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公开(公告)号:US20100131914A1
公开(公告)日:2010-05-27
申请号:US12324858
申请日:2008-11-27
申请人: Te-Hung Wu , Sheng-Yuan Huang , Cheng-Te Wang , Chia-Wei Huang , Ping-I Hsieh , Po-I Lee , Chuen Huei Yang , Pei-Ru Tsai
发明人: Te-Hung Wu , Sheng-Yuan Huang , Cheng-Te Wang , Chia-Wei Huang , Ping-I Hsieh , Po-I Lee , Chuen Huei Yang , Pei-Ru Tsai
IPC分类号: G06F17/50
CPC分类号: G03F1/36
摘要: A method to determine a process window is disclosed. First, a pattern data is provided. Second, a bias set is determined. Then, a resizing procedure is performed on the pattern data in accordance with the bias set to obtain a usable final resized pattern to be a target pattern of changed area. The final resized pattern is consistent with a minimum spacing rule, a contact to poly rule and a contact to metal rule. Accordingly, the target pattern is output.
摘要翻译: 公开了一种确定处理窗口的方法。 首先,提供图案数据。 其次,确定偏差集。 然后,根据偏置设置对图案数据执行调整大小程序,以获得可用的最终调整尺寸图案作为改变区域的目标图案。 最终调整大小的模式与最小间距规则,与多边规则的联系以及与金属规则的联系是一致的。 因此,输出目标图案。
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公开(公告)号:US08225237B2
公开(公告)日:2012-07-17
申请号:US12324858
申请日:2008-11-27
申请人: Te-Hung Wu , Sheng-Yuan Huang , Cheng-Te Wang , Chia-Wei Huang , Ping-I Hsieh , Po-I Lee , Chuen Huei Yang , Pei-Ru Tsai
发明人: Te-Hung Wu , Sheng-Yuan Huang , Cheng-Te Wang , Chia-Wei Huang , Ping-I Hsieh , Po-I Lee , Chuen Huei Yang , Pei-Ru Tsai
IPC分类号: G06F17/50
CPC分类号: G03F1/36
摘要: A method to determine a process window is disclosed. First, a pattern data is provided. Second, a bias set is determined. Then, a resizing procedure is performed on the pattern data in accordance with the bias set to obtain a usable final resized pattern to be a target pattern of changed area. The final resized pattern is consistent with a minimum spacing rule, a contact to poly rule and a contact to metal rule. Accordingly, the target pattern is output.
摘要翻译: 公开了一种确定处理窗口的方法。 首先,提供图案数据。 其次,确定偏差集。 然后,根据偏置设置对图案数据执行调整大小程序,以获得可用的最终调整尺寸图案作为改变区域的目标图案。 最终调整大小的模式与最小间距规则,与多边规则的联系以及与金属规则的联系是一致的。 因此,输出目标图案。
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公开(公告)号:US07913196B2
公开(公告)日:2011-03-22
申请号:US11752310
申请日:2007-05-23
申请人: Te-Hung Wu , Chia-Wei Huang , Chuen Huei Yang , Sheng-Yuan Huang , Pei-Ru Tsai , Chih-Hao Wu
发明人: Te-Hung Wu , Chia-Wei Huang , Chuen Huei Yang , Sheng-Yuan Huang , Pei-Ru Tsai , Chih-Hao Wu
IPC分类号: G06F17/50
CPC分类号: G06F17/5081
摘要: A method of verifying a layout pattern comprises separately steps of obtaining a simulated pattern at a lower portion of a film by using a layout pattern as a mask to transfer the layout pattern to the film, and obtaining a simulated pattern at an upper portion of the film by using the layout pattern as a mask to transfer the layout pattern to the film. The layout pattern is verified according to the upper and lower simulated patterns.
摘要翻译: 验证布局图案的方法包括单独的步骤,通过使用布局图案作为掩模,在胶片的下部获得模拟图案,以将布局图案转印到胶片上,以及在胶片的上部获得模拟图案 通过使用布局图案作为掩模将电影布局布局转移到电影中。 根据上下模拟图案验证布局图案。
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公开(公告)号:US07669153B2
公开(公告)日:2010-02-23
申请号:US11742372
申请日:2007-04-30
申请人: Te-Hung Wu , Chuen-Huei Yang , Sheng-Yuan Huang , Chia-Wei Huang , Pei-Ru Tsai
发明人: Te-Hung Wu , Chuen-Huei Yang , Sheng-Yuan Huang , Chia-Wei Huang , Pei-Ru Tsai
IPC分类号: G06F17/50
CPC分类号: G03F1/36
摘要: A method for correcting a photomask pattern is provided. The correcting method performs a verification of a focus-exposure matrix (FEM) and an overlay variation on a layout area having contact holes or vias in a layout pattern so as to generate a hint information. The layout pattern of the photomask is corrected according to the hint information to prevent the contact holes or vias from being exposed in arrangement to corresponding metal layer, poly layer, or diffusion layer.
摘要翻译: 提供了一种用于校正光掩模图案的方法。 校正方法在布局图案中对具有接触孔或通孔的布局区域执行聚焦曝光矩阵(FEM)和覆盖变化的验证,以产生提示信息。 根据提示信息校正光掩模的布局图案,以防止接触孔或通孔暴露于相应的金属层,多晶硅层或扩散层。
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公开(公告)号:US20080270969A1
公开(公告)日:2008-10-30
申请号:US11742372
申请日:2007-04-30
申请人: Te-Hung Wu , Chuen-Huei Yang , Sheng-Yuan Huang , Chia-Wei Huang , Pei-Ru Tsai
发明人: Te-Hung Wu , Chuen-Huei Yang , Sheng-Yuan Huang , Chia-Wei Huang , Pei-Ru Tsai
IPC分类号: G06F17/50
CPC分类号: G03F1/36
摘要: A method for correcting a photomask pattern is provided. The correcting method performs a verification of a focus-exposure matrix (FEM) and an overlay variation on a layout area having contact holes or vias in a layout pattern so as to generate a hint information. The layout pattern of the photomask is corrected according to the hint information to prevent the contact holes or vias from being exposed in arrangement to corresponding metal layer, poly layer, or diffusion layer.
摘要翻译: 提供了一种用于校正光掩模图案的方法。 校正方法在布局图案中对具有接触孔或通孔的布局区域执行聚焦曝光矩阵(FEM)和覆盖变化的验证,以产生提示信息。 根据提示信息校正光掩模的布局图案,以防止接触孔或通孔暴露于相应的金属层,多晶硅层或扩散层。
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公开(公告)号:US20080295062A1
公开(公告)日:2008-11-27
申请号:US11752310
申请日:2007-05-23
申请人: Te-Hung Wu , Chia-Wei Huang , Chuen Huei Yang , Sheng-Yuan Huang , Pei-Ru Tsai , Chih-Hao Wu
发明人: Te-Hung Wu , Chia-Wei Huang , Chuen Huei Yang , Sheng-Yuan Huang , Pei-Ru Tsai , Chih-Hao Wu
IPC分类号: G06F17/50
CPC分类号: G06F17/5081
摘要: A method of verifying a layout pattern comprises separately steps of obtaining a simulated pattern at a lower portion of a film by using a layout pattern as a mask to transfer the layout pattern to the film, and obtaining a simulated pattern at an upper portion of the film by using the layout pattern as a mask to transfer the layout pattern to the film. The layout pattern is verified according to the upper and lower simulated patterns.
摘要翻译: 验证布局图案的方法包括单独的步骤,通过使用布局图案作为掩模,在胶片的下部获得模拟图案,以将布局图案转印到胶片上,以及在胶片的上部获得模拟图案 通过使用布局图案作为掩模将电影布局布局转移到电影中。 根据上下模拟图案验证布局图案。
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公开(公告)号:USD683316S1
公开(公告)日:2013-05-28
申请号:US29400989
申请日:2011-09-06
申请人: Sheng-Yuan Huang
设计人: Sheng-Yuan Huang
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公开(公告)号:US07887375B1
公开(公告)日:2011-02-15
申请号:US12710604
申请日:2010-02-23
申请人: Sheng-Yuan Huang
发明人: Sheng-Yuan Huang
IPC分类号: H01R13/44
CPC分类号: H01R24/58 , H01R12/716 , H01R13/2442 , H01R2107/00
摘要: An audio jack adapted for receiving a mating audio plug includes an insulating housing and a contact. The insulating housing has an insertion hole for receiving the mating audio plug. A recess is formed at a front of a bottom surface of the insulating housing and communicated with the insertion hole. The contact is received in the recess and includes a base portion, a soldered portion and a resistance piece. The soldered portion bends and extends outward from a bottom edge of the base portion. The resistance piece includes an elastic arm extending forward from a front edge of the base portion, and an arc-shaped portion extending downwards from a distal end of the elastic arm and arched according to an outer periphery of the mating audio plug. A distal end of the arc-shaped portion defined as a contact portion.
摘要翻译: 适于接收配合音频插头的音频插座包括绝缘外壳和触点。 绝缘壳体具有用于接收配合音频插头的插入孔。 在绝缘壳体的底面的前方形成有与插入孔连通的凹部。 接触件容纳在凹部中,并且包括基部,焊接部和电阻片。 焊接部分从基部的底部边缘向外弯曲并向外延伸。 电阻件包括从基部的前边缘向前延伸的弹性臂,以及从弹性臂的远端向下延伸的弧形部分,并且根据配合的音频插头的外周拱起。 弧形部分的远端限定为接触部分。
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公开(公告)号:US20100130034A1
公开(公告)日:2010-05-27
申请号:US12292775
申请日:2008-11-26
申请人: Sheng-Yuan Huang , Yung-Chi Peng , Sheng-Nan Yu
发明人: Sheng-Yuan Huang , Yung-Chi Peng , Sheng-Nan Yu
IPC分类号: H01R12/00
CPC分类号: H01R13/2442 , H01R12/88 , H01R13/506
摘要: A flexible printed circuit board connector adapted for receiving a flexible printed circuit board has an insulating housing including two blocking walls, each defines a lateral side having a buckling cavity at a front thereof and a first and second locating cavities at a rear thereof. The buckling cavity includes a first buckling cavity and a second buckling cavity extending frontward from the first buckling cavity. The second locating cavity is located in front of and spaced from the first locating cavity. A cover defines two lateral plates respectively secured to the lateral sides, each has a locating portion and a buckling portion respectively protruded inwards from an inner side thereof. The locating portion is capable of being pivotally mounted in the first locating cavity, and then the locating portion and the buckling portion can be moved frontward to the second locating cavity and the second buckling cavity, respectively.
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公开(公告)号:USD616375S1
公开(公告)日:2010-05-25
申请号:US29346410
申请日:2009-10-30
申请人: Sheng-Yuan Huang
设计人: Sheng-Yuan Huang
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