Abstract:
A system for distributing available memory resource comprising at least two random access memory (RAM) elements and RAM routing logic. The RAM routing logic comprises configuration logic to dynamically distribute the available memory resource into a first memory area providing redundant memory storage and a second memory area providing non-redundant memory storage.
Abstract:
A random number generator circuit includes a first memory having multiple storage elements. Each of the storage elements has an initial state corresponding thereto when powered up by a voltage supply source applied to the first memory. The first memory is operative to generate a first signal including multiple bits indicative of the respective initial states of the storage elements. The random number generator circuit further includes an error correction circuit coupled to the first memory. The error correction circuit is operative to receive the first signal and to correct at least one bit in the first signal that is not repeatable upon successive applications of power to the first memory to thereby generate a second signal. The second signal is a random number that is repeatable upon successive applications of power to the first memory.
Abstract:
A semiconductor storage device, a method of controlling the same, and an error correction system allow reduction in power consumption and circuit scale without detriment to error correction capability. An error correction code (ECC) circuit of a solid state drive (SSD) performs first error correction on read data using a first error correction code (Hamming code), and further performs second error correction on the result of the first error correction using a second error correction code (BHC code). Furthermore, the ECC circuit performs third error correction on the result of the second error correction using a third error correction code (RS code).
Abstract:
Daisy-chain memory configuration and usage is disclosed. According to one configuration, a memory system includes a controller and corresponding string of multiple successive memory devices coupled in a daisy-chain manner. The controller communicates commands over the serial control link to configure a first memory device to write a block of data to a second memory device in the chain. For example, the controller initiates copying a block of data by communicating over the daisy-chain control link to configure a first memory device of the multiple memory devices to be a source for outputting data, communicating over the daisy-chain control link to configure a second memory device to be a destination for receiving data, and communicating over the daisy-chain control link to initiate a transfer of the data from the first memory device to the second memory device.
Abstract:
A method and apparatus for controlling a reading level of a memory cell are provided. The method of controlling a reading level of a memory cell may include: receiving metric values calculated based on given voltage levels and reference levels; generating summed values for each of the reference levels by summing metric values corresponding to levels of a received signal from among the received metric values; selecting the reference level having the greatest value of the generated summed values from the reference levels; and controlling the reading level of the memory cell based on the selected reference level.
Abstract:
A memory control module includes a format module that communicates with a memory array that includes B memory blocks each including P physical pages and Q logical pages. The format module selects X predetermined locations to write pilot data and read-back pilot signals in each of the B memory blocks. B, P, Q and X are integers greater than or equal to 1. The memory control module also includes a signal processing module that compares the written pilot data to the read-back pilot signals and that determines variations between the written pilot data and the read-back pilot signals based on the comparison.
Abstract:
In order to improve the availability of a data processing system in spite of possible memory errors, the inventive method consists in verifying a dataword readout with the aid of redundant additional information, when the data word is extracted from a memory cell (SO) and, if the data word is falsified, in carrying out an error treatment process which makes it possible to verify (S1-S3) the operability of the memory cell and, in the case when said memory cell is operable, the content thereof (S1-S3) is again produced.
Abstract:
The quality of data stored in a memory system in assessed by different methods, and the memory system is operated according to the assessed quality. The data quality (a) can be assessed during I-cad operations. Subsequent use of an Error Correction Code (a) can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
Abstract:
A fault-tolerant, high-speed wafer scale system comprises a plurality of functional modules, a parallel hierarchical bus which is fault-tolerant to defects in an interconnect network, and one or more bus masters. This bus includes a plurality of bus lines segmented into sections and linked together by programmable bus switches and bus transceivers or repeaters in an interconnect network. By: 1) use of small block size (512K bit) for the memory modules; 2) use of programmable identification register to facilitate dynamic address mapping and relatively easy incorporation of global redundancy; 3) use of a grid structure for the bus to provide global redundancy for the interconnect network; 4) use of a relatively narrow bus consisting of 13 signal lines to keep the total area occupied by the small bus; 5) use of segmented bus lines connected by programmable switches and programmable bus transceivers to facilitate easy isolation of bus defects; 6) use of special circuit for bus transceivers and asynchronous handshakes to facilitate dynamic bus configuration; 7) use of programmable control register to facilitate run-time bus reconfiguration; 8) use of spare bus lines to provide local redundancy for the bus; and 9) use of spare rows and columns in the memory module to provide local redundancy, high defect tolerance in the hierarchical bus is obtained.
Abstract:
A memory system includes memory modules having a number of sets of memory devices including data memory devices for data and error correction code (ECC). The ECC memory devices carry ECC symbols in order to facilitate Redundant Array of Independent Memory (RAIM) functionalities for the memory modules. A host receives and decodes the ECC symbols and executes RAIM operations. The host and the memory modules are coupled by a number of channels, one channel per each set of the memory devices.