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公开(公告)号:US12302599B2
公开(公告)日:2025-05-13
申请号:US17845036
申请日:2022-06-21
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Wei-Chiang Hung
IPC: H01L29/417 , H01L21/285 , H01L21/768 , H01L23/535 , H01L29/08 , H01L29/45 , H01L29/66 , H01L29/78 , H10D30/01 , H10D30/62 , H10D62/13 , H10D64/62
Abstract: A semiconductor device includes a fin structure, a source/drain region, a first inter-layer dielectric (ILD) layer, a first contact plug, and a second contact plug. The fin structure extends above a substrate. The source/drain region is in the fin structure. The first ILD layer is over the source/drain region. The first contact plug extends through the first ILD layer to a silicide region of the source/drain region. The second contact plug is over the first contact plug. The first contact plug has a protruding portion extending above the first ILD layer and laterally surrounding a lower part of the second contact plug.
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公开(公告)号:US10396184B2
公开(公告)日:2019-08-27
申请号:US15885036
申请日:2018-01-31
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Che-Cheng Chang , Chih-Han Lin , Wei-Chiang Hung , Wei-Hao Huang
IPC: H01L31/072 , H01L31/0328 , H01L29/66 , H01L29/78 , H01L29/165 , H01L29/417 , H01L21/762 , H01L21/02 , H01L21/306 , H01L21/324
Abstract: Examples of an integrated circuit and a method for forming the integrated circuit are provided herein. In some examples, a method includes receiving a substrate that includes: a plurality of fins extending above a remainder of the substrate; a first region that includes a first fence region that contains a first subset of the plurality of fins; and a second region that includes a second fence region that contains a second subset of the plurality of fins. The first region has a first performance characteristic, and the second region has a second performance characteristic that is different from the first. Based on the first performance characteristic, the first subset of the plurality of fins is recessed to a first height, and based on the second performance characteristic, the second subset of the plurality of fins is recessed to a second height that is less than the first height.
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公开(公告)号:US20190148520A1
公开(公告)日:2019-05-16
申请号:US15885036
申请日:2018-01-31
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Che-Cheng Chang , Chih-Han Lin , Wei-Chiang Hung , Wei-Hao Huang
IPC: H01L29/66 , H01L29/78 , H01L29/165 , H01L29/417 , H01L21/02 , H01L21/306 , H01L21/324 , H01L21/762
CPC classification number: H01L29/66795 , H01L21/02381 , H01L21/02532 , H01L21/02579 , H01L21/02667 , H01L21/30625 , H01L21/3086 , H01L21/324 , H01L21/76224 , H01L29/165 , H01L29/41791 , H01L29/4966 , H01L29/513 , H01L29/517 , H01L29/7848 , H01L29/785
Abstract: Examples of an integrated circuit and a method for forming the integrated circuit are provided herein. In some examples, a method includes receiving a substrate that includes: a plurality of fins extending above a remainder of the substrate; a first region that includes a first fence region that contains a first subset of the plurality of fins; and a second region that includes a second fence region that contains a second subset of the plurality of fins. The first region has a first performance characteristic, and the second region has a second performance characteristic that is different from the first. Based on the first performance characteristic, the first subset of the plurality of fins is recessed to a first height, and based on the second performance characteristic, the second subset of the plurality of fins is recessed to a second height that is less than the first height.
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公开(公告)号:US10998428B2
公开(公告)日:2021-05-04
申请号:US16550743
申请日:2019-08-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Che-Cheng Chang , Chih-Han Lin , Wei-Chiang Hung , Wei-Hao Huang
IPC: H01L29/66 , H01L29/78 , H01L29/165 , H01L29/417 , H01L21/762 , H01L21/02 , H01L21/306 , H01L21/324 , H01L21/308 , H01L29/51 , H01L29/49
Abstract: Examples of an integrated circuit and a method for forming the integrated circuit are provided herein. In some examples, a method includes receiving a substrate that includes: a plurality of fins extending above a remainder of the substrate; a first region that includes a first fence region that contains a first subset of the plurality of fins; and a second region that includes a second fence region that contains a second subset of the plurality of fins. The first region has a first performance characteristic, and the second region has a second performance characteristic that is different from the first. Based on the first performance characteristic, the first subset of the plurality of fins is recessed to a first height, and based on the second performance characteristic, the second subset of the plurality of fins is recessed to a second height that is less than the first height.
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公开(公告)号:US20200013881A1
公开(公告)日:2020-01-09
申请号:US16550743
申请日:2019-08-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Che-Cheng Chang , Chih-Han Lin , Wei-Chiang Hung , Wei-Hao Huang
IPC: H01L29/66 , H01L29/78 , H01L29/165 , H01L29/417 , H01L21/762 , H01L21/02 , H01L21/306 , H01L21/324
Abstract: Examples of an integrated circuit and a method for forming the integrated circuit are provided herein. In some examples, a method includes receiving a substrate that includes: a plurality of fins extending above a remainder of the substrate; a first region that includes a first fence region that contains a first subset of the plurality of fins; and a second region that includes a second fence region that contains a second subset of the plurality of fins. The first region has a first performance characteristic, and the second region has a second performance characteristic that is different from the first. Based on the first performance characteristic, the first subset of the plurality of fins is recessed to a first height, and based on the second performance characteristic, the second subset of the plurality of fins is recessed to a second height that is less than the first height.
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