SEMICONDUCTOR PACKAGE SORTING METHOD
    3.
    发明申请
    SEMICONDUCTOR PACKAGE SORTING METHOD 审中-公开
    半导体封装分选方法

    公开(公告)号:WO2007046629A1

    公开(公告)日:2007-04-26

    申请号:PCT/KR2006/004229

    申请日:2006-10-18

    CPC classification number: H01L22/20

    Abstract: Disclosed is a semiconductor package sorting method for improving sorting speed and yield of semiconductor packages. The method comprises performing a vision inspection on a tray, transferring the tray to a buffer unit, shifting defective products to a defective product tray, performing a vision inspection on a tray, transferring the tray to an unloading unit, determining whether defective products are found among semiconductor packages, if it is determined that the unloading tray receives defective products, shifting the defective products to the defective product tray and shifting normal products to fill the unloading tray, if a vision inspection for a last tray of a lot is completed, shifting the defective products to the defective product tray, discharging the defective product tray into a defective product storage unit, and if the re-inspection is determined, performing a defective product re-inspection simultaneously with arrangement of the normal products.

    Abstract translation: 公开了一种用于提高半导体封装的分选速度和产量的半导体封装分选方法。 该方法包括在托盘上执行视觉检查,将托盘传送到缓冲单元,将有缺陷的产品转移到有缺陷的产品托盘,对托盘进行视觉检查,将托盘传送到卸载单元,确定是否找到有缺陷的产品 在半导体封装中,如果确定卸载托盘接收到不良产品,则将缺陷产品转移到有缺陷的产品托盘并移动正常产品以填充卸载托盘,如果批次的最后托盘的视觉检查完成,则移位 有缺陷的产品到缺陷产品托盘,将有缺陷的产品托盘排放到有缺陷的产品存储单元中,并且如果确定了重新检查,则与正常产品的布置同时进行缺陷产品重新检查。

    METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
    4.
    发明申请
    METHOD FOR INSPECTING SEMICONDUCTOR DEVICE 审中-公开
    检查半导体器件的方法

    公开(公告)号:WO2006132485A1

    公开(公告)日:2006-12-14

    申请号:PCT/KR2006/002154

    申请日:2006-06-05

    CPC classification number: G06T7/001 G06T2207/30148 H01L22/20 H01L2924/014

    Abstract: A method for inspecting a semiconductor device is disclosed, which increases the accuracy of an external- defect inspection capable of determining whether balls or PCBs (Printed Circuit Boards) of the semiconductor device have external defects. The method for inspecting the semiconductor device to determine whether a defect occurs in a ball grid array contained in a PCB via an image captured by a camera includes the steps of: a) capturing an image of the semiconductor device to allow a circumference of each ball contained in the semiconductor device to be displayed in white, and acquiring falling-illumination image information from the captured image; b) capturing an image of the semiconductor device to allow a center part of each ball contained in the semiconductor device to be displayed in white, and acquiring coaxial image information from the captured image; c) subtracting the coaxial image information from the falling-illumination image information, and acquiring ring-shaped image information; and d) comparing the ring- shaped image information with reference image information, and determining whether the ball is defective according to the comparison result.

    Abstract translation: 公开了一种用于检查半导体器件的方法,其增加了能够确定半导体器件的球或PCB(印刷电路板)是否具有外部缺陷的外部缺陷检查的精度。 用于通过照相机拍摄的图像检查半导体器件以确定在PCB中包含的球栅阵列中是否发生缺陷的方法包括以下步骤:a)捕获半导体器件的图像以允许每个球的圆周 包含在半导体装置中以白色显示,并从捕获图像获取落下照明图像信息; b)捕获半导体器件的图像,以允许包含在半导体器件中的每个球的中心部分以白色显示,并从捕获的图像获取同轴图像信息; c)从所述降落照明图像信息中减去所述同轴图像信息,并获取环形图像信息; 以及d)将环形图像信息与参考图像信息进行比较,并且根据比较结果确定球是否有缺陷。

    METHOD FOR INSPECTING FLAT PANEL
    5.
    发明申请
    METHOD FOR INSPECTING FLAT PANEL 审中-公开
    检查平板的方法

    公开(公告)号:WO2013039340A3

    公开(公告)日:2013-05-10

    申请号:PCT/KR2012007352

    申请日:2012-09-13

    Abstract: Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a measuring target of the flat panel at the measurement location; acquiring a plurality of images for the measuring target by vertically moving the camera within a set region on the basis of the present location of the camera when focusing the camera; selecting the image having the most definition for the measuring target among the acquired images; processing the selected image; and determining whether the measuring target is defective or not.

    Abstract translation: 公开了一种用于检查平板的方法。 用于检查平板的方法包括以下步骤:通过水平移动平板和照相机中的至少一个来将照相机布置在平板的测量位置处; 自动将摄像机相对于测量位置处的平板的测量目标进行聚焦; 通过在对照相机聚焦时基于照相机的当前位置在设定区域内垂直移动照相机来获取用于测量目标的多个图像; 在获取的图像中选择测量对象的分辨率最高的图像; 处理选择的图像; 并确定测量目标是否有缺陷。

    HARMFUL EMISSIONS REDUCTION APPARATUS FOR ENGINE USING REFORMER, REFORMER FOR THE SAME, AND HARMFUL EMISSIONS REDUCTION METHOD FOR ENGINE USING THE SAME
    6.
    发明申请
    HARMFUL EMISSIONS REDUCTION APPARATUS FOR ENGINE USING REFORMER, REFORMER FOR THE SAME, AND HARMFUL EMISSIONS REDUCTION METHOD FOR ENGINE USING THE SAME 审中-公开
    使用改造机的发动机的有害排放减少装置,使用该改造装置的改造机以及使用该改造机的发动机的有害排放减少方法

    公开(公告)号:WO2010076967A3

    公开(公告)日:2010-08-19

    申请号:PCT/KR2009006429

    申请日:2009-11-03

    Abstract: The present invention relates to a harmful emissions reduction apparatus for an engine using a reformer, a reformer for the same, and a harmful emissions reduction method for an engine using the same. The harmful emissions reduction apparatus for an engine comprises: a reformer (20) which reforms oxygen (O) and hydrocarbons (HC) included in the exhaust gas from an engine into hydrogen (H2) and carbon monoxide (CO), and increases the temperature of the exhaust gas by exothermic reaction; an exhaust gas recirculation unit (EGR) (30) which supplies the engine (10) with the exhaust gas which was reformed by the reformer (20) to increase the hydrogen (H2) content, and stabilizes the homogeneous charge compression ignition (HCCI) combustion of the engine (10); a hydrocarbon-added selective catalytic reduction unit (HC-SCR) (40) which receives the exhaust gas which was reformed by the reformer (20) to increase the hydrogen (H2) content, and transforms the nitrogen oxide (NOx) into nitrogen (N2) and water vapor (H2O) using hydrocarbons as a reducing agent in a state that enhances the reduction reaction of the nitrogen oxide (NOx); and a diesel particulate filter (DPF) (50) which receives the exhaust gas which was reformed by the reformer (20) to increase the hydrogen (H2) content, and removes particulate matter (PM) deposited thereinside through oxidation. The harmful emissions reduction apparatus for an engine of the present invention treats the exhaust gas more efficiently as post-processing apparatuses such as the selective catalytic reduction (HC-SCR) and the diesel particulate filter (DPF) are interacting in addition to the application of the HCCI combustion and the reformer.

    Abstract translation: 本发明涉及一种使用重整器的发动机的有害排放物减少装置,其重整装置以及使用该装置的发动机的有害排放物减少方法。 用于发动机的有害排放物减少装置包括:重整器(20),其将来自发动机的废气中包含的氧气(O)和烃(HC)重整成氢气(H 2)和一氧化碳(CO) 的废气通过放热反应; 向发动机(10)供给由重整器(20)改性的废气以增加氢(H 2)含量并稳定均质充量压缩点火(HCCI)的废气再循环单元(EGR) 发动机(10)的燃烧; (20)改性的废气以增加氢气(H 2)含量并且将氮氧化物(NO X)转化成氮气(N 2)的烃添加选择性催化还原单元(HC-SCR) N2)和水蒸汽(H2O),使用烃作为还原剂,以增强氮氧化物(NOx)的还原反应的状态; 和接收由重整器(20)重整的废气以增加氢(H 2)含量并且通过氧化去除沉积在其中的颗粒物质(PM)的柴油颗粒过滤器(DPF)(50)。 本发明的用于发动机的有害排放物减少装置除了应用以外的选择性催化还原(HC-SCR)和柴油机微粒过滤器(DPF)之类的后处理装置时还更有效地处理废气 HCCI燃烧和重整器。

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