公开(公告)号：US07375825B2

公开(公告)日：2008-05-20

申请号：US11204152

申请日：2005-08-16

Applicant: Nobuaki Ueki

Inventor： Nobuaki Ueki

IPC: G01B11/02

CPC classification number: G01B9/02058 ,  G01B9/02057 ,  G01J3/0213 ,  G01J2009/0292

Abstract: The light intensity ratio adjustment filter is placed between the reference surface and the sample surface of the interferometer. This light intensity ratio adjustment filter has a light intensity ratio adjustment film including an optical reflection-absorption layer and a dielectric anti-reflection layer on the surface of a transparent substrate made of glass on the sample side, and an optical anti-reflection film on the reference surface side, and acts so as to reflect part of the incident light from the surface opposite the reference surface, and after absorbing part of the remaining light, transmit the remainder towards the sample, and furthermore, absorb part of the light returned from the sample while controlling reflection, and transmit the remainder in the direction of the reference surface as the sample light.

Abstract translation: 光强比调节滤光器被放置在干涉仪的参考表面和样品表面之间。 该光强度比调节滤光器具有在样品侧的由玻璃制成的透明基板的表面上具有光反射吸收层和介电抗反射层的光强度比调节膜，以及光学抗反射膜 参考表面侧，并且用于反射来自与参考表面相对的表面的入射光的一部分，并且在吸收剩余光的一部分之后，将剩余部分透射到样品，此外，吸收部分从基准表面返回的光 样本，同时控制反射，并将剩余部分沿参考表面的方向作为样本光传输。

公开(公告)号：US07436518B1

公开(公告)日：2008-10-14

申请号：US11582439

申请日：2006-10-18

Applicant: Eric H. Smith ,  Richard L. Kendrick

Inventor： Eric H. Smith ,  Richard L. Kendrick

IPC: G01B9/02

CPC classification number: G01J9/02 ,  G01J2009/0284 ,  G01J2009/0292

Abstract: A Fourier Transform Spectrometer (“FTS”) system includes a Fizeau FTS having a plurality of sub-collecting elements, adjacent ones of which are separated by a gap distance, and at least one of which has an adjustable optical path. The FTS system further includes a Michelson FTS having an adjustable optical path. The FTS system further includes one or more processors configured to select spectral data collected by the Fizeau FTS corresponding to spatial frequencies for which the Fizeau FTS has a modulation transfer function (“MTF”) value above a first threshold level, to select spectral data collected by the Michelson FTS corresponding to spatial frequencies for which the Michelson FTS has a MTF value above a second threshold level, and to combine the selected spectral data from the Fizeau FTS with the selected spectral data from the Michelson FTS.

Abstract translation: 傅立叶变换光谱仪（“FTS”）系统包括具有多个副收集元件的Fizeau FTS，其中相邻的子集合元件被间隔开，并且其中至少一个具有可调光路。 FTS系统还包括具有可调光路的迈克尔逊FTS。 FTS系统还包括一个或多个处理器，其被配置为选择与由Fizeau FTS具有高于第一阈值水平的调制传递函数（“MTF”）值的空间频率相对应的Fizeau FTS收集的频谱数据，以选择收集的频谱数据 对应于迈克尔逊FTS具有高于第二阈值水平的MTF值的空间频率的迈克尔逊FTS，并将来自Fizeau FTS的所选频谱数据与来自迈克尔逊FTS的所选频谱数据组合。

公开(公告)号：US20180149468A1

公开(公告)日：2018-05-31

申请号：US15825219

申请日：2017-11-29

Applicant: APRE INSTRUMENTS, LLC

Inventor： ARTUR OLSZAK

IPC: G01B9/04 ,  G01B9/02 ,  G01B11/25 ,  G01J9/02

CPC classification number: G01B9/04 ,  G01B9/02003 ,  G01B9/02004 ,  G01B9/02007 ,  G01B9/02057 ,  G01B9/0209 ,  G01B11/2527 ,  G01B2290/35 ,  G01J9/02 ,  G01J2009/0292

Abstract: Heterodyne spectrally controlled interferometry is performed by combining a delay line in Twyman-Green configuration with a Fizeau interferometer. By splitting a white-light beam in the delay line and introducing a time delay in one of the resulting beams, the delay line produces a recombined output beam with a sinusoidally modulated spectrum. By introducing a frequency shift in one of the beams in the delay line, the output beam is also continuously phase shifted in the spectral domain in a time-varying fashion, as required for heterodyne SCI.

公开(公告)号：US20060061768A1

公开(公告)日：2006-03-23

申请号：US10976863

申请日：2004-11-01

Applicant: Gaetan Duplain

Inventor： Gaetan Duplain

IPC: G01B9/02

CPC classification number: G01B9/02023 ,  G01B9/02028 ,  G01B9/02032 ,  G01B9/02065 ,  G01B9/0209 ,  G01B2290/70 ,  G01D5/266 ,  G01J2009/0292 ,  G01K11/00 ,  G01K11/3206

Abstract: The invention provides a method and a system for measuring a physical quantity by means of a tandem interferometer optical sensor system based on low-coherence interferometry. The system comprises a light system, a sensing interferometer and a polarization readout interferometer. The invention provides a polarization interferometer comprising a single birefringent wedge. The invention also provides for a dispersion-compensated optical sensor system. The invention also provides an interferometer sensitive to temperature that comprises a trajectory in a LiB3O5 crystal with an x-cut orientation.

Abstract translation: 本发明提供一种通过基于低相干干涉测量的串联干涉仪光学传感器系统来测量物理量的方法和系统。 该系统包括光系统，感测干涉仪和偏振读出干涉仪。 本发明提供一种包括单个双折射楔的偏振干涉仪。 本发明还提供一种色散补偿光学传感器系统。 本发明还提供了一种对温度敏感的干涉仪，其包括具有x切割取向的L 3 N 3 O 5 O 5晶体中的轨迹。

公开(公告)号：US07259860B2

公开(公告)日：2007-08-21

申请号：US10946691

申请日：2004-09-22

Applicant: Joseph Marron ,  Nestor Farmiga ,  Andrew W. Kulawiec ,  Thomas J. Dunn

Inventor： Joseph Marron ,  Nestor Farmiga ,  Andrew W. Kulawiec ,  Thomas J. Dunn

IPC: G01B9/02 ,  G01J3/45

CPC classification number: H01S5/0687 ,  G01B9/02004 ,  G01B9/02057 ,  G01B9/02083 ,  G01B2290/60 ,  G01J9/02 ,  G01J2009/0292 ,  H01S5/0014 ,  H01S5/141 ,  H01S5/142

Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.

Abstract translation: 与分立光束可调谐激光器相结合使用的模式监测系统提供可用于调整激光器或与使用激光器相关的其他处理的光学反馈。 例如，可以监视用于频移干涉仪的频率可调谐源的输出，以支持获取或处理更准确的干扰数据。 用于取得测量光束的不同部分所行进的光程长度差的期望测量的第一干涉仪可以连接到用于测量测量光束本身的第二干涉仪。 可以根据本发明解释附加的干扰数据，以提供射束频率和强度的测量。

公开(公告)号：US20060066874A1

公开(公告)日：2006-03-30

申请号：US11204152

申请日：2005-08-16

Applicant: Nobuaki Ueki

Inventor： Nobuaki Ueki

IPC: G01B11/02

CPC classification number: G01B9/02058 ,  G01B9/02057 ,  G01J3/0213 ,  G01J2009/0292

Abstract: The light intensity ratio adjustment filter is placed between the reference surface and the sample surface of the interferometer. This light intensity ratio adjustment filter has a light intensity ratio adjustment film including an optical reflection-absorption layer and a dielectric anti-reflection layer on the surface of a transparent substrate made of glass on the sample side, and an optical anti-reflection film on the reference surface side, and acts so as to reflect part of the incident light from the surface opposite the reference surface, and after absorbing part of the remaining light, transmit the remainder towards the sample, and furthermore, absorb part of the light returned from the sample while controlling reflection, and transmit the remainder in the direction of the reference surface as the sample light.

Abstract translation: 光强比调节滤光器被放置在干涉仪的参考表面和样品表面之间。 该光强度比调节滤光器具有在样品侧的由玻璃制成的透明基板的表面上具有光反射吸收层和介电抗反射层的光强度比调节膜，以及光学抗反射膜 参考表面侧，并且用于反射来自与参考表面相对的表面的入射光的一部分，并且在吸收剩余光的一部分之后，将剩余部分透射到样品，此外，吸收部分从基准表面返回的光 样本，同时控制反射，并将剩余部分沿参考表面的方向作为样本光传输。

公开(公告)号：US5231285A

公开(公告)日：1993-07-27

申请号：US979364

申请日：1992-11-20

Applicant: Ralph T. Berg

Inventor： Ralph T. Berg

IPC: G01J9/02 ,  G01N21/45

CPC classification number: G01N21/45 ,  G01J2009/0292

Abstract: A method and apparatus for measuring the change in refractive index of a material with respect to temperature. The invention contemplates measuring the change in length of the material with respect to temperature over a predetermined temperature range with a Fizeau Interferometer by measuring the change in length through a vacuum at a point adjacent the length to produce a first set of data. Also measured is the change in the same length of the same material with respect to temperature over the same predetermined temperature range with the Interferometer by measuring the change in the length through the material to produce a second set of data. Determining the difference between the first and second sets of data produces resulting data which is the change in refractive index of the material with respect to temperature.

Abstract translation: 一种用于测量材料相对于温度的折射率变化的方法和装置。 本发明设想通过利用Fizeau干涉仪通过在与该长度相邻的点处的真空测量长度的变化来测量材料在相对于预定温度范围内的温度的变化，以产生第一组数据。 还通过测量通过材料的长度的变化产生第二组数据，通过干涉仪在相同的预定温度范围内相同温度下相同材料的相同长度的变化。 确定第一和第二组数据之间的差异产生作为材料相对于温度的折射率变化的结果数据。

公开(公告)号：US07259862B2

公开(公告)日：2007-08-21

申请号：US10976863

申请日：2004-11-01

Applicant: Gaétan Duplain

Inventor： Gaétan Duplain

IPC: G01B9/02

CPC classification number: G01B9/02023 ,  G01B9/02028 ,  G01B9/02032 ,  G01B9/02065 ,  G01B9/0209 ,  G01B2290/70 ,  G01D5/266 ,  G01J2009/0292 ,  G01K11/00 ,  G01K11/3206

Abstract: The invention provides a method and a system for measuring a physical quantity by means of a tandem interferometer optical sensor system based on low-coherence interferometry. The system comprises a light system, a sensing interferometer and a polarization readout interferometer. The invention provides a polarization interferometer comprising a single birefringent wedge. The invention also provides for a dispersion-compensated optical sensor system. The invention also provides an interferometer sensitive to temperature that comprises a trajectory in a LiB3O5 crystal with an x-cut orientation.

Abstract translation: 本发明提供一种通过基于低相干干涉测量的串联干涉仪光学传感器系统来测量物理量的方法和系统。 该系统包括光系统，感测干涉仪和偏振读出干涉仪。 本发明提供一种包括单个双折射楔的偏振干涉仪。 本发明还提供一种色散补偿光学传感器系统。 本发明还提供了一种对温度敏感的干涉仪，其包括具有x切割取向的L 3 N 3 O 5 O 5晶体中的轨迹。

公开(公告)号：US20060062260A1

公开(公告)日：2006-03-23

申请号：US10946691

申请日：2004-09-22

Applicant: Joseph Marron ,  Nestor Farmiga ,  Andrew Kulawiec ,  Thomas Dunn

Inventor： Joseph Marron ,  Nestor Farmiga ,  Andrew Kulawiec ,  Thomas Dunn

IPC: H01S3/10

CPC classification number: H01S5/0687 ,  G01B9/02004 ,  G01B9/02057 ,  G01B9/02083 ,  G01B2290/60 ,  G01J9/02 ,  G01J2009/0292 ,  H01S5/0014 ,  H01S5/141 ,  H01S5/142

Abstract: A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.

Abstract translation: 与分立光束可调谐激光器相结合使用的模式监测系统提供可用于调整激光器或与使用激光器相关的其他处理的光学反馈。 例如，可以监视用于频移干涉仪的频率可调谐源的输出，以支持获取或处理更准确的干扰数据。 用于取得测量光束的不同部分所行进的光程长度差的期望测量的第一干涉仪可以连接到用于测量测量光束本身的第二干涉仪。 可以根据本发明解释附加的干扰数据，以提供射束频率和强度的测量。

公开(公告)号：US5168324A

公开(公告)日：1992-12-01

申请号：US298812

申请日：1989-01-18

Applicant: Richard P. Hackel ,  Mark Feldman

Inventor： Richard P. Hackel ,  Mark Feldman

IPC: G01J9/02 ,  H01S3/00

CPC classification number: H01S3/005 ,  G01J9/0246 ,  G01J2009/0292

Abstract: A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10.sup.8. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing.

Abstract translation: 公开了一种波长计，其可以在108的两个部分的精度范围内确定来自激光源的激光束的波长。波长计具有楔形物，其具有与激光源的光路相对的椭圆形面，并且包括干涉仪板 其形成真空壳体。