公开(公告)号：US06512610B1

公开(公告)日：2003-01-28

申请号：US09261835

申请日：1999-03-03

申请人： Takao Minami ,  Nobuaki Takeuchi ,  Keiichi Shimizu ,  Koichi Shinozaki ,  Takamu Genji

发明人： Takao Minami ,  Nobuaki Takeuchi ,  Keiichi Shimizu ,  Koichi Shinozaki ,  Takamu Genji

IPC分类号： H04B1008

CPC分类号： G01M11/3136

摘要： A multi-branch optical network testing method (or device) is provided to perform a fault isolation test on an optical network that branches off at a branch point by a number of optical lines having terminal ends respectively. Herein, optical pulses are input to the optical network, from which they are returned as reflection beams. Then, response beams corresponding to mixture of the reflection beams are converted to OTDR waveform data representing a waveform whose optical power gradually decreases in accordance with a distance from an OTDR measurement device and which has a number of reflection peaks. The OTDR waveform data are subjected to logarithmic conversion to produce logarithmic waveform data representing a logarithmic waveform. An approximation method of least squares is effected on the logarithmic waveform data to produce an approximation line, which crosses the logarithmic waveform at points of intersection corresponding to Fresnel reflection points. Using the Fresnel reflection points as split points to split the OTDR waveform data into a number of ranges. Attenuation constants are repeatedly calculated with respect to each of the ranges every measurement time and are stored in a storage device. Thereafter, fault determination is automatically performed based on the attenuation constants stored in the storage device with respect to the fault occurrence time, fault occurrence line and fault occurrence distance.

摘要翻译： 提供了一种多分支光网络测试方法（或设备），用于在分支点分支多个具有终端的光线路的光网络上执行故障隔离测试。 这里，光脉冲被输入到光网络，作为反射光束返回。 然后，对应于反射光束的混合的响应光束被转换为表示根据与OTDR测量装置的距离而光功率逐渐减小的波形的OTDR波形数据，并且具有多个反射峰值。 对OTDR波形数据进行对数转换，生成表示对数波形的对数波形数据。 对对数波形数据进行最小二乘法近似法，得到近似线，该近似线与对应于菲涅尔反射点的交点处的对数波形相交。 使用菲涅尔反射点作为分割点将OTDR波形数据分割成多个范围。 衰减常数相对于每个测量时间的每个范围重复计算并存储在存储装置中。 此后，基于存储在存储装置中的故障发生时间，故障发生线和故障发生距离的衰减常数自动执行故障确定。

公开(公告)号：US06028661A

公开(公告)日：2000-02-22

申请号：US986733

申请日：1997-12-08

申请人： Takao Minami ,  Nobuaki Takeuchi ,  Naoyuki Nozaki ,  Koichi Shinozaki ,  Takamu Genji

发明人： Takao Minami ,  Nobuaki Takeuchi ,  Naoyuki Nozaki ,  Koichi Shinozaki ,  Takamu Genji

IPC分类号： G01B11/00 ,  G01M11/00 ,  G01N21/00

CPC分类号： G01M11/3136

摘要： A multi-branched optical line testing apparatus can automatically detect a faulty line in multi-branched optical lines and the distance to the fault point. An optical pulse is introduced to the branch point of optical fibers and is reflected inside the respective optical fibers. The waveform of the returning response light is analyzed by an optical time-domain reflectometer (OTDR) measuring apparatus to detect a fault in the respective optical fibers and to determine the fault point. The OTDR measuring apparatus periodically converts the response light which is returned from the respective optical fibers into a digital waveform data group, calculates the attenuation ratios of the respective optical fibers by performing separation analysis of the digital waveform data group, and determines the faulty line and the position of the fault point based on the change of the attenuation ratio of the respective optical fibers.

摘要翻译： 多分支光线路测试装置可以自动检测多分支光线路中的故障线路和故障点的距离。 将光脉冲引入到光纤的分支点，并在各光纤内反射。 通过光时域反射计（OTDR）测量装置分析返回响应光的波形，以检测各光纤中的故障并确定故障点。 OTDR测量装置将从各个光纤返回的响应光周期性地转换为数字波形数据组，通过执行数字波形数据组的分离分析来计算各个光纤的衰减比，并确定故障线 基于相应光纤的衰减比的变化的故障点的位置。

公开(公告)号：US06310702B1

公开(公告)日：2001-10-30

申请号：US09099502

申请日：1998-06-18

申请人： Takao Minami ,  Nobuaki Takeuchi ,  Naoyuki Nozaki ,  Koichi Shinozaki ,  Takamu Genji

发明人： Takao Minami ,  Nobuaki Takeuchi ,  Naoyuki Nozaki ,  Koichi Shinozaki ,  Takamu Genji

IPC分类号： H04B1008

CPC分类号： H04B10/272 ,  H04B10/071

摘要： A testing device performs testing on a multistage multi-branch optical network, which contains optical lines (such as optical fibers) that are connected together at connection points (e.g., optical couplers) in a multistage multi-branch manner. An OTDR measurement device uses software to perform fault determination with respect to the multistage multi-branch optical network. Herein, optical pulses are input to an input end of the multistage multi-branch optical network, wherein they are reflected at certain portions of the optical lines and the connection points while propagating through the optical lines. Then, reflected beams are returned to the input end and are mixed together as response light, which is measured by the OTDR measurement device. The response light is converted to a plurality of digital waveform data representing a measured waveform, which is then divided into multiple ranges on the basis of the Fresnel reflection points and connection points. Separative analysis is performed on the digital waveform data belonging to each of the ranges of the measured waveform. The separative analysis is repeated at measuring times, which are determined in advance. So, the fault determination is made by comparing results of the separative analysis, which are obtained at the measuring times respectively. By the fault determination, it is possible to determine a fault line and a fault location (or fault distance) as well as a fault time.

摘要翻译： 测试装置在多级多分支光网络上进行测试，该多网络光网络包含以多级多分支方式在连接点（例如，光耦合器）处连接在一起的光线路（例如光纤）。 OTDR测量装置使用软件对多级多分支光网络执行故障确定。 这里，光脉冲被输入到多级多分支光网络的输入端，其中它们在通过光线路传播的​​同时在光线路和连接点的某些部分被反射。 然后，反射光束返回到输入端，并作为响应光混合在一起，由OTDR测量装置测量。 将响应光转换成表示测量波形的多个数字波形数据，然后根据菲涅耳反射点和连接点将其分成多个范围。 对属于测量波形的每个范围的数字波形数据执行分离分析。 在测量时间重复分离分析，这是预先确定的。 因此，通过比较分别在测量时间分别获得的分析结果进行故障确定。 通过故障确定，可以确定故障线路和故障位置（或故障距离）以及故障时间。

公开(公告)号：US06614252B2

公开(公告)日：2003-09-02

申请号：US09911342

申请日：2001-07-23

申请人： Nobuaki Takeuchi

发明人： Nobuaki Takeuchi

IPC分类号： G01R3126

CPC分类号： G01R31/2851 ,  G01R31/2822 ,  G01R31/31721

摘要： The present invention allows reducing the power consumption, reducing the amount of heat generation, improving the frequency characteristics, and reducing noise superposition. A control circuit 25 supplies to a control circuit 5 a control signal CS 1 that indicates the setting voltage of a DUT 9 as a control signal CS 8. In addition, the control circuit 25 controls switching power sources 21 and 22 and the polarity control circuits 23 and 24 depending on control signals CS 4 to CS 7 such that the voltage drop amount of the control elements 6 and 7 becomes a value sufficient to operate the control elements 6 and 7 based on a control signal CS 1 and a detected signal DS2 that is fed back from the DUT 9. The control circuit 5 controls the control elements 6 and 7 depending on the control signal CS 8. The control elements 6 and 7 generate a voltage that is to be output to the DUT 9 from the output voltage generated by the switching power sources 21 and 22 and whose polarity is controlled by the polarity control circuits 23 and 24.

摘要翻译： 本发明能够降低功耗，减少发热量，提高频率特性，降低噪音叠加。 控制电路25向控制电路5提供指示DUT 9的设定电压作为控制信号CS8的控制信号CS1。另外，控制电路25控制开关电源21,22以及极性控制电路 根据控制信号CS4〜CS7，使得控制元件6和7的电压降量成为足以基于控制信号CS 1和检测信号DS2来操作控制元件6和7的值 从DUT 9反馈。控制电路5根据控制信号CS 8控制控制元件6和7.控制元件6和7从产生的输出电压产生要输出到DUT 9的电压 通过开关电源21和22，其极性由极性控制电路23和24控制。

公开(公告)号：US06486952B2

公开(公告)日：2002-11-26

申请号：US09864678

申请日：2001-05-24

申请人： Nobuaki Takeuchi

发明人： Nobuaki Takeuchi

IPC分类号： G01J400

CPC分类号： G01N21/21 ,  G01J4/00

摘要： In the present invention, measuring the one-dimensional or two-dimensional voltage distribution or electrical field distribution in a measured device is made possible, and a reduction in the measuring time can be implemented. The present invention comprises a first optical system (2, 3) wherein light emitted from the light source is shaped into a line-shaped light beam and irradiates a desired measurement line in the measured device via the electrooptic element, a second optical system (7, 8, 9) that maintains as-is the shape of the line-shaped light beam reflected from the desired measurement line in the measured device after transiting the electro-optic element, a light receiving device (10) that receives the line-shaped light beam emitted from the second optical system and converts each of the measured points to an electrical signal depending on the strength of each light beam reflected at each of the measured points on the desired measurement line on the measured device and outputs the result, and a signal processing device (11, 12, 13, 14, 16) that calculates the voltage or electrical field at each of the measured points of the measured device from the output signal of the light receiving device and calculates the electrical field distribution or the voltage distribution at the measured part of measured device.

摘要翻译： 在本发明中，可以测量测量装置中的一维或二维电压分布或电场分布，并且可以实现测量时间的减少。 本发明包括第一光学系统（2,3），其中从光源发射的光被成形为线状光束，并且经由电光元件在测量的装置中照射期望的测量线，第二光学系统（7 ，8,9），其在转移所述电光元件之后维持从所述测量装置中的期望测量线反射的所述线状光束的形状，接收所述线形的光接收装置（10） 从第二光学系统发射的光束，并且根据在测量装置上的期望测量线上的每个测量点反射的每个光束的强度将每个测量点转换成电信号，并输出结果， 信号处理装置（11,12,13,14,16），其从所述光接收装置的输出信号和所述测量装置计算所测量的装置的每个测量点处的电压或电场 计算被测器件测量部分的电场分布或电压分布。

公开(公告)号：US06473556B1

公开(公告)日：2002-10-29

申请号：US09510351

申请日：2000-02-22

申请人： Nobuaki Takeuchi

发明人： Nobuaki Takeuchi

IPC分类号： G02B600

CPC分类号： G01R31/31917 ,  G01R31/31926 ,  G02B6/2804

摘要： The apparatus for inspecting integrated circuits according to the present invention comprises: a test signal generating device that outputs an optical test signal; an optical distributor that distributes the optical test signal into a plurality of distributed optical signals by transmitting the optical test signal through a branching optical fiber network; and a plurality of pin cards each of which generates an electric test signal by performing phase adjustment of each distributed optical signal. The pin cards are arranged so as to apply the electrical test signals to pins of an integrated circuit to be inspected.

摘要翻译： 根据本发明的用于检查集成电路的装置包括：输出光学测试信号的测试信号产生装置; 光分配器，通过分支光纤网络发送光测试信号将光测试信号分配成多个分布式光信号; 以及多个针卡，每个针卡通过执行每个分布式光信号的相位调整来产生电测试信号。 引脚卡布置成将电测试信号施加到要检查的集成电路的引脚。

公开(公告)号：US06232765B1

公开(公告)日：2001-05-15

申请号：US09268136

申请日：1999-03-12

申请人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Jun Kikuchi ,  Nobukazu Banjo ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Junzo Yamada

发明人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Jun Kikuchi ,  Nobukazu Banjo ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Junzo Yamada

IPC分类号： G01R1900

CPC分类号： G01R13/347

摘要： An electro-optic sampling oscilloscope (or EOS oscilloscope) is designed to perform measurement such that an electro-optic sampling probe (i.e., EOS probe) is brought into contact with a measured circuit. Optical pulses are input to the EOS probe, wherein they are varied in polarization states in response to the measured circuit. Then, an electric signal output from the EOS probe is amplified to produce a receiving light signal. The receiving light signal is subjected to sampling operations using a first pulse signal to produce detection data, while it is also subjected to sampling operations using a second pulse signal to produce noise data. Herein, the first pulse signal consists of pulses which emerge in synchronization with the optical pulses respectively, while the second pulse signal delays from the first pulse signal by a prescribed delay time. Then, measurement data are produced by subtracting the noise data from the detection data. The measurement data are processed so that a measured waveform representing a measurement result is displayed on a screen of the EOS oscilloscope. Thus, it is possible to obtain the measured waveform with high precision and a good S/N ratio by eliminating low-frequency noise components from the measurement results.

摘要翻译： 电光采样示波器（或EOS示波器）被设计为执行测量，使得电光采样探针（即EOS探针）与被测电路接触。 光脉冲输入到EOS探头，响应于测量的电路，它们在极化状态下变化。 然后，从EOS探头输出的电信号被放大以产生接收光信号。 使用第一脉冲信号对接收光信号进行采样操作，以产生检测数据，同时还使用第二脉冲信号进行采样操作以产生噪声数据。 这里，第一脉冲信号由分别与光脉冲同步出现的脉冲组成，而第二脉冲信号从第一脉冲信号延迟规定的延迟时间。 然后，通过从检测数据中减去噪声数据来产生测量数据。 处理测量数据，使得表示测量结果的测量波形显示在EOS示波器的屏幕​​上。 因此，通过从测量结果中消除低频噪声分量，可以获得高精度和良好S / N比的测量波形。

公开(公告)号：US06683447B1

公开(公告)日：2004-01-27

申请号：US09167302

申请日：1998-10-06

申请人： Yoshiki Yanagisawa ,  Nobuaki Takeuchi ,  Jun Kikuchi ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Kazuyoshi Matsuhiro

发明人： Yoshiki Yanagisawa ,  Nobuaki Takeuchi ,  Jun Kikuchi ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Kazuyoshi Matsuhiro

IPC分类号： G01R1900

CPC分类号： G01R13/34

摘要： An electro-optic sampling apparatus is provided to enable measurement on potentials of signals on the conductor of coaxial cable with high precision and with ease. Herein, an electric input connector inputs a measured electric signal, which is introduced to a conductive path such as a microstrip line. An electro-optic material (e.g., Bi12SiO20) that provides electro-optic effect such as Pockel's effect is fixed to a bare portion of the conductive path and is varied in birefringence ratio in response to strength of electric field caused by the conductive path through which the measured electric signal transmits. The conductive path is then terminated by a terminal device. Now, a laser beam is radiated toward the electro-optic material, wherein it is varied in polarization in response to variations of the birefringence ratio. Then, the laser beam is reflected by a dielectric mirror and is separated into two beams by a polarization beam splitter. Photodiodes are provided to convert the two beams to electric signals representing potentials. Thus, the apparatus measures voltage of the measured electric signal based on the electric signals.

摘要翻译： 提供了一种电光采样装置，可以高精度和容易地测量同轴电缆导体上的信号电位。 这里，电输入连接器输入被测量的电信号，其被引入诸如微带线的导电路径。 提供诸如Pockel效应之类的电光效应的电光材料（例如，Bi12SiO20）被固定在导电路径的裸露部分，并且响应于由导电路径引起的电场强度而在双折射率方面发生变化 测得的电信号传输。 导电路径然后由终端设备终止。 现在，激光束朝向电光材料辐射，其中响应于双折射率的变化，它在极化方面变化。 然后，激光束被介电镜反射，并通过偏振分束器分离成两束光束。 提供光电二极管以将两个光束转换为表示电位的电信号。 因此，该装置基于电信号测量测量的电信号的电压。

公开(公告)号：US06505312B1

公开(公告)日：2003-01-07

申请号：US09510362

申请日：2000-02-22

申请人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Chitomi Terayama ,  Takayuki Sugizaki

发明人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Chitomi Terayama ,  Takayuki Sugizaki

IPC分类号： G11B2020

CPC分类号： G01R31/31922 ,  G01R31/31937

摘要： Pins of an integrated circuit are provided with timing axis signals for testing in the time axis without discrepancies. An electro-optic probe in proximity to a plurality of contact points of a device under test uses positions of equal distance or a pre-set distance as skew measurement points, and detects timing axis signals on each microstrip line, A phase detector detects the phase of the timing axis signals that the electro-optic probe detects, and a phase difference calculator finds the phase difference between the phase detected by the phase detector and a reference value. Phase control of the timing axis signals is carried out by a phase controller so as to cancel the obtained phase difference.

摘要翻译： 集成电路的引脚设有定时轴信号，用于在时间轴上进行测试，无差异。 接近被测设备的多个接触点的电光探针使用等距离或预定距离的位置作为歪斜测量点，并且检测每个微带线上的定时轴信号，A相位检测器检测相位 的电光探测器检测的定时轴信号，相位差计算器找到由相位检测器检测的相位与参考值之间的相位差。 定时轴信号的相位控制由相位控制器执行，以消除所获得的相位差。

公开(公告)号：US06288529B1

公开(公告)日：2001-09-11

申请号：US09323942

申请日：1999-06-02

申请人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Jun Kikuchi ,  Nobukazu Banjou ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Junzo Yamada

发明人： Nobuaki Takeuchi ,  Yoshiki Yanagisawa ,  Jun Kikuchi ,  Nobukazu Banjou ,  Yoshio Endou ,  Mitsuru Shinagawa ,  Tadao Nagatsuma ,  Junzo Yamada

IPC分类号： G01R2316

CPC分类号： G01R13/347 ,  G01R13/32

摘要： The present invention relates to an electro-optic sampling oscilloscope. This electro-optic sampling oscilloscope carries out measurement of measured signal by using an optical pulse generated based on a timing signal generated from a timing generation circuit synchronous with a trigger signal, providing: a timing generation circuit comprising a fast ramp circuit that outputs a ramp waveform using said trigger signal as a trigger, a slow ramp circuit that increases stepwise and sequentially the output value according to said timing signal; a comparator circuit that compares the output of said fast ramp circuit and the output of said slow ramp circuit and outputs the results of this comparison; and a gate circuit that limits the output of said comparator circuit by closing a gate only when the output of said comparator circuit is unstable based on the input trigger signal and timing signal.

摘要翻译： 本发明涉及一种电光采样示波器。该电光采样示波器通过使用基于由与触发信号同步的定时产生电路产生的定时信号产生的光脉冲来执行测量信号的测量，提供： 定时生成电路，包括使用所述触发信号作为触发输出斜坡波形的快速斜坡电路，根据所述定时信号逐步依次增加输出值的慢斜坡电路; 比较电路，比较所述快速斜坡电路的输出和所述慢斜波电路的输出，并输出该比较的结果; 以及门电路，其仅在所述比较器电路的输出基于输入触发信号和定时信号不稳定时闭合栅极来限制所述比较器电路的输出。