公开(公告)号：US20240044968A1

公开(公告)日：2024-02-08

申请号：US18361672

申请日：2023-07-28

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R. Hegde ,  Krishna N H Sri ,  Abhishek Naik ,  Shubha B ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/26 ,  G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2603 ,  G01R31/2889 ,  G01R1/06788

Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.