HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHARGE TRAPPING EFFICIENCY
    94.
    发明申请
    HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHARGE TRAPPING EFFICIENCY 审中-公开
    具有增强电荷捕获效率的高电阻率绝缘硅衬底

    公开(公告)号:WO2018080772A1

    公开(公告)日:2018-05-03

    申请号:PCT/US2017/055722

    申请日:2017-10-09

    Abstract: A multilayer semiconductor on insulator structure is provided in which the handle substrate and an epitaxial layer in interfacial contact with the handle substrate comprise electrically active dopants of opposite type. The epitaxial layer is depleted by the handle substrate free carriers, thereby resulting in a high apparent resistivity, which improves the function of the structure in RF devices.

    Abstract translation: 提供了绝缘体上多层半导体结构,其中处理衬底和与处理衬底界面接触的外延层包括相反类型的电活性掺杂剂。 外延层被处理衬底自由载流子耗尽,从而导致高的视电阻率,这改善了RF器件中结构的功能。

    FLUIDIZED BED REACTOR INCLUDING LINER
    95.
    发明申请
    FLUIDIZED BED REACTOR INCLUDING LINER 审中-公开
    流化床反应器,包括衬里

    公开(公告)号:WO2018067335A1

    公开(公告)日:2018-04-12

    申请号:PCT/US2017/053208

    申请日:2017-09-25

    Inventor: REZVANIAN, Omid

    Abstract: A fluidized bed reactor includes a reactor core and a stack of liner segments. The stack includes a first liner segment and a second liner segment. The first liner segment includes a first edge having a base surface and an angled surface. The base surface and the angled surface form an obtuse angle. The second liner segment includes a second edge. The first edge and the second edge form a shiplap joint to connect the first liner segment to the second liner segment.

    Abstract translation: 流化床反应器包括反应堆芯和一叠衬管段。 该堆叠包括第一衬垫部分和第二衬垫部分。 第一衬垫部分包括具有基部表面和成角度表面的第一边缘。 基面和倾斜面形成钝角。 第二衬套段包括第二边缘。 第一个边缘和第二个边缘形成一个搭接接头,将第一个衬管段连接到第二个衬管段。

    HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE TRAPPING LAYER FORMED ON A SUBSTRATE WITH A ROUGH SURFACE
    100.
    发明申请
    HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE TRAPPING LAYER FORMED ON A SUBSTRATE WITH A ROUGH SURFACE 审中-公开
    包含在具有粗糙表面的衬底上形成的电荷陷阱层的高电阻率绝缘体上硅衬底

    公开(公告)号:WO2017142704A1

    公开(公告)日:2017-08-24

    申请号:PCT/US2017/015813

    申请日:2017-01-31

    CPC classification number: H01L21/76254

    Abstract: A multilayer composite structure and a method of preparing a multilayer composite structure are provided. The multilayer composite structure comprises a semiconductor handle substrate having a minimum bulk region resistivity of at least about 500 ohm-cm and the front surface of the single crystal semiconductor handle substrate has a surface roughness of at least about 0.1 micrometers as measured according to the root mean square method over a surface area of at least 30 micrometers by 30 micrometers. The composite structure further comprises a charge trapping layer in contact with the front surface, the charge trapping layer comprising poly crystalline silicon, the poly crystalline silicon comprising grains having a plurality of crystal orientations; a dielectric layer in contact with the charge trapping layer; and a single crystal semiconductor device layer in contact with the dielectric layer.

    Abstract translation: 提供了多层复合结构和制备多层复合结构的方法。 多层复合结构包括具有至少约500ohm-cm的最小体区电阻率的半导体处理衬底,并且单晶半导体处理衬底的前表面具有根据根部测量的至少约0.1微米的表面粗糙度 均方法在至少30微米×30微米的表面积上。 所述复合结构还包括与所述前表面接触的电荷俘获层,所述电荷俘获层包含多晶硅,所述多晶硅包含具有多个晶体取向的晶粒; 与电荷俘获层接触的介电层; 以及与介电层接触的单晶半导体器件层。

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