ELIMINATION OF H2S IN IMMERSION TIN PLATING SOLUTION

    公开(公告)号:WO2018222487A8

    公开(公告)日:2018-12-06

    申请号:PCT/US2018/034317

    申请日:2018-05-24

    Abstract: Upon use of an immersion tin plating solution, contaminants build in the solution, which cause the plating rate and the quality of the plated deposit to decrease. One primary contaminant, which builds in the plating solution upon use, is hydrogen sulfide, H 2 S. If a gas is bubbled or blown through the solution, contaminants, especially hydrogen sulfide, can be effectively removed from the solution and, as a result, the high plating rate and plate quality can be restored or maintained. In this regard, any gas can be used, however, it is preferable to use a gas that will not detrimentally interact with the solution, other than to strip out contaminants. Nitrogen is particularly preferred for this purpose because it is efficient at stripping out contaminants, including hydrogen sulfide, but does not induce the oxidation of the tin ions from their divalent state to the tetravalent state, which is detrimental.

    COPPER DEPOSITION IN WAFER LEVEL PACKAGING OF INTEGRATED CIRCUITS
    2.
    发明申请
    COPPER DEPOSITION IN WAFER LEVEL PACKAGING OF INTEGRATED CIRCUITS 审中-公开
    集成电路晶圆级封装中铜的沉积

    公开(公告)号:WO2018057590A1

    公开(公告)日:2018-03-29

    申请号:PCT/US2017/052449

    申请日:2017-09-20

    Abstract: An electrodeposition composition comprising: (a) a source of copper ions; (b) an acid; (c) a suppressor; and (d) a leveler, wherein the leveler comprises a quaternized dipyridyl compound prepared by reacting a dipyridyl compound with a difunctional alkylating agent or a quaternized poly(epihalohydrin). The electrodeposition composition can be used in a process for forming a copper feature over a semiconductor substrate in wafer level packaging to electrodeposit a copper bump or pillar on an underbump structure of a semiconductor assembly.

    Abstract translation: 电沉积组合物,其包含:(a)铜离子源; (b)酸; (c)抑制者; (d)整平剂,其中整平剂包含通过使联吡啶化合物与双官能烷基化剂或季化聚(表卤代醇)反应制备的季化联吡啶化合物。 该电沉积组合物可用于在晶片级封装中在半导体衬底上形成铜特征以在半导体组件的下凸点结构上电沉积铜凸块或柱的工艺中。

    COMPOSITIONS INCLUDING A HIGH MOLECULAR WEIGHT ACID SUITABLE FOR CONDUCTIVE POLYMER FORMATION ON DIELECTRIC SUBSTRATES
    3.
    发明申请
    COMPOSITIONS INCLUDING A HIGH MOLECULAR WEIGHT ACID SUITABLE FOR CONDUCTIVE POLYMER FORMATION ON DIELECTRIC SUBSTRATES 审中-公开
    包含高分子量酸的组合物,适用于导电聚合物在电介质基材上的形成

    公开(公告)号:WO2016116876A1

    公开(公告)日:2016-07-28

    申请号:PCT/IB2016/050277

    申请日:2016-01-20

    Applicant: ENTHONE INC.

    Abstract: The invention relates to a composition and a process for the deposition of conductive polymers on dielectric substrates. In particular, the invention relates to a composition for the formation of electrically conductive polymers on the surface of a dielectric substrate, the composition comprising at least one polymerizable monomer which is capable to form a conductive polymer, an emulsifier and an acid, characterized in that the composition comprises at least one metal-ion selected from the group consisting of lithium-ions, sodium-ions, aluminum-ions, beryllium-ions, bismuth-ions, boron-ions, indium-ions and alkyl imidazolium-ions. The acid is typically a high molecular weight polymeric acid having molecular weight of at least 500,000 Da including, for example, polystyrene sulfonic acid having a molecular weight of approximately 1,000,000 Da.

    Abstract translation: 本发明涉及用于在电介质基底上沉积导电聚合物的组合物和方法。 特别地,本发明涉及用于在电介质基底的表面上形成导电聚合物的组合物,该组合物包含至少一种可形成导电聚合物,乳化剂和酸的可聚合单体,其特征在于, 所述组合物包含选自锂离子,钠离子,铝离子,铍离子,铋离子,硼离子,铟离子和烷基咪唑鎓离子中的至少一种金属离子。 酸通常是分子量至少为500,000Da的高分子量聚合酸,包括例如分子量约为1,000,000Da的聚苯乙烯磺酸。

    ADHESION PROMOTION IN PRINTED CIRCUIT BOARDS
    4.
    发明申请
    ADHESION PROMOTION IN PRINTED CIRCUIT BOARDS 审中-公开
    印刷电路板中的粘合促进

    公开(公告)号:WO2015023295A1

    公开(公告)日:2015-02-19

    申请号:PCT/US2013/055368

    申请日:2013-08-16

    Applicant: ENTHONE INC.

    Abstract: Compositions and methods for enhancing adhesion between a copper conducting layer and a dielectric material during manufacture of a printed circuit board. Conditioning compositions contain a functional organic compound and preferably a transition metal ion. The functional organic compound, e.g., a purine derivative, is capable of forming a self-assembled monolayer. Adhesion promoting compositions contain an acid, preferably an inorganic acid, and an oxidant. The latter compositions may also contain a corrosion inhibitor and/or a transition metal ion selected from among Zn, Ni, Co, Cu, Ag, Au, Pd or another Pt group metal. The corrosion inhibitor may comprise a nitrogen-containing aromatic heterocyclic compound.

    Abstract translation: 用于在制造印刷电路板期间增强铜导电层和电介质材料之间的粘附性的组合物和方法。 调理组合物含有功能性有机化合物,优选过渡金属离子。 功能性有机化合物,例如嘌呤衍生物,能够形成自组装单层。 粘合促进组合物含有酸,优选无机酸和氧化剂。 后一种组合物还可以含有选自Zn,Ni,Co,Cu,Ag,Au,Pd或其它Pt族金属中的腐蚀抑制剂和/或过渡金属离子。 腐蚀抑制剂可以包含含氮芳族杂环化合物。

    ELECTRODEPOSITION OF COPPER IN MICROELECTRONICS WITH DIPYRIDYL-BASED LEVELERS
    5.
    发明申请
    ELECTRODEPOSITION OF COPPER IN MICROELECTRONICS WITH DIPYRIDYL-BASED LEVELERS 审中-公开
    用DIPYRIDYL-LEEDER在微电子中电沉积铜

    公开(公告)号:WO2010062822A2

    公开(公告)日:2010-06-03

    申请号:PCT/US2009/065053

    申请日:2009-11-19

    Abstract: A method for metallizing a via feature in a semiconductor integrated circuit device substrate, wherein the semiconductor integrated circuit device substrate comprises a front surface, a back surface, and the via feature and wherein the via feature comprises an opening in the front surface of the substrate, a sidewall extending from the front surface of the substrate inward, and a bottom. The method comprises contacting the semiconductor integrated circuit device substrate with an electrolytic copper deposition chemistry comprising (a) a source of copper ions and (b) a leveler compound, wherein the leveler compound is a reaction product of a dipyridyl compound and an alkylating agent; and supplying electrical current to the electrolytic deposition chemistry to deposit copper metal onto the bottom and sidewall of the via feature, thereby yielding a copper filled via feature.

    Abstract translation: 一种用于金属化半导体集成电路器件基板中的通孔特征的方法,其中所述半导体集成电路器件基板包括前表面,后表面和通孔特征,并且其中所述通孔特征包括在所述基板的前表面中的开口 ,从基板的前表面向内延伸的侧壁和底部。 该方法包括使半导体集成电路器件衬底与包含(a)铜离子源和(b)矫光剂化合物的电解铜沉积化学物质接触,其中矫光剂化合物是二吡啶基化合物和烷化剂的反应产物; 并向电解沉积化学物质提供电流以将铜金属沉积到通孔特征的底部和侧壁上,从而产生铜填充的通孔特征。

    ELECTROLYTIC DEPOSITION OF METAL-BASED COMPOSITE COATINGS COMPRISING NANO-PARTICLES
    6.
    发明申请
    ELECTROLYTIC DEPOSITION OF METAL-BASED COMPOSITE COATINGS COMPRISING NANO-PARTICLES 审中-公开
    包含纳米颗粒的金属基复合涂层的电沉积

    公开(公告)号:WO2009076430A1

    公开(公告)日:2009-06-18

    申请号:PCT/US2008/086210

    申请日:2008-12-10

    CPC classification number: C25D15/02 C25D3/02 C25D15/00

    Abstract: A method is provided for imparting corrosion resistance onto a surface of a substrate. The method comprises contacting the surface of the substrate with an electrolytic plating solution comprising (a) a source of deposition metal ions of a deposition metal selected from the group consisting of zinc, palladium, silver, nickel, copper, gold, platinum, rhodium, ruthenium, chrome, and alloys thereof, (b) a pre-mixed dispersion of non-metallic nano-particles, wherein the non-metallic particles have a pre-mix coating of surfactant molecules thereon; and applying an external source of electrons to the electrolytic plating solution to thereby electrolytically deposit a metal-based composite coating comprising the deposition metal and non-metallic nano-particles onto the surface.

    Abstract translation: 提供了一种赋予衬底表面的耐腐蚀性的方法。 该方法包括使基板的表面与电解电镀溶液接触,所述电解电镀溶液包括(a)选自锌,钯,银,镍,铜,金,铂,铑等的沉积金属的沉积金属离子源, 钌,铬及其合金,(b)非金属纳米颗粒的预混合分散体,其中所述非金属颗粒在其上具有表面活性剂分子的预混合涂层; 以及将外部电子源施加到所述电解电镀溶液中,从而将包含所述沉积金属和非金属纳米颗粒的金属基复合涂层电沉积到所述表面上。

    COMPOSITE COATINGS FOR WHISKER REDUCTION
    7.
    发明申请
    COMPOSITE COATINGS FOR WHISKER REDUCTION 审中-公开
    复合涂料减少

    公开(公告)号:WO2009076424A1

    公开(公告)日:2009-06-18

    申请号:PCT/US2008/086203

    申请日:2008-12-10

    CPC classification number: C25D15/02 C25D3/30 H01R13/03

    Abstract: There is provided a method and composition for applying a composite coating having enhanced resistance to tin whisker formation onto a metal surface of an electrical component. The method comprises contacting the metal surface with an electrolytic plating composition comprising (a) a source of tin ions and (b) non-metallic particles, and applying an external source of electrons to the electrolytic plating composition to thereby electrolytically deposit the composite coating onto the metal surface, wherein the composite coating comprises tin metal and the non-metallic particles.

    Abstract translation: 提供了一种用于将具有增强的耐锡晶须形成的复合涂层施加到电气部件的金属表面上的方法和组合物。 该方法包括使金属表面与包含(a)锡离子源和(b)非金属颗粒的电解电镀组合物接触,并将外部电子源施加到电解镀覆组合物,从而将复合涂层电解沉积到 金属表面,其中复合涂层包括锡金属和非金属颗粒。

    CYANIDFREIE ELEKTROLYTZUSAMMENSETZUNG UND VERFAHREN ZUR ABSCHEIDUNG VON SILBER- ODER SILBERLEGIERUNGSSCHICHTEN AUF SUBSTRATEN
    9.
    发明申请
    CYANIDFREIE ELEKTROLYTZUSAMMENSETZUNG UND VERFAHREN ZUR ABSCHEIDUNG VON SILBER- ODER SILBERLEGIERUNGSSCHICHTEN AUF SUBSTRATEN 审中-公开
    氰化物电解液组成和方法银或银合金涂层的衬底上分离

    公开(公告)号:WO2008043528A2

    公开(公告)日:2008-04-17

    申请号:PCT/EP2007/008780

    申请日:2007-10-09

    CPC classification number: C25D3/46

    Abstract: Die vorliegende Erfindung betrifft eine cyanidfreie Elektrolytzusammensetzung zur Abscheidung einer Silber- oder Silberlegierungsschicht auf einem Substrat. Darüber hinaus betrifft die vorliegende Erfindung ein Verfahren zur Abscheidung solcher Schichten unter Verwendung der erfindungsgemäßen cyanidfreien Elektrolytzusammensetzung. Die erfindungsgemäße Elektrolytzusammensetzung weist wenigstens eine Silberionenquelle, eine Sulfonsäure und/oder ein Derivat einer Sulfonsäure, ein Netzmittel sowie ein Hydantoin auf. Die aus einer solchen Elektrolytzusammensetzung mittels des erfindungsgemäßen Verfahrens abgeschiedenen Silber- oder Silberlegierungsschichten sind matt und duktil.

    Abstract translation: 本发明涉及一种不含氰化物的电解质组合物用于在基材上沉积银或银合金层。 此外,本发明涉及一种用于根据本发明使用的无氰电解液组合物沉积这样的层的方法。 根据本发明的电解质组合物包括银离子中的至少一个源,磺酸和/或磺酸,润湿剂和乙内酰脲的衍生物。 从这样的组合物电解通过本发明的方法的银或银合金层是无光泽和韧性的沉积。

    DEPOSITION OF CONDUCTIVE POLYMER AND METALLIZATION OF NON-CONDUCTIVE SUBSTRATES
    10.
    发明申请
    DEPOSITION OF CONDUCTIVE POLYMER AND METALLIZATION OF NON-CONDUCTIVE SUBSTRATES 审中-公开
    导电聚合物的沉积和非导电基板的金属化

    公开(公告)号:WO2008029376A2

    公开(公告)日:2008-03-13

    申请号:PCT/IB2007/053617

    申请日:2007-09-07

    Abstract: A process is provided for metallizing a surface of a substrate with electrolytically plated copper metallization, the process comprising electrolytically depositing copper over the electrically conductive polymer by immersing the substrate in an electrolytic composition and applying an external source of electrons, wherein the electrolytic composition comprises a source of copper ions and has a pH between about 0.5 and about 3.5. In another aspect, a process is provided for metallizing a surface of a dielectric substrate with electrolytically plated copper metallization, the process comprising immersing the substrate into a catalyst composition comprising a precursor for forming an electrically conductive polymer on the surface of the dielectric substrate and a source of Mn (II) ions in an amount sufficient to provide an initial concentration of Mn (II) ions of at least about 0.1 g/L to form an electrically conductive polymer on the surface of the dielectric substrate, and electrolytically depositing copper over said electrically conductive polymer.

    Abstract translation: 提供了一种用电镀铜金属化金属化衬底的表面的方法,该方法包括通过将衬底浸入电解组合物中并施加外部电子源在导电聚合物上电解沉积铜,其中电解组合物包含 铜离子源,pH约在0.5至约3.5之间。 在另一方面,提供了一种用电解铜镀金属化金属化电介质基片的表面的方法,该方法包括将基底浸入包含用于在电介质基底表面上形成导电聚合物的前体的催化剂组合物和 Mn(II)离子源,其量足以提供至少约0.1g / L的Mn(II)离子的初始浓度,以在介电衬底的表面上形成导电聚合物,并在所述电介质衬底的表面上电解沉积铜 导电聚合物。

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