Layout method for miniaturized memory array area
    1.
    发明授权
    Layout method for miniaturized memory array area 失效
    微型化存储器阵列区域的布局方法

    公开(公告)号:US07418685B2

    公开(公告)日:2008-08-26

    申请号:US10875572

    申请日:2004-06-25

    IPC分类号: G06F9/455 G06F17/50

    摘要: Bit lines and a pair of two tungsten wires having the same widths are formed at a portion where a through-hole is to be formed such that the bit lines and the tungsten wires are arranged at regular intervals. A through-hole for connection to another wiring layer is formed between the tungsten wires. A connection wiring made of tungsten is formed over the through-hole so as to have a predetermined margin around the through-hole. In a photolithography process, a slit having a small width enough to be insensitive to a photo-resist is formed so as to span the through-hole.

    摘要翻译: 在要形成通孔的部分处形成具有相同宽度的位线和一对两根钨丝,使得位线和钨丝以规则的间隔布置。 在钨丝之间形成用于连接到另一布线层的通孔。 在通孔上形成由钨构成的连接布线,以便在通孔周围具有预定的边缘。 在光刻工艺中,形成具有足以对光致抗蚀剂不敏感的小宽度的狭缝,以跨过通孔。

    Transmission level control method and transceiver apparatus in wireless local loop system
    3.
    发明授权
    Transmission level control method and transceiver apparatus in wireless local loop system 有权
    无线本地环路系统中的传输级控制方法和收发器设备

    公开(公告)号:US07986957B2

    公开(公告)日:2011-07-26

    申请号:US11584898

    申请日:2006-10-23

    IPC分类号: H04W72/00

    摘要: A transmission level control method in a wireless local loop system capable of suppressing occurrence of an unnecessarily high transmission level, comprises a step of generating a required reception level corresponding to a classification of data, a step of detecting the reception level of data at a receiver side transceiver apparatus, a step of finding a level difference between the detected reception level and the required reception level corresponding to the classification of the related received data, and a step of controlling a change of the transmission level at a transmitter side transceiver apparatus according to this level difference.

    摘要翻译: 能够抑制不必要的高发送电平的发生的无线本地环路系统中的发送电平控制方法包括:生成与数据分类对应的所需接收电平的步骤,检测接收端的数据的接收电平的步骤 根据相关接收数据的分类,找出检测到的接收电平与所需接收电平之间的电平差的步骤,以及控制发送机侧收发信机装置的发送电平变化的步骤 这个水平差。

    INFORMATION PROCESSING DEVICE, DISPLAY METHOD AND PROGRAM
    4.
    发明申请
    INFORMATION PROCESSING DEVICE, DISPLAY METHOD AND PROGRAM 有权
    信息处理设备,显示方法和程序

    公开(公告)号:US20110063236A1

    公开(公告)日:2011-03-17

    申请号:US12852124

    申请日:2010-08-06

    IPC分类号: G06F3/041

    摘要: There is provided an information processing device that includes: a display portion that displays a plurality of function buttons that respectively correspond to a plurality of functions included in the information processing device; a position detection portion that detects a position where an operating body touches or approaches a display screen of the display portion; a button selection portion that selects, from among the plurality of function buttons, at least one function button that corresponds to an operation state of the information processing device; and a display control portion that causes the function button selected by the button selection portion to move on the display screen such that the function button approaches the position on the display screen detected by the position detection portion.

    摘要翻译: 提供了一种信息处理设备,包括:显示部分,显示分别对应于包括在信息处理设备中的多个功能的多个功能按钮; 位置检测部,其检测操作体触摸或接近所述显示部的显示画面的位置; 按钮选择部,其从所述多个功能按钮中选择与所述信息处理装置的操作状态对应的至少一个功能按钮; 以及显示控制部分,其使由按钮选择部分选择的功能按钮在显示屏幕上移动,使得功能按钮接近由位置检测部分检测到的显示屏幕上的位置。

    Pattern Inspection Method and Pattern Inspection System
    5.
    发明申请
    Pattern Inspection Method and Pattern Inspection System 有权
    模式检验方法和模式检验系统

    公开(公告)号:US20100310180A1

    公开(公告)日:2010-12-09

    申请号:US12858209

    申请日:2010-08-17

    IPC分类号: G06K9/46

    摘要: A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern. From two or more backscattered electron images formed by detecting backscattered electrons at two or more different spatial positions, pattern contour data contained in the backscattered electron images may be obtained.

    摘要翻译: 提供了能够准确且快速地检查电路图案而不会提取图案轮廓数据的图形数据检查方法和系统。 虽然通常使用二次电子图像进行图案比较,但是通过使用所述适合于观察和检查图案元素的三维构造的背散射电子图像来提取图案元素的轮廓,并且执行图案检查 通过使用所提取的图案元素的轮廓。 更具体地,通过将​​图案元素的轮廓与诸如CAD数据的设计数据进行比较来测量轮廓和数据之间的差异,并且例如通过计算来自轮廓的电路图案元素的尺寸来执行图案检查 的模式。 通过在两个或更多个不同的空间位置检测反向散射电子形成的两个或更多个背散射电子图像,可以获得包含在背散射电子图像中的图案轮廓数据。

    COLOR FILTER AND METHOD FOR MANUFACTURING COLOR FILTER
    6.
    发明申请
    COLOR FILTER AND METHOD FOR MANUFACTURING COLOR FILTER 有权
    彩色滤光片和制造彩色滤光片的方法

    公开(公告)号:US20100265439A1

    公开(公告)日:2010-10-21

    申请号:US12746310

    申请日:2008-12-03

    IPC分类号: G02F1/1335 G02F1/13

    摘要: There is provided a color filter which can be manufactured by a simplified process and which will not short-circuit an electrode of a TFT substrate. The color filter includes a substrate, and a red layer, a green layer and a blue layer, formed on the substrate. When forming the green layer and the blue layer, these layers are not only formed on the substrate, but also laminated on the red layer to form a spacer comprised of the green layer and the blue layer, laminated on the red layer. The color filter further includes a transparent electrode layer which covers the substrate, the red layer, the green layer, the blue layer and the spacer, and an insulating black matrix layer formed on predetermined areas of the transparent electrode layer.

    摘要翻译: 提供了可以通过简化的工艺制造并且不会使TFT基板的电极短路的滤色器。 滤色器包括在基板上形成的基板和红色层,绿色层和蓝色层。 当形成绿色层和蓝色层时,这些层不仅形成在基板上,而且层叠在红色层上以形成层叠在红色层上的由绿色层和蓝色层组成的间隔物。 滤色器还包括覆盖基板,红色层,绿色层,蓝色层和间隔物的透明电极层和形成在透明电极层的预定区域上的绝缘黑矩阵层。

    Pattern inspection method and pattern inspection system
    7.
    发明授权
    Pattern inspection method and pattern inspection system 有权
    图案检验方法和图案检验制度

    公开(公告)号:US07786437B2

    公开(公告)日:2010-08-31

    申请号:US12188096

    申请日:2008-08-07

    IPC分类号: G01N23/00 G06K9/00

    摘要: A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern. From two or more backscattered electron images formed by detecting backscattered electrons at two or more different spatial positions, pattern contour data contained in the backscattered electron images may be obtained.

    摘要翻译: 提供了能够准确且快速地检查电路图案而不会提取图案轮廓数据的图形数据检查方法和系统。 虽然通常使用二次电子图像进行图案比较,但是通过使用所述适合于观察和检查图案元素的三维构造的背散射电子图像来提取图案元素的轮廓,并且执行图案检查 通过使用所提取的图案元素的轮廓。 更具体地,通过将​​图案元素的轮廓与诸如CAD数据的设计数据进行比较来测量轮廓和数据之间的差异,并且例如通过计算来自轮廓的电路图案元素的尺寸来执行图案检查 的模式。 通过在两个或更多个不同的空间位置检测反向散射电子形成的两个或更多个背散射电子图像,可以获得包含在背散射电子图像中的图案轮廓数据。

    Dynamic RAM-and semiconductor device
    8.
    发明授权
    Dynamic RAM-and semiconductor device 有权
    动态RAM和半导体器件

    公开(公告)号:US07474550B2

    公开(公告)日:2009-01-06

    申请号:US11790772

    申请日:2007-04-27

    IPC分类号: G11C5/06

    摘要: A semiconductor memory includes a plurality of first regions arranged along a first direction, each of which corresponds to a memory array including a plurality of word lines, bit lines and memory cells. A plurality of second regions are provided each of which is arranged alternately with respect to each of the first regions, and each including sense amplifiers connected to said bit lines to form an open line type semiconductor memory. A third region is also provided that is a region not sandwiched by the second regions, wherein the third region includes a plurality of dummy bit lines.

    摘要翻译: 半导体存储器包括沿着第一方向布置的多个第一区域,每个第一区域对应于包括多个字线,位线和存储单元的存储器阵列。 提供多个第二区域,每个第二区域相对于每个第一区域交替布置,并且每个包括连接到所述位线的读出放大器以形成开放式半导体存储器。 还提供了第三区域,其是不被第二区域夹持的区域,其中第三区域包括多个虚拟位线。

    Storage subsystem and storage system

    公开(公告)号:US07343449B2

    公开(公告)日:2008-03-11

    申请号:US11081698

    申请日:2005-03-17

    申请人: Koji Arai Koji Nagata

    发明人: Koji Arai Koji Nagata

    IPC分类号: G06F12/00

    摘要: The first storage subsystem, when new data is written in a first memory device beyond a certain timing, writes pre-updated data prior to update by said new data into a pre-updated data memory region and, in addition, updates snapshot management information that expresses a snapshot of a data group within the first memory device to information that expresses the snapshot at the certain timing and, at a later timing than the certain timing, judges, on the basis of the snapshot management information, in which of either the pre-updated data memory region or the first memory device the data constituting the data group at a certain timing exists, acquires data from the one in which the data exists and writes it into the second memory device of the second storage subsystem, and generates the certain timing repeatedly.