摘要:
Disclosed are embodiments of a design and manufacturing system and an associated method that allow for design analysis and for insertion, during wafer manufacture, of intra-process monitoring circuitry. These embodiments use a library of pre-qualified intra-process monitoring circuits and a cross-correlation table that links different monitoring circuits with different IC chip components. Specifically, these embodiments analyze integrated circuit chip design data to identify the components designed into the chip. Then, one or more intra-process monitoring circuits are selected from the library and the design data is modified to include the selected monitoring circuit(s).
摘要:
Disclosed are embodiments of a system and a method that allow for wireless and dynamic intra-process (i.e., during and/or between process steps) measurements of integrated circuit parameters. The embodiments incorporate the use of a passive circuit, such as an inductor-capacitor-resistor (LCR) circuit resonator, that has a predetermined sensitivity to process variations in one or more physical or electrical integrated circuit parameters. The passive circuit can be wirelessly interrogated between and/or process steps. Then, the actual behavior exhibited by the passive circuit in response to the interrogation is compared to the expected behavior of an optimal circuit in the absence of process variations in order to determine the one or more parameters. Also disclosed is an embodiment of an exemplary passive circuit that can be used to implement the disclosed system and method embodiments.
摘要:
Disclosed are embodiments of a design and manufacturing system and an associated method that allow for design analysis and for insertion, during wafer manufacture, of intra-process monitoring circuitry. These embodiments use a library of pre-qualified intra-process monitoring circuits and a cross-correlation table that links different monitoring circuits with different IC chip components. Specifically, these embodiments analyze integrated circuit chip design data to identify the components designed into the chip. Then, one or more intra-process monitoring circuits are selected from the library and the design data is modified to include the selected monitoring circuit(s).
摘要:
Disclosed are embodiments of an integrated circuit chip designed for reliability at low ambient temperatures. The chip substrate can be divided into zones, including at least one temperature-sensitive zone (TSZ) that contains one or more temperature-sensitive circuits. Temperature sensor(s) can be positioned in the semiconductor substrate adjacent to the TSZ. Thermal radiator(s) can be embedded in a metal wiring layer and aligned above the TSZ. The temperature sensor(s) can be operatively connected to the thermal radiator(s) and can trigger operation of the thermal radiator(s) when the temperature in the TSZ is below a predetermined threshold temperature. Additionally, an on-chip power control system can be operatively connected to the thermal radiator(s) so that operation of the thermal radiator(s) is only triggered when a circuit within the TSZ is about to be powered up. Also disclosed are associated embodiments of a system and method for designing such an integrated circuit chip.
摘要:
A solution for retaining a logic state of a processor pipeline architecture are disclosed. A comparator is positioned between two stages of the processor pipeline architecture. A storage capacitor is coupled between a storage node of the comparator and a ground to store an output of the early one of the two stages. A reference logic is provided, which has the same value as the output of the early stage. A logic storing and dividing device is coupled between the reference logic and a reference node of the comparator to generate a logic at the reference node, which is a fraction of the reference logic, and to retain a logic state of the information stored on the storage capacitor. Further mechanisms are provided to determine validity of data stored in the logic storing and dividing device.
摘要:
A design structure for a system and method of predicting power events in intermittent power environments and dispatching computational operations of an integrated circuit accordingly. A power management prediction system includes a controller executing a prediction algorithm, an arrangement of computation circuitry, a non-volatile storage device containing a power requirements log and a power history log, a clock generator, an intermittent power source, and a power monitor circuit. A method of predicting intermittent power events and dispatching computational operations includes: storing power requirements of each computational operation, monitoring the intermittent power source to generate a history log, predicting a subsequent power event based on the history log, retrieving actual power requirements of one or more computational operations, comparing the predicted power event with actual power requirements, determining whether actual power requirements are satisfied, dispatching one or more computational operations that correspond to one or more actual power events, or performing an error recovery operation.
摘要:
A system is provided for securing information residing on a circuit (e.g., processor). In particular, a system and method is provided for masking electromagnetic interference (EMI) emissions emitting from a circuit using a random noise generator in combination with a low noise amplifier and antenna. The random number generator matches a frequency of a circuit to be protected, and generates a random signal to be superimposed on data. The low noise amplifier receives the random signal from the random number generator, and an antenna receives the random signal from the low noise amplifier and transmits the random signal to mask the data of the circuit to be protected.
摘要:
A design structure embodied in a machine readable medium used in a design process includes an apparatus for dynamically selecting compiled instructions for execution, the apparatus including an input for receiving static instructions for execution on a first execution unit and receiving dynamic instructions for execution on a second execution unit; and an instruction selection element adapted to evaluate throughput performance of the static instructions and dynamic instructions based on current states of the execution units and select the static instructions or the dynamic instructions for execution at runtime on the first execution unit or the second execution unit, respectively, based on the throughput performance of the instructions.
摘要:
An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: a data retaining device; a partially depleted silicon-on-insulator (PD SOI) device electrically coupled to the data retaining device; and a measurement device coupled to the PD SOI device for measuring a state of the PD SOI device indicating a body voltage thereof, the measuring device being communicatively coupled to a calculating means which determines a history state of a data in the data retaining device based on the measured state of the PD SOI device.
摘要:
Analog supply for an analog circuit and process for supplying an analog signal to an analog circuit. The analog supply includes a noise filter having a variable resistor, and a control device coupled to adjust the variable resistor. The control device is structured and arranged to set the resistance of the variable resistor to maximize noise filtering and optimize performance of the analog circuit.