Method of base formation in a BiCMOS process
    4.
    发明授权
    Method of base formation in a BiCMOS process 有权
    BiCMOS工艺中碱形成的方法

    公开(公告)号:US07625792B2

    公开(公告)日:2009-12-01

    申请号:US10599938

    申请日:2005-04-06

    IPC分类号: H01L21/8238

    摘要: Disclosed is a bipolar complementary metal oxide semiconductor (BiCMOS) or NPN/PNP device that has a collector, an intrinsic base above the collector, shallow trench isolation regions adjacent the collector, a raised extrinsic base above the intrinsic base, a T-shaped emitter above the extrinsic base, spacers adjacent the emitter, and a silicide layer that is separated from the emitter by the spacers.

    摘要翻译: 公开了一种双极互补金属氧化物半导体(BiCMOS)或NPN / PNP器件,其具有集电极,集电极之上的本征基极,与集电极相邻的浅沟槽隔离区,在本征基极之上的凸起的外部基极,T形发射极 在外部基极之上,邻近发射极的间隔物和通过间隔物与发射极分离的硅化物层。

    BICMOS DEVICES WITH A SELF-ALIGNED EMITTER AND METHODS OF FABRICATING SUCH BICMOS DEVICES
    7.
    发明申请
    BICMOS DEVICES WITH A SELF-ALIGNED EMITTER AND METHODS OF FABRICATING SUCH BICMOS DEVICES 有权
    具有自对准发射器的BICMOS器件和制造这种BICMOS器件的方法

    公开(公告)号:US20090020851A1

    公开(公告)日:2009-01-22

    申请号:US11614757

    申请日:2006-12-21

    IPC分类号: H01L21/331 H01L29/73

    摘要: A method of fabricating an heterojunction bipolar transistor (HBT) structure in a bipolar complementary metal-oxide-semiconductor (BiCMOS) process selectively thickens an oxide layer overlying a base region in areas that are not covered by a temporary emitter and spacers such that the temporary emitter can be removed and the base-emitter junction can be exposed without also completely removing the oxide overlying the areas of the base region that are not covered by the temporary emitter or spacers. As a result, a photomask is not required to remove the temporary emitter and to expose the base-emitter junction.

    摘要翻译: 在双极互补金属氧化物半导体(BiCMOS)工艺中制造异质结双极晶体管(HBT)结构的方法在未被临时发射极和间隔物覆盖的区域中的基极区域上选择性地增厚氧化物层,使得临时 可以去除发射极,并且可以暴露基极 - 发射极结,而不会完全去除覆盖在未被临时发射极或间隔物覆盖的基极区域的区域上的氧化物。 结果,不需要光掩模去除临时发射体并露出基极 - 发射极结。

    Bipolar transistor structure with self-aligned raised extrinsic base and methods
    8.
    发明授权
    Bipolar transistor structure with self-aligned raised extrinsic base and methods 有权
    双极晶体管结构具有自对准引出的外在基极和方法

    公开(公告)号:US07037798B2

    公开(公告)日:2006-05-02

    申请号:US10904482

    申请日:2004-11-12

    IPC分类号: H01L21/331

    摘要: The invention includes methods of fabricating a bipolar transistor that adds a silicon germanium (SiGe) layer or a third insulator layer of, e.g., high pressure oxide (HIPOX), atop an emitter cap adjacent the intrinsic base prior to forming a link-up layer. This addition allows for removal of the link-up layer using wet etch chemistries to remove the excess SiGe or third insulator layer formed atop the emitter cap without using oxidation. In this case, an oxide section (formed by deposition of an oxide or segregation of the above-mentioned HIPOX layer) and nitride spacer can be used to form the emitter-base isolation. The invention results in lower thermal cycle, lower stress levels, and more control over the emitter cap layer thickness, which are drawbacks of the first embodiment. The invention also includes the resulting bipolar transistor structure.

    摘要翻译: 本发明包括制造双极晶体管的方法,该双极晶体管在形成连接层之前,将硅锗(SiGe)层或例如高压氧化物(HIPOX)的第三绝缘体层与邻近本征基极的发射极帽顶上相加 。 该添加允许使用湿蚀刻化学去除连接层,以去除在不使用氧化的情况下形成在发射极帽顶上的多余SiGe或第三绝缘体层。 在这种情况下,可以使用氧化物部分(通过沉积氧化物或上述HIPOX层的分离)和氮化物间隔物形成发射极 - 基极隔离。 本发明导致较低的热循环,较低的应力水平和对发射极盖层厚度的更多控制,这是第一实施例的缺点。 本发明还包括所得到的双极晶体管结构。