公开(公告)号：US12092687B2

公开(公告)日：2024-09-17

申请号：US18373447

申请日：2023-09-27

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Lee D. Whetsel

IPC分类号： G01R31/28 ,  G01R31/317 ,  G01R31/3177 ,  G01R31/3185 ,  G06F11/267 ,  G06F11/27 ,  G06F11/26 ,  G06F11/34

CPC分类号： G01R31/31723 ,  G01R31/31722 ,  G01R31/31725 ,  G01R31/31727 ,  G01R31/3177 ,  G01R31/318572 ,  G06F11/267 ,  G06F11/27 ,  G06F11/261 ,  G06F11/3466

摘要： An address and command port interface selectively enables JTAG TAP domain operations and Trace domain operations within an IC. The port carries TMS and TDI input and TDO output on a single pin and receives a clock signal on a separate pin. The addressable two pin interface loads and updates instructions and data to the TAP domain within the IC. The instruction or data update operations in multiple ICs occur simultaneously. A process transmits data from an addressed target device to a controller using data frames, each data frame comprising a header bit and data bits. The logic level of the header bit is used to start, continue, and stop the data transmission to the controller. A data and clock signal interface between a controller and multiple target devices provides for each target device to be individually addressed and commanded to perform a JTAG or Trace operation.

公开(公告)号：US11988710B2

公开(公告)日：2024-05-21

申请号：US17166956

申请日：2021-02-03

申请人： Changxin Memory Technologies, Inc.

发明人： Chia-Chi Hsu

IPC分类号： G01R31/28 ,  G01R23/02 ,  G01R31/317 ,  G06F11/26 ,  G06F11/267 ,  G06F11/273

CPC分类号： G01R31/31713 ,  G06F11/267 ,  G06F11/273

摘要： The present invention provides a test method, a tester, a load board and a test system. The test method includes: outputting, through a first input/output (I/O) port of a tester, a first test signal to a first channel of a load board, wherein the first test signal is used to generate a second test signal and a third test signal; receiving, through the first I/O port, a third feedback signal returned from the first channel, wherein the third feedback signal is generated based on a first feedback signal and a second feedback signal; and determining whether a first chip and a second chip are operating normally based on the third feedback signal. Solutions provided in the present invention are capable of increasing the number of chips that can be tested at a single time.

公开(公告)号：US11982597B2

公开(公告)日：2024-05-14

申请号：US17870869

申请日：2022-07-22

申请人： Kyutaek Cho

发明人： Myung Ki Kim

IPC分类号： G01M99/00 ,  B25J9/16 ,  B65G61/00 ,  G01L25/00 ,  G01R31/28 ,  G03B43/00 ,  G06F3/041 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G10K11/16 ,  G10L25/51 ,  H04N17/00 ,  H04R29/00

CPC分类号： G01M99/005 ,  B25J9/161 ,  B25J9/1674 ,  B65G61/00 ,  G01L25/00 ,  G01M99/008 ,  G01R31/2834 ,  G03B43/00 ,  G06F3/0416 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G06F11/2733 ,  G10K11/16 ,  G10L25/51 ,  H04N17/002 ,  H04R29/001 ,  H04R29/004

摘要： An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots. Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

公开(公告)号：US20240061757A1

公开(公告)日：2024-02-22

申请号：US18450293

申请日：2023-08-15

申请人： Erik Stuart Hons

发明人： Erik Stuart Hons

IPC分类号： G06F11/267 ,  G06F11/273

CPC分类号： G06F11/267 ,  G06F11/273

摘要： In an example, a first testing device is configured to receive testing data from a second testing. The first testing device is configured to send a stimulus to a device under test. The first testing device obtains test data reception methods and test data reception formats that are compatible with the first testing device and translates the methods and formats into content that is readable by the second testing device. The content is received by the second testing device, which accesses test data transmission methods and formats compatible with the second testing device and defines an intersection of the reception and transmission test data formats. The second testing device sends the intersection of methods and formats to the first testing device, which reduces the intersection to a final method and format.

公开(公告)号：US11835578B2

公开(公告)日：2023-12-05

申请号：US17579629

申请日：2022-01-20

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Lee D. Whetsel

IPC分类号： G01R31/28 ,  G01R31/317 ,  G06F11/27 ,  G01R31/3185 ,  G01R31/3177 ,  G06F11/267 ,  G06F11/26 ,  G06F11/34

CPC分类号： G01R31/31723 ,  G01R31/3177 ,  G01R31/31722 ,  G01R31/31725 ,  G01R31/31727 ,  G01R31/318572 ,  G06F11/267 ,  G06F11/27 ,  G06F11/261 ,  G06F11/3466

摘要： An address and command port interface selectively enables JTAG TAP domain operations and Trace domain operations within an IC. The port carries TMS and TDI input and TDO output on a single pin and receives a clock signal on a separate pin. The addressable two pin interface loads and updates instructions and data to the TAP domain within the IC. The instruction or data update operations in multiple ICs occur simultaneously. A process transmits data from an addressed target device to a controller using data frames, each data frame comprising a header bit and data bits. The logic level of the header bit is used to start, continue, and stop the data transmission to the controller. A data and clock signal interface between a controller and multiple target devices provides for each target device to be individually addressed and commanded to perform a JTAG or Trace operation.

公开(公告)号：US20230349970A1

公开(公告)日：2023-11-02

申请号：US18348110

申请日：2023-07-06

申请人： NVIDIA Corporation

发明人： Shantanu Sarangi ,  Jae Wu ,  Andi Skende ,  Rajith Mavila

IPC分类号： G01R31/317 ,  G01R31/3187 ,  G01R31/3177 ,  G06F11/14 ,  G06F11/36 ,  G06F11/27 ,  G06F11/22 ,  G01R31/3181 ,  G01R31/3185 ,  G06F11/273 ,  G06F11/267

CPC分类号： G01R31/31724 ,  G01R31/3187 ,  G01R31/3177 ,  G06F11/1417 ,  G06F11/3688 ,  G06F11/27 ,  G06F11/2268 ,  G01R31/31813 ,  G01R31/318555 ,  G06F11/273 ,  G06F11/2273 ,  G06F11/267

摘要： Manufacturers perform tests on chips before the chips are shipped to customers. However, defects can occur on a chip after the manufacturer testing and when the chips are used in a system or device. The defects can occur due to aging or the environment in which the chip is employed and can be critical; especially when the chips are used in systems such as autonomous vehicles. To verify the structural integrity of the IC during the lifetime of the product, an in-system test (IST) is disclosed. The IST enables self-testing mechanisms for an IC in working systems. The IST mechanisms provide structural testing of the ICs when in a functional system and at a manufacturer's level of testing. Unlike ATE tests that are running on a separate environment, the IST provides the ability to go from a functional world view to a test mode.

公开(公告)号：US11797408B2

公开(公告)日：2023-10-24

申请号：US17646559

申请日：2021-12-30

申请人： Juniper Networks, Inc.

发明人： Sanjeev Kumar Mishra ,  Ankur Neog ,  Ramakrishnan Rajagopalan ,  Ravindran Thangarajah ,  Shamantha Krishna K G

IPC分类号： G06F11/273 ,  G06F11/27 ,  G06F11/267

CPC分类号： G06F11/2733 ,  G06F11/267 ,  G06F11/27

摘要： In general, a device comprising a processor and a memory may be configured to perform various aspects of the techniques described in this disclosure. The processor may conduct, based on configuration parameters, each of a plurality of simulation iterations within the test environment to collect a corresponding plurality of simulation datasets representative of operating states of the network device. The processor may perform a regression analysis with respect to each of the plurality of configuration parameters and each of the plurality of simulation datasets to generate a light weight model representative of the network device that predicts an operating state of the network device. The processor may output the light weight model for use in a computing resource restricted network device to enable prediction of the operating state of the computing resource restricted network device when configured with the configuration parameters. The memory may store the light weight model.

公开(公告)号：US20230296481A1

公开(公告)日：2023-09-21

申请号：US18131400

申请日：2023-04-06

申请人： Kyutaek Cho

发明人： Myung Ki KIM

IPC分类号： G01M99/00 ,  G01R31/28 ,  G06F11/273 ,  G10K11/16 ,  G10L25/51 ,  H04R29/00 ,  B65G61/00 ,  G06F3/041 ,  H04N17/00 ,  B25J9/16 ,  G06F11/263 ,  G06F11/267 ,  G01L25/00 ,  G03B43/00

CPC分类号： G01M99/005 ,  G01M99/008 ,  G01R31/2834 ,  G06F11/2733 ,  G10K11/16 ,  G10L25/51 ,  H04R29/001 ,  H04R29/004 ,  B65G61/00 ,  G06F3/0416 ,  H04N17/002 ,  B25J9/161 ,  B25J9/1674 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G01L25/00 ,  G03B43/00

摘要： An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots. Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

公开(公告)号：US11709114B2

公开(公告)日：2023-07-25

申请号：US16629574

申请日：2018-04-06

申请人： CVE Technology Group, Inc.

发明人： Myung Ki Kim

IPC分类号： G01M99/00 ,  G01R31/28 ,  G06F11/273 ,  G10K11/16 ,  G10L25/51 ,  H04R29/00 ,  B65G61/00 ,  G06F3/041 ,  H04N17/00 ,  B25J9/16 ,  G06F11/263 ,  G06F11/267 ,  G01L25/00 ,  G03B43/00

CPC分类号： G01M99/005 ,  B25J9/161 ,  B25J9/1674 ,  B65G61/00 ,  G01L25/00 ,  G01M99/008 ,  G01R31/2834 ,  G03B43/00 ,  G06F3/0416 ,  G06F11/263 ,  G06F11/267 ,  G06F11/273 ,  G06F11/2733 ,  G10K11/16 ,  G10L25/51 ,  H04N17/002 ,  H04R29/001 ,  H04R29/004

摘要： An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots. Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

公开(公告)号：US11693752B2

公开(公告)日：2023-07-04

申请号：US17476049

申请日：2021-09-15

申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION

发明人： Zhanhong Yan ,  Satoshi Masuda ,  Michiaki Tatsubori

IPC分类号： G06F11/263 ,  B60W40/06 ,  G06V20/56 ,  B60W50/14 ,  G06F11/22 ,  G06F11/267 ,  B60W50/02

CPC分类号： G06F11/2635 ,  B60W40/06 ,  B60W50/14 ,  G06F11/2273 ,  G06F11/263 ,  G06F11/267 ,  G06V20/56 ,  B60W50/02 ,  B60W50/0205 ,  B60W2050/021 ,  G06F11/2257

摘要： A computer-implemented method is provided for redundancy reduction for driving test scenarios. The method includes receiving an original test set of driving scenarios and a driving model which simulates a vehicle behavior under a driving scenario inputted to the driving model. The method includes, for each driving scenario of the original test set, obtaining vehicle dynamics timeseries data as an output of the driving model. The method includes determining similar driving scenarios by comparing driving model outputs. The method additionally includes creating a new test set of driving scenarios by discarding duplicated ones of the similar driving scenarios from the original test set.