MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
    2.
    发明申请
    MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE 有权
    半导体器件和半导体器件的制造方法

    公开(公告)号:US20120273964A1

    公开(公告)日:2012-11-01

    申请号:US13427200

    申请日:2012-03-22

    摘要: A manufacturing method of a semiconductor device includes: forming an insulating layer above a substrate; forming a recessed section in the insulating layer; forming, on the insulating layer, a mask pattern having a first opening which exposes the recessed section, and a second opening which is arranged outside the first opening and does not expose the recessed section; forming a first conductive member and a second conductive member by respectively depositing a conductive material in the first opening and the second opening; and polishing and removing the first conductive member and the second conductive member on the upper side of the insulating layer so as to leave the first conductive member in the recessed section.

    摘要翻译: 半导体器件的制造方法包括:在衬底上形成绝缘层; 在所述绝缘层中形成凹部; 在所述绝缘层上形成具有露出所述凹部的第一开口的掩模图案,以及布置在所述第一开口的外侧并且不露出所述凹部的第二开口; 通过在所述第一开口和所述第二开口中分别沉积导电材料来形成第一导电构件和第二导电构件; 并且在绝缘层的上侧抛光和去除第一导电构件和第二导电构件,以便将第一导电构件留在凹部中。