LASER SOURCE LOCATION SYSTEM
    1.
    发明申请

    公开(公告)号:US20190146053A1

    公开(公告)日:2019-05-16

    申请号:US15814016

    申请日:2017-11-15

    申请人: Jurgen R. Ihns

    发明人: Jurgen R. Ihns

    IPC分类号: G01S3/785 G01S3/781 G01S3/783

    摘要: A system for detecting a direction of a source of a laser beam includes a pixelated sensor that is sensitive to the laser beam. A mask is disposed between the source of a laser beam and the pixelated sensor. The mask includes an opaque portion that is opaque to the laser beam and a window portion that is at least translucent to the laser beam. When the laser impinges upon the mask an image of the window portion is projected onto the pixelated sensor. A processor determines an angle of incidence of the laser beam with respect to the mask by determining a number of pixels that the image of the window is offset from where the image of the window would be if the laser beam had been normal to the mask.

    SPHERICALLY CONSTRAINED OPTICAL SEEKER ASSEMBLY

    公开(公告)号:US20180364324A1

    公开(公告)日:2018-12-20

    申请号:US15403345

    申请日:2017-01-11

    申请人: RAYTHEON COMPANY

    IPC分类号: G01S3/783 F41G7/00 F41G7/22

    摘要: A spherically constrained optical seeker assembly includes a spherical lens having an outer surface, an optical sensor assembly associated with the spherical lens, and a gimbal assembly. The optical sensor assembly is coupled to the gimbal assembly. The gimbal assembly is configured to move the optical sensor assembly to at least one desired position on the outer surface of the spherical lens. A method of manipulating the optical sensor assembly includes positioning the optical sensor assembly with respect to the spherical lens and moving the optical sensor assembly to at least one desired position with respect to the outer surface of the spherical lens by the gimbal assembly.

    METHOD AND APPARATUS FOR ESTIMATING REFLECTANCE PARAMETERS AND A POSITION OF A LIGHT SOURCE IN A SCENE

    公开(公告)号:US20170082720A1

    公开(公告)日:2017-03-23

    申请号:US15268584

    申请日:2016-09-17

    申请人: THOMSON LICENSING

    IPC分类号: G01S3/783 G01J1/44 G01N21/47

    摘要: A method, apparatus and system for estimating reflectance parameters and a position of the light source(s) of specular reflections of a scene include RGB sequence analysis with measured geometry in order to estimate specular reflectance parameters of an observed 3D scene. Embodiments include pixel-based image registration from which profiles of 3D scene points image intensities over the sequence are estimated. A profile is attached to a 3D point and to the set of pixels that display its intensity in the registered sequence. Subsequently, distinction is made between variable profiles that reveal specular effects and constant profiles that show diffuse reflections only. Then, for each variable profile diffuse reflectance is estimated and subtracted from the intensity profile to deduce the specular profile and the specular parameters are estimated for each observed 3D point. Then, the location of at least one light source responsible for the specular effects is estimated. Optionally, the parameters can be iteratively refined to determine color information and specular reflectance parameters.

    Sensing direction and distance
    9.
    发明授权
    Sensing direction and distance 有权
    感知方向和距离

    公开(公告)号:US09588214B2

    公开(公告)日:2017-03-07

    申请号:US13559332

    申请日:2012-07-26

    申请人: Eric Foxlin

    发明人: Eric Foxlin

    IPC分类号: G06K19/00 G01S3/783 G01S5/16

    CPC分类号: G01S3/7835 G01S5/163

    摘要: Technology described in this document can be embodied in an optical sensor that includes a rectangular array of at least four photodetector cells of substantially equal size. An opaque mask is affixed over the rectangular array. The opaque mask defines a substantially rectangular aperture for admitting light onto only a portion of the surface of each of the at least four photodetector cells, where the aperture can be centrally positioned over the rectangular array.

    摘要翻译: 本文中描述的技术可以体现在光学传感器中,该光学传感器包括具有基本上相同尺寸的至少四个光电检测器单元的矩形阵列。 不透明掩模贴在矩形阵列上。 不透明掩模限定基本上矩形的孔,用于将光仅允许至少四个光电检测器单元中的每一个的表面的一部分,其中孔可以位于矩形阵列上方。