摘要:
A power monitoring apparatus monitors the voltage fluctuation range of an AC power supply and the duration of voltage fluctuations within the voltage fluctuation range. The power monitoring apparatus looks up a power failure rank table for determining the power failure rank of the power supply on the basis of the voltage fluctuation range and the duration obtained as the monitoring result to determine the power failure rank of the power supply. The power monitoring apparatus sends a power failure signal indicating the power failure rank to a power supply destination of an AC power supply.
摘要:
A scanning exposure apparatus includes a projection optical system which projects a pattern formed on a mask onto an object, a stage which holds an object and moves in a direction perpendicular to an optical axis of the projection optical system, a measurement system which measures a position of a surface of the object in a direction of the optical axis in response to a reset signal, and a generation system which generates the reset signal when the stage arrives at each predetermined position in the direction perpendicular to the optical axis.
摘要:
A scanning exposure apparatus includes a stage unit which supports and moves a substrate, and a control unit which starts exposing the substrate after a start of a second section in an acceleration section of the stage unit sequentially including a first section in which a jerk is positive, the second section in which a jerk is 0, and a third section in which a jerk is negative.
摘要:
A surface state inspecting device includes an illumination system for illuminating a surface to be inspected, with a beam having non-uniform sectional intensity distribution, a uniforming system for substantially uniforming the sectional intensity distribution of the beam, and an inspecting portion for detecting scattered light from the surface to determine the state of the surface.
摘要:
A scanning exposure apparatus includes a stage unit which supports and moves a substrate, and a control unit which starts exposing the substrate after a start of a second section in an acceleration section of the stage unit sequentially including a first section in which a jerk is positive, the second section in which a jerk is 0, and a third section in which a jerk is negative.
摘要:
A scanning exposure apparatus includes a projection optical system which projects a pattern formed on a mask onto an object, a stage which holds an object and moves in a direction perpendicular to an optical axis of the projection optical system, a measurement system which measures a position of a surface of the object in a direction of the optical axis in response to a reset signal, and a generation system which generates the reset signal when the stage arrives at each predetermined position in the direction perpendicular to the optical axis.
摘要:
A scanning exposure apparatus includes a stage unit which supports and moves a substrate, and a control unit which starts exposing the substrate after a start of a second section in an acceleration section of the stage unit sequentially including a first section in which a jerk is positive, the second section in which a jerk is 0, and a third section in which a jerk is negative.
摘要:
A method of aligning a substrate includes the steps of detecting misalignment of the substrate using an image signal from a charge coupled device (CCD) camera which receives light reflected by an alignment mark on the substrate illuminated by pulse light, and moving the substrate in accordance with the detected misalignment. If the amount of light received by the camera during a predetermined time period does not reach a predetermined value, the predetermined time period is increased. If the amount of light exceeds the predetermined value, the amount of light emitted by the source of the pulse light for each pulse is reduced. An aligning apparatus for carrying out the method includes a light source for generating pulse light for illuminating an alignment mark on a substrate, a camera for receiving light reflected by the alignment mark to generate an image signal, a signal processing circuit for detecting misalignment of the substrate based on the image signal, a driver for moving the substrate in accordance with the output from the signal processing circuit, a detector for monitoring the amount of light received by the camera, and a light modulating mechanism for adjusting the amount of light emitted by the light source in accordance with the output from the light amount detector.
摘要:
An exposure apparatus includes a stage which moves with an object thereon. A surface position detector is arranged to detect a surface position of the object at a timing that is asynchronous to a reference signal, and is provided for controlling the stage.
摘要:
An illumination device for scanning exposure apparatus for carrying out exposure even when a movable stage is being accelerated and decelerated. The apparatus includes an illumination-distribution varying device for temporarily varying the illumination distribution of an illumination unit that is performing the exposure, wherein the illumination-distribution varying device has a function for varying the temporary change of the illumination distribution in conformity with a pattern for driving the movable stage.