公开(公告)号：US20180240814A1

公开(公告)日：2018-08-23

申请号：US15960842

申请日：2018-04-24

Applicant: TOSHIBA MEMORY CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KIDOH ,  Masaru KITO ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI

IPC: H01L27/11582 ,  H01L27/11573 ,  G11C16/04

CPC classification number: H01L27/11582 ,  G11C16/0483 ,  H01L27/1052 ,  H01L27/11551 ,  H01L27/11556 ,  H01L27/11573 ,  H01L27/11575 ,  H01L27/11578 ,  H01L29/513

Abstract: A non-volatile semiconductor storage device has a plurality of memory strings to each of which a plurality of electrically rewritable memory cells are connected in series. Each of the memory strings includes first semiconductor layers each having a pair of columnar portions extending in a vertical direction with respect to a substrate and a coupling portion formed to couple the lower ends of the pair of columnar portions; a charge storage layer formed to surround the side surfaces of the columnar portions; and first conductive layers formed to surround the side surfaces of the columnar portions and the charge storage layer. The first conductive layers function as gate electrodes of the memory cells.