Abstract:
A method of fabricating an accurately tuned grating structure in a waveguide comprises the steps of providing a waveguide having an etched Bragg grating formed in a photosensitive layer, guiding light into the waveguide, monitoring the Bragg wavelength, and exposing the photosensitive layer to tuning light so as to alter the refractive index of the photosensitive layer and thereby alter the Bragg wavelength of the waveguide. The grating is initially formed by e-beam lithography and dry etching, to provide a grating with relatively accurate periodicity. The Bragg wavelength of the grating is then fine tuned by exposing the photosensitive layer to UV light to adjust the effective refractive index whilst monitoring the optical spectrum of light reflected by the grating.
Abstract:
According to the present invention, a travelling-wave electroabsorption modulator (TW-EAM) comprises: an optical waveguide (10) with a plurality of adjacent regions electrically isolated from each other, the regions being characterized alternately by the properties of electroabsorption (EA) (13) and optical transparency (12) over the same range of optical wavelengths, and a microwave transmission line (15) located above the optical waveguide, such that sections of the transmission line located above EA regions in the optical waveguide are in electrical contact with said EA regions, whereas sections of the transmission line located above transparent regions in the optical waveguide are electrically isolated (18) from said transparent regions. In the absence of a microwave signal, the EA (13) regions are substantially transparent to light in the optical waveguide. When a microwave signal is applied to the EA regions, they become substantially absorbing at the wavelength of the light in the optical waveguide. Thus, by applying a fast time-varying microwave signal to the transmission line, the absorption of light in the waveguide can be modulated temporally, thereby encoding information onto the light beam.
Abstract:
In the present invention there is provided a burn-in system for burning in one or more optoelectronic devices comprising at least one burn-in printed circuit board (PCB). The, or each, burn-in PCB comprises a plurality of mounts for holding the, or each, optoelectronic device, a full population of traces for separate electrical connection to each electrical contact on the or each optoelectronic device, and a PCB connector having a plurality of contacts for external electrical connection to each trace on the burn-in PCB. The burn-in system also comprises a custom PCB. The custom PCB comprises a plurality of input connectors for connecting a plurality of electrical biasing sources to said custom PCB, a plurality of output connectors, each output connector adapted for mating with the PCB connector on a burn-in PCB, thereby providing for electrical connection between the custom PCB and the or each burn-in PCB, and a plurality of electrical routings for electrical connection between the input and output connectors, said routings being arranged so that, in use, the custom PCB connects at least one electrical biasing source to at least one electrical contact on the or each optoelectronic device. The present invention enhances the burn-in facility by providing flexability of electrical connection from various sources to burn-in mounts.
Abstract:
In the present invention, the boundary of the or each chip on a wafer is defined by the absence of metallization and the presence of a continuous etched trench. The metallization, comprising the deposition of a metal layer, is not formed monolithically on the wafer, but is patterned to cover only the surface of the or each chip, thereby providing for electrical contact to the chip. The metal layer so deposited, contributes to the structural integrity and mechanical strength of the chip, but does not form a mechanical link between neighbouring chips. The trenches are etched to a depth that is substantially below the surface topology of the wafer. In particular, the trenches are etched to a depth that is substantially below layers in the wafer that contribute to the operation of devices fabricated on the wafer. Typically this would mean at least 3µm into the wafer substrate below the active regions grown on the substrate.
Abstract:
In the present invention, a semiconductor device is formed which includes an MIM capacitor located on the upper surface of a heterostructure from which the emitter, base and collector sections of a nearby HBT are defined. In this way the capacitor and HBT share a substantially common structure, with the base and emitter electrodes of the HBT fashioned from the same metal layers as the upper and lower capacitor plates, respectively. Furthermore, as the insulator region of the capacitor is formed prior to definition of the HBT structure, the dielectric material used can be deposited by means of a plasma enhanced process, without damaging the HBT structure.
Abstract:
There is provided an optical device (300) comprising a planar structure (304) adapted so that light coupled into an optical layer (306) of the device follows a folded optical path (302), thereby increasing the interaction length in the optical layer, wherein the optical device comprises reflection means designed so that the folded optical path crosses the optical layer substantially perpendicularly to said optical layer so as to render the optical device substantially polarization insensitive. Typically, the folded path is achieved by modifying at least one of an upper surface of the optical layer and a lower surface of the optical layer such that it is no longer planar, but instead comprises one or more angled facets (308).
Abstract:
An optical coupling mount for use in coupling light between a semiconductor waveguide device and an optical fibre comprises a silica based spot size converter located on an optical bench with fiducial marks and protrusions, whereby the semiconductor device can be positioned in close alignment with the spot size converter. The spot size converter comprises a tapered upper waveguide located above a non-tapered lower waveguide. The dimensions of the spot size converter are such that a semiconductor device emitting a small, astigmatic optical beam can be efficiently coupled to a single mode fibre requiring a larger, concentric beam. Also provided is a thermal backplate with electrical routing patterns and which, when assembled with the optical bench, contact both the semiconductor device and corresponding electrical routing patterns on the optical bench, thereby providing a mechanically robust device with provision for simple connection to an external electrical power supply.
Abstract:
A method for achieving large localized bandgap energy differences at the wafer-level scale, with fine bandgap control, through a combination of regrowth and quantum well intermixing processes. The technique allows fabrication of a photonic integrated circuit on a wafer, wherein epitaxial layers of different composition are formed on separate regions to optimise the associated energy bandgap at a different centre wavelength. Quantum well intermixing of those parts of the structure containing quantum wells allows localised fine tuning of the bandgap, either to correct for inaccuracies during deposition or growth, or intentionally to detune the bandgap to achieve a certain functionality such as greater transparency or responsivity.
Abstract:
A photonic device (40) with improved optical isolation and a method to fabricate it. The device is grown on a substrate with a quantum well layer so as to be intentionally absorbing at a particular wavelength. Regions (41, 42, 44) of the device that are to be partially or wholly transparent to light at the particular wavelength, or capable of emission at the particular wavelength, are then bandgap engineered by post-growth quantum well intermixing to render them so. The non-QW intermixed regions (43) remain absorbing and so provide the required isolation at the particular wavelength. The QW intermixing may be tailored to provide a particular behaviour at other predetermined wavelengths.
Abstract:
A method for achieving large localized bandgap energy differences at the wafer-level scale, with fine bandgap control, through a combination of regrowth and quantum well intermixing processes. The technique allows fabrication of a photonic integrated circuit on a wafer, wherein epitaxial layers of different composition are formed on separate regions to optimise the associated energy bandgap at a different centre wavelength. Quantum well intermixing of those parts of the structure containing quantum wells allows localised fine tuning of the bandgap, either to correct for inaccuracies during deposition or growth, or intentionally to detune the bandgap to achieve a certain functionality such as greater transparency or responsivity.