thereof 有权
    装置控制相变存储元件及其方法

    公开(公告)号:US07796455B2

    公开(公告)日:2010-09-14

    申请号:US12142724

    申请日:2008-06-19

    IPC分类号: G11C7/02

    摘要: Devices controlling a phase change storage element and methods for increasing reliability of a phase change storage element. The invention introduces a first operation mode and a second operation mode. A reference phase change storage element is forced a write current for an ideal conduction period in the first operation mode. In the second operation mode, the invention generates a proper conduction period based on the resistance of the reference phase change storage element, and forces the write current into the controlled phase change storage element for the proper conduction period.

    摘要翻译: 控制相变存储元件的装置和增加相变存储元件的可靠性的方法。 本发明引入了第一操作模式和第二操作模式。 参考相变存储元件在第一操作模式中强制写入电流以达到理想的导通时段。 在第二操作模式中,本发明基于参考相变存储元件的电阻产生适当的导通周期,并将写入电流强制到受控相变存储元件中以达到适当的导通周期。

    VERIFICATION CIRCUITS AND METHODS FOR PHASE CHANGE MEMORY ARRAY
    9.
    发明申请
    VERIFICATION CIRCUITS AND METHODS FOR PHASE CHANGE MEMORY ARRAY 有权
    验证电路和相位变化记忆阵列的方法

    公开(公告)号:US20100165720A1

    公开(公告)日:2010-07-01

    申请号:US12485720

    申请日:2009-06-16

    IPC分类号: G11C11/00 G11C7/06

    摘要: A verification circuit for a phase change memory array is provided. A sensing unit senses a sensing voltage from a memory cell of the phase change memory array according to an enable signal. A comparator generates a comparing signal according to the sensing voltage and a reference voltage, so as to indicate whether the memory cell is in a reset state. A control unit generates a control signal according to the enable signal. An operating unit generates a first signal according to the control signal, so as to indicate whether the comparator is active. An adjustment unit provides a writing current to the cell, and increases the writing current according to the control signal until the comparing signal indicates that the memory cell is in a reset state

    摘要翻译: 提供了一种用于相变存储器阵列的验证电路。 感测单元根据使能信号感测来自相变存储器阵列的存储单元的感测电压。 比较器根据感测电压和参考电压产生比较信号,以指示存储器单元是否处于复位状态。 控制单元根据使能信号产生控制信号。 操作单元根据控制信号生成第一信号,以指示比较器是否有效。 调整单元向单元提供写入电流,并根据控制信号增加写入电流,直到比较信号指示存储单元处于复位状态