摘要:
A digital system (1) which performs a digital processing according to a single or a plurality of clock signals to deliver a specified basic function, and which comprises a plurality of delay elements (4) respectively inserted into a plurality of clock circuits for supplying clock signals in a digital system, and respectively constituted by circuit elements for changing delay times according to values indicated by a control signal, and a plurality of holding circuits (5) for holding a plurality of control signals to be given to a plurality of delay elements. The plurality of holding circuits have a plurality of control signal values, held by these holding circuits, changed by external devices (6-8) according to a probabilistic search method with the digital system (1) supplied with power from a variable-output-voltage power supply (14) so that the basic function of the digital system satisfies specified specifications.
摘要:
A system which enables signals to be supplied at precisely desired times in an automatic test system. The apparatus includes a base delay memory which stores information related to a base time delay, while a vernier memory stores information relating to timing corrections to be made to the base time delay. The base delay memory controls a counter while the correction memory controls a vernier deskew apparatus for further delaying the output signal from the counter. To prevent carries from the vernier memory from influencing the base delay memory, the most significant bit of the vernier memory is of the same significance as the least significant bit of the base delay memory. The most significant bit of the vernier memory is also connected to drive the counter, in effect providing the counter with two least significant bits, and enabling a single base delay memory to control more than one signal timing paths.
摘要:
A circuit technique for stabilizing the timing of signals at an output node of a gate, despite substantial variations in temperature. In a gate having a switching portion and an emitter follower, the temperature-dependence of the gate delay within the switching portion may be offset by suitable control of the temperature characteristics of the load current source supplying the emitter follower output node. The load current source comprises a current source resistor, a current source transistor having its collector coupled to the output node, and a reference voltage source. The voltage source, rather than having a zero temperature coefficient as in known temperature-compensated configurations, is configured to have a temperature coefficient chosen to provide a temperature dependence in the delay through the emitter follower that offsets the temperature dependence of the delay through the switching portion so that the total gate delay is substantially temperature-independent. The reference voltage source for the load current source is a modified band-gap regulator comprising a regulating transistor, a current source pair of transistors Q1 and Q2, and first, second, and third resistors. The third resistor changes the current relationships to provide the desired output voltage and temperature coefficient.
摘要:
A delay circuit includes a memory addresses of which is designated by a counter incremented in response to each clock signal from an initial value set by an initial value setting circuit to an end value. A digital signal is written into an address as designated and read and converted into an analog signal to be outputted at an output terminal through a buffer amplifier. A delay time is determined by the writing timing and the reading timing of the digital signal. If the delay time is to be varied in the course of a delaying operation, a further initial value is set in the counter. A control signal for returning the counter in the initial value is generated by a first signal generating circuit when the end value is reached and a setting completion signal is generated by a second signal generating circuit when a setting of the further initial value is completed, and in response to both the signals, a muting signal is generated by a muting signal generating circuit, whereby the buffer amplifier mutes the output signal in response to the muting signal to prevent a noise due to random data from occurring at the output terminal.
摘要:
An inexpensive edge programmable timing signal generator for generating timing signals having complete edge programmability for accommodating incrementally adjustable variable pulse widths. The timing circuit is particularly useful in memory testing devices, where generation of a multiplicity of clock phases is required. A delay register delays an input timing signal generated by a coarse timing circuit by a predetermined amount of time, and a pair of rising and falling edge delay lines receive and delay the input and delayed timing signals by further predetermined amounts of time. The signals output from the rising and falling edge delay lines are applied to an OR gate, the output of which is applied to an EXCLUSIVE OR gate for selectively inverting the signal output from the OR gate. The circuit is inexpensive and takes up very little circuit board area.
摘要:
A formatting circuit for a high speed integrated circuit test system controls the application of timed data pulses to the input terminals of the device being tested, generates strobe signals to control comparators connected to the output terminals of the device being tested, and provides circuitry to decode error signals received from the device being tested. The formatting circuit routes all critical signal paths to the device under test over separate signal lines, thereby allowing compensation for the different propagation delay of each signal path. The input transitions and output strobe signals for the device being tested are not fixed in time with respect to the system clock, but are referenced to it. This enables drive data cycles and compare data cycles to be less dependent on the system clock, and permits them to overlap and cross test period boundaries. Multiple test vectors for a given test period are permitted and error correlator decodes error signals produced by incorrect output signals from the device under test. The error correlator decodes these error signals and logs them in a memory location corresponding to the proper test vector.
摘要:
A timing subsystem 10 including several test period generators for supplying a variety of timing signals to a device under test. Major, minor, and free-run period generators each supply various timing signals to a multiplexer 18, which selectively connects the timing signals to timing generators 20. A central processing unit 28 supplies data to the period generators and timing generators to define their respective timing signals. Timing signals generated by the major period generator 12 define the overall testing rate. The minor period generator 14 generates multiple timing signals within the periods of the major clock signals to permit higher clock rates. Timing signals that are independent of the major clock periods are generated by the free-run period generator 16. An external synchronizer circuit 26 provides a feedback loop from the device under test 22 to the major period generator. A reference driver trigger delay circuit 27 provides means for calibrating the timing generators. Each of the three period generators includes two interconnected timing interval generators 30 and 40 that alternately generate overlapping timing signals. Each timing interval generator includes a stop-restart oscillator 32, a counter 34, and a delay-line vernier 36. Upon the receipt of a start signal, the oscillator stops and restarts to align its clock pulses to the start signal. The oscillator output clocks the counter, which supplies a signal to the vernier when a preselected number is reached. The vernier delays the counter signal by a preselected delay and issues a signal that designates the end of the period.
摘要:
A system is disclosed which enables signals to be supplied at precisely desired times in an automatic test system. The apparatus includes a base delay memory which stores information representing the higher order bits of a time delay, while vernier memories store information relating to the lower order bits of the time delay. Offset memories enable storing calibration data. The base delay memory controls at least two counters in independent signal paths, while the vernier and offset memories control appropriate deskew units for further delaying the counter output signal as desired. The system enables sharing of resources, yet eliminates the need for repetitively loading correction data for deskew operations.
摘要:
Digital delay apparatus for variable delay uses a shift register fixed delay driving a random access memory variable delay. A variable modulus counter controls the read-write addressing, whereby the difference between addresses sets the variable delay of the random access memory. The random access memory capacity is small relative to the shift register for increased efficiency.
摘要:
Apparatus for delaying an electrical signal includes a sequence of stages, each for delaying the signal. A coarser stage delays the signal by multiples of a predetermined fundamental delay interval and a finer stage provides for fine adjustment of the delay. The fine stage includes an integral number N of delay elements, the total providing a delay interval greater than the fundamental delay interval, whereby the fine delay intervals compensate for fabrication tolerances to enable accurate calibration of the combined system by post-fabrication measurement. In one implementation each delay stage includes a tapped transmission line to provide delay intervals, in another a ramp generator is used.