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公开(公告)号:US10475514B2
公开(公告)日:2019-11-12
申请号:US15976315
申请日:2018-05-10
发明人: Xueqing Li , Sumitha George , John Sampson , Sumeet Gupta , Suman Datta , Vijaykrishnan Narayanan , Kaisheng Ma
摘要: Embodiments include nonvolatile a memory (NVM) device that can be configured for logic switching and/or digital computing. For example, embodiments of the NVM device can be configured as any one or combination of a memory cell, a D flip flop (DFF), a Backup and Restore circuit (B&R circuit), and/or a latch for a DFF. Any of the NVM devices can have a Fe field effect transistors (FeFET) configured to exploit the IDS-VG hysteresis of the steep switch at low voltage for logic memory synergy. The FeFET-based devices can be configured to include a wide hysteresis, a steep hysteresis edge, and high ratio between the two IDS states at VG=0.
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公开(公告)号:US20180330791A1
公开(公告)日:2018-11-15
申请号:US15976315
申请日:2018-05-10
发明人: Xueqing Li , Sumitha George , John Sampson , Sumeet Gupta , Suman Datta , Vijaykrishnan Narayanan , Kaisheng Ma
CPC分类号: G11C14/0072 , G11C11/1675 , G11C11/1693 , G11C11/223 , G11C11/2275 , G11C11/2293 , G11C13/0002 , G11C13/0007 , G11C13/0061 , G11C13/0069 , G11C14/0054 , G11C14/0081 , G11C14/009 , H01L29/78391
摘要: Embodiments include nonvolatile a memory (NVM) device that can be configured for logic switching and/or digital computing. For example, embodiments of the NVM device can be configured as any one or combination of a memory cell, a D flip flop (DFF), a Backup and Restore circuit (B&R circuit), and/or a latch for a DFF. Any of the NVM devices can have a Fe field effect transistors (FeFET) configured to exploit the IDS−VG hysteresis of the steep switch at low voltage for logic memory synergy. The FeFET-based devices can be configured to include a wide hysteresis, a steep hysteresis edge, and high ratio between the two IDS states at VG=0.
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公开(公告)号:US10672475B2
公开(公告)日:2020-06-02
申请号:US16580256
申请日:2019-09-24
发明人: Xueqing Li , Sumitha George , John Sampson , Sumeet Gupta , Suman Datta , Vijaykrishnan Narayanan , Kaisheng Ma
摘要: Embodiments include nonvolatile a memory (NVM) device that can be configured for logic switching and/or digital computing. For example, embodiments of the NVM device can be configured as any one or combination of a memory cell, a D flip flop (DFF), a Backup and Restore circuit (B&R circuit), and/or a latch for a DFF. Any of the NVM devices can have a Fe field effect transistors (FeFET) configured to exploit the IDS−VG hysteresis of the steep switch at low voltage for logic memory synergy. The FeFET-based devices can be configured to include a wide hysteresis, a steep hysteresis edge, and high ratio between the two IDS states at VG=0.
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公开(公告)号:US20200027508A1
公开(公告)日:2020-01-23
申请号:US16580256
申请日:2019-09-24
发明人: Xueqing Li , Sumitha George , John Sampson , Sumeet Gupta , Suman Datta , Vijaykrishnan Narayanan , Kaisheng Ma
摘要: Embodiments include nonvolatile a memory (NVM) device that can be configured for logic switching and/or digital computing. For example, embodiments of the NVM device can be configured as any one or combination of a memory cell, a D flip flop (DFF), a Backup and Restore circuit (B&R circuit), and/or a latch for a DFF. Any of the NVM devices can have a Fe field effect transistors (FeFET) configured to exploit the IDS−VG hysteresis of the steep switch at low voltage for logic memory synergy. The FeFET-based devices can be configured to include a wide hysteresis, a steep hysteresis edge, and high ratio between the two IDS states at VG=0.
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